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Journal description
All volumes of the corresponding journal
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Details for article 4 of 14 found articles
| Title: |
High-Level Implementation-Independent Functional Software-Based Self-Test for RISC Processors |
| Author: |
Oyeniran, Adeboye Stephen Ubar, Raimund Jenihhin, Maksim Raik, Jaan |
| Appeared in: |
Journal of electronic testing |
| Paging: | Volume 36 () nr. 1 pages 87-103 |
| Year: |
2020-03-20 |
| Contents: | |
| Publisher: |
Springer US, New York |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 4 of 14 found articles
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