| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
Analog Circuit Fault Diagnosis via Sensitivity Computation
|
Yu, Wenxin
|
|
2015
|
31 |
1 |
p. 119-122
|
artikel
|
| 2 |
A New Test Point Selection Method for Analog Circuit
|
Zhao, Dongsheng
|
|
2015
|
31 |
1 |
p. 53-66
|
artikel
|
| 3 |
A Power Efficient BIST TPG Method on Don’t Care Bit Based 2-D Adjusting and Hamming Distance Based 2-D Reordering
|
Yuan, Haiying
|
|
2015
|
31 |
1 |
p. 43-52
|
artikel
|
| 4 |
Compressive Sampling Coupled OFDM Technique for Testing Continuous Wave Radar
|
Metwally, Mohamed
|
|
2014
|
31 |
1 |
p. 75-83
|
artikel
|
| 5 |
Detecting Hardware Trojans using On-chip Sensors in an ASIC Design
|
Kelly, Shane
|
|
2015
|
31 |
1 |
p. 11-26
|
artikel
|
| 6 |
Editorial
|
Agrawal, Vishwani D.
|
|
2015
|
31 |
1 |
p. 1-2
|
artikel
|
| 7 |
Harzard-Based ATPG for Improving Delay Test Quality
|
Liu, Tieqiao
|
|
2015
|
31 |
1 |
p. 27-34
|
artikel
|
| 8 |
Improving Semiconductor Reliability with Advanced Engineering Methods in Test Program Development
|
Vock, Stefan
|
|
2014
|
31 |
1 |
p. 107-117
|
artikel
|
| 9 |
2014 JETTA Reviewers
|
|
|
2015
|
31 |
1 |
p. 7-8
|
artikel
|
| 10 |
Low Cost Sparse Multiband Signal Characterization Using Asynchronous Multi-Rate Sampling: Algorithms and Hardware
|
Tzou, Nicholas
|
|
2015
|
31 |
1 |
p. 85-98
|
artikel
|
| 11 |
New Editors – 2015
|
|
|
2015
|
31 |
1 |
p. 3-6
|
artikel
|
| 12 |
On-Wafer Calibration Technique for High Frequency Measurement with Simultaneous Voltage and Current Tuning
|
Rahman, B. M. Farid
|
|
2014
|
31 |
1 |
p. 67-73
|
artikel
|
| 13 |
Pattern Generation for Understanding Timing Sensitivity to Power Supply Noise
|
Zhang, Tengteng
|
|
2014
|
31 |
1 |
p. 99-106
|
artikel
|
| 14 |
Pseudo Functional Path Delay Test through Embedded Memories
|
Gao, Yukun
|
|
2014
|
31 |
1 |
p. 35-42
|
artikel
|
| 15 |
Test Technology Newsletter
|
|
|
2015
|
31 |
1 |
p. 9-10
|
artikel
|
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