| no |
title |
author |
magazine |
year |
volume |
issue |
page(s) |
type |
| 1 |
A Comprehensive Framework for Counterfeit Defect Coverage Analysis and Detection Assessment
|
Guin, Ujjwal
|
|
2014
|
30 |
1 |
p. 25-40
|
article
|
| 2 |
A Novel Wafer Manipulation Method for Yield Improvement and Cost Reduction of 3D Wafer-on-Wafer Stacked ICs
|
Zhang, Bei
|
|
2014
|
30 |
1 |
p. 57-75
|
article
|
| 3 |
Applications of Boolean Satisfiability to Verification and Testing of Switch-Level Circuits
|
Favalli, M.
|
|
2014
|
30 |
1 |
p. 41-55
|
article
|
| 4 |
Clock Faults Induced Min and Max Delay Violations
|
Rossi, D.
|
|
2013
|
30 |
1 |
p. 111-123
|
article
|
| 5 |
Counterfeit Integrated Circuits: Detection, Avoidance, and the Challenges Ahead
|
Guin, Ujjwal
|
|
2014
|
30 |
1 |
p. 9-23
|
article
|
| 6 |
Editorial
|
Agrawal, Vishwani D.
|
|
2014
|
30 |
1 |
p. 1-2
|
article
|
| 7 |
Low Power Memory Built in Self Test Address Generator Using Clock Controlled Linear Feedback Shift Registers
|
Krishna, K. Murali
|
|
2014
|
30 |
1 |
p. 77-85
|
article
|
| 8 |
New Editor
|
|
|
2014
|
30 |
1 |
p. 3
|
article
|
| 9 |
2013 Reviewers
|
|
|
2014
|
30 |
1 |
p. 5-6
|
article
|
| 10 |
Simulation Based Framework for Accurately Estimating Dynamic Power-Supply Noise and Path Delay
|
Kadiyala Rao, Sushmita
|
|
2013
|
30 |
1 |
p. 125-147
|
article
|
| 11 |
Single-Event Transient Measurements on a DC/DC Pulse Width Modulator Using Heavy Ion, Proton, and Pulsed Laser
|
Ren, Y.
|
|
2014
|
30 |
1 |
p. 149-154
|
article
|
| 12 |
Study of Low-Cost Electrical Test Strategies for Post-Silicon Yield Improvement of MEMS Convective Accelerometers
|
Rekik, Ahmed Amine
|
|
2013
|
30 |
1 |
p. 87-100
|
article
|
| 13 |
Test Technology Newsletter
|
|
|
2014
|
30 |
1 |
p. 7-8
|
article
|
| 14 |
Wide Dynamic Range CMOS Amplifier Design for RF Signal Power Detection via Electro-Thermal Coupling
|
Feng, Junpeng
|
|
2013
|
30 |
1 |
p. 101-109
|
article
|
Journal description