| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
A Non-Enumerative Technique for Measuring Path Correlation in Digital Circuits
|
Neophytou, Stelios N.
|
|
2012
|
28 |
6 |
p. 843-856
|
artikel
|
| 2 |
A Test Platform for Dependability Analysis of SoCs Exposed to EMI and Radiation
|
Benfica, Juliano
|
|
2012
|
28 |
6 |
p. 803-816
|
artikel
|
| 3 |
Current Consumption and Power Integrity of CMOS Digital Circuits Under NBTI Wearout
|
Ruiz, J. M.
|
|
2012
|
28 |
6 |
p. 865-868
|
artikel
|
| 4 |
Current State of the Mixed-Signal Test Bus 1149.4
|
Hannu, Jari
|
|
2012
|
28 |
6 |
p. 857-863
|
artikel
|
| 5 |
Data-Driven DPPM Estimation and Adaptive Fault Coverage Calibration Using MATLAB®
|
Chakraborty, Kanad
|
|
2012
|
28 |
6 |
p. 869-875
|
artikel
|
| 6 |
Editorial
|
Agrawal, Vishwani D.
|
|
2012
|
28 |
6 |
p. 773-774
|
artikel
|
| 7 |
Evaluating the Effectiveness of a Software-Based Technique Under SEEs Using FPGA-Based Fault Injection Approach
|
Portela-Garcia, M.
|
|
2012
|
28 |
6 |
p. 777-789
|
artikel
|
| 8 |
Kth-Aggressor Fault (KAF)-based Thru-Silicon-Via Interconnect Built-In Self-Test and Diagnosis
|
Pasca, Vladimir
|
|
2012
|
28 |
6 |
p. 817-829
|
artikel
|
| 9 |
Prediction of Long-term Immunity of a Phase-Locked Loop
|
Boyer, A.
|
|
2012
|
28 |
6 |
p. 791-802
|
artikel
|
| 10 |
Single-Event Effects Analysis of a Pulse Width Modulator IC in a DC/DC Converter
|
Ren, Y.
|
|
2012
|
28 |
6 |
p. 877-883
|
artikel
|
| 11 |
Structural Test and Diagnosis for Graceful Degradation of NoC Switches
|
Dalirsani, Atefe
|
|
2012
|
28 |
6 |
p. 831-841
|
artikel
|
| 12 |
Test Technology Newsletter
|
|
|
2012
|
28 |
6 |
p. 775-776
|
artikel
|
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