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Journal description
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Details for article 11 of 12 found articles
| Title: |
Structural Test and Diagnosis for Graceful Degradation of NoC Switches |
| Author: |
Dalirsani, Atefe Holst, Stefan Elm, Melanie Wunderlich, Hans-Joachim |
| Appeared in: |
Journal of electronic testing |
| Paging: | Volume 28 (2012) nr. 6 pages 831-841 |
| Year: |
2012 |
| Contents: | |
| Publisher: |
Springer US, Boston |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 11 of 12 found articles
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