| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
A Built-in Self-Test Scheme for Memory Interfaces Timing Test and Measurement
|
Kim, Hyun Jin
|
|
2012
|
28 |
5 |
p. 585-597
|
artikel
|
| 2 |
An Accurate and Cost-Effective Jitter Measurement Technique Using a Single Test Frequency
|
Wu, Minshun
|
|
2012
|
28 |
5 |
p. 733-743
|
artikel
|
| 3 |
An MCT-Based Bit-Weight Extraction Technique for Embedded SAR ADC Testing and Calibration
|
Huang, Xuan-Lun
|
|
2012
|
28 |
5 |
p. 705-722
|
artikel
|
| 4 |
Built-in Self Test of RF Subsystems with Integrated Detectors
|
Zhang, Chaoming
|
|
2012
|
28 |
5 |
p. 557-569
|
artikel
|
| 5 |
Calibration Enabled Scalable Current Sensor Module for Quiescent Current Testing
|
Dasnurkar, Sachin Dileep
|
|
2012
|
28 |
5 |
p. 697-704
|
artikel
|
| 6 |
Editorial
|
Agrawal, Vishwani D.
|
|
2012
|
28 |
5 |
p. 551-552
|
artikel
|
| 7 |
Experimental Results of Testing a BIST Σ–Δ ADC on the HOY Wireless Test Platform
|
Hung, Shao-Feng
|
|
2012
|
28 |
5 |
p. 571-584
|
artikel
|
| 8 |
Feature Vector Selection Method Using Mahalanobis Distance for Diagnostics of Analog Circuits Based on LS-SVM
|
Long, Bing
|
|
2012
|
28 |
5 |
p. 745-755
|
artikel
|
| 9 |
FPGA-based Novel Adaptive Scheme Using PN Sequences for Self-Calibration and Self-Testing of MEMS-based Inertial Sensors
|
Sarraf, Elie H.
|
|
2012
|
28 |
5 |
p. 599-614
|
artikel
|
| 10 |
Guest Editorial: Special Issue on Analog, Mixed-Signal, RF, and MEMS Testing
|
Chang, Hsiu-Ming (Sherman)
|
|
2012
|
28 |
5 |
p. 555-556
|
artikel
|
| 11 |
High Speed On-Chip Signal Generation for Debug and Diagnosis
|
Tsai, Tsung-Yen
|
|
2012
|
28 |
5 |
p. 625-640
|
artikel
|
| 12 |
Low-Distortion Sinewave Generation Method Using Arbitrary Waveform Generator
|
Wakabayashi, Kazuyuki
|
|
2012
|
28 |
5 |
p. 641-651
|
artikel
|
| 13 |
Maximizing Parallel Testing in an FM Receiver
|
Naing, Mozar
|
|
2012
|
28 |
5 |
p. 723-731
|
artikel
|
| 14 |
Novel Practical Built-in Current Sensors
|
Maltabas, Samed
|
|
2012
|
28 |
5 |
p. 673-683
|
artikel
|
| 15 |
On Chip Signal Generators for Low Overhead ADC BIST
|
Duan, Jingbo
|
|
2012
|
28 |
5 |
p. 615-623
|
artikel
|
| 16 |
On the Use of Static Temperature Measurements as Process Variation Observable
|
Gómez, Didac
|
|
2012
|
28 |
5 |
p. 685-695
|
artikel
|
| 17 |
Parametric Fault Testing of Non-Linear Analog Circuits Based on Polynomial and V-Transform Coefficients
|
Sindia, Suraj
|
|
2012
|
28 |
5 |
p. 757-771
|
artikel
|
| 18 |
Test Technology Newsletter
|
|
|
2012
|
28 |
5 |
p. 553-554
|
artikel
|
| 19 |
Time-Based Embedded Test Instrument with Concurrent Voltage Measurement Capability
|
Kulovic, Kemal
|
|
2012
|
28 |
5 |
p. 653-671
|
artikel
|
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