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Journal description
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Details for article 3 of 19 found articles
| Title: |
An MCT-Based Bit-Weight Extraction Technique for Embedded SAR ADC Testing and Calibration |
| Author: |
Huang, Xuan-Lun Huang, Jiun-Lang Chen, Hung-I Chen, Chang-Yu Kuo-Tsai, Tseng Huang, Ming-Feng Chou, Yung-Fa Kwai, Ding-Ming |
| Appeared in: |
Journal of electronic testing |
| Paging: | Volume 28 (2012) nr. 5 pages 705-722 |
| Year: |
2012 |
| Contents: | |
| Publisher: |
Springer US, Boston |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 3 of 19 found articles
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