| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
A New Optimal Test Node Selection Method for Analog Circuit
|
Luo, Hui
|
|
2011
|
28 |
3 |
p. 279-290
|
artikel
|
| 2 |
Challenges for Semiconductor Test Engineering: A Review Paper
|
Vock, Stefan R.
|
|
2012
|
28 |
3 |
p. 365-374
|
artikel
|
| 3 |
Diagnostics of Filtered Analog Circuits with Tolerance Based on LS-SVM Using Frequency Features
|
Long, Bing
|
|
2012
|
28 |
3 |
p. 291-300
|
artikel
|
| 4 |
Digital-Compatible Testing Scheme for Operational Amplifier
|
Ting, Hsin-Wen
|
|
2012
|
28 |
3 |
p. 267-277
|
artikel
|
| 5 |
Editorial
|
Agrawal, Vishwani D.
|
|
2012
|
28 |
3 |
p. 263-264
|
artikel
|
| 6 |
IC Immunity Modeling Process Validation Using On-Chip Measurements
|
Ben Dhia, S.
|
|
2012
|
28 |
3 |
p. 339-348
|
artikel
|
| 7 |
Impact of Resistive-Bridging Defects in SRAM at Different Technology Nodes
|
Alves Fonseca, Renan
|
|
2012
|
28 |
3 |
p. 317-329
|
artikel
|
| 8 |
Iterative Antirandom Testing
|
Mrozek, Ireneusz
|
|
2012
|
28 |
3 |
p. 301-315
|
artikel
|
| 9 |
NBTI-Aware Data Allocation Strategies for Scratchpad Based Embedded Systems
|
Ferri, Cesare
|
|
2012
|
28 |
3 |
p. 349-363
|
artikel
|
| 10 |
Optimization of SEU Simulations for SRAM Cells Reliability under Radiation
|
Castellani-Coulié, K.
|
|
2012
|
28 |
3 |
p. 331-338
|
artikel
|
| 11 |
Robust Coupling Delay Test Sets
|
Yi, Joonhwan
|
|
2012
|
28 |
3 |
p. 375-388
|
artikel
|
| 12 |
Test Technology Newsletter
|
|
|
2012
|
28 |
3 |
p. 265-266
|
artikel
|
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