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                                       Details for article 10 of 12 found articles
 
 
  Optimization of SEU Simulations for SRAM Cells Reliability under Radiation
 
 
Title: Optimization of SEU Simulations for SRAM Cells Reliability under Radiation
Author: Castellani-CouliƩ, K.
Aziza, H.
Micolau, G.
Portal, J-M.
Appeared in: Journal of electronic testing
Paging: Volume 28 (2012) nr. 3 pages 331-338
Year: 2012
Contents:
Publisher: Springer US, Boston
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 10 of 12 found articles
 
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