| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
A BIST-based Solution for the Diagnosis of Embedded Memories Adopting Image Processing Techniques
|
D. Appello
|
|
2004
|
20 |
1 |
p. 79-87
9 p.
|
artikel
|
| 2 |
A BIST-based Solution for the Diagnosis of Embedded Memories Adopting Image Processing Techniques
|
Appello, D.
|
|
2004
|
20 |
1 |
p. 79-87
|
artikel
|
| 3 |
A Graph-Based Approach to Power-Constrained SOC Test Scheduling
|
Chih-Pin Su
|
|
2004
|
20 |
1 |
p. 45-60
16 p.
|
artikel
|
| 4 |
A Graph-Based Approach to Power-Constrained SOC Test Scheduling
|
Su, Chih-Pin
|
|
2004
|
20 |
1 |
p. 45-60
|
artikel
|
| 5 |
Classification of Defective Analog Integrated Circuits Using Artificial Neural Networks
|
V. Stopjaková
|
|
2004
|
20 |
1 |
p. 25-37
13 p.
|
artikel
|
| 6 |
Classification of Defective Analog Integrated Circuits Using Artificial Neural Networks
|
Stopjaková, V.
|
|
2004
|
20 |
1 |
p. 25-37
|
artikel
|
| 7 |
Control and Observation Structure for Analog Circuits with Current Test Data
|
Chun-Lung Hsu
|
|
2004
|
20 |
1 |
p. 39-44
6 p.
|
artikel
|
| 8 |
Control and Observation Structure for Analog Circuits with Current Test Data
|
Hsu, Chun-Lung
|
|
2004
|
20 |
1 |
p. 39-44
|
artikel
|
| 9 |
Editorial
|
Vishwani D. Agrawal
|
|
2004
|
20 |
1 |
p. 5-6
2 p.
|
artikel
|
| 10 |
Editorial
|
Agrawal, Vishwani D.
|
|
2004
|
20 |
1 |
p. 5-6
|
artikel
|
| 11 |
Generation and Verification of Tests for Analog Circuits Subject to Process Parameter Deviations
|
S.J. Spinks
|
|
2004
|
20 |
1 |
p. 11-23
13 p.
|
artikel
|
| 12 |
Generation and Verification of Tests for Analog Circuits Subject to Process Parameter Deviations
|
Spinks, S.J.
|
|
2004
|
20 |
1 |
p. 11-23
|
artikel
|
| 13 |
Greedy Tree Growing Heuristics on Block-Test Scheduling Under Power Constraints
|
Valentin Murean
|
|
2004
|
20 |
1 |
p. 61-78
18 p.
|
artikel
|
| 14 |
Greedy Tree Growing Heuristics on Block-Test Scheduling Under Power Constraints
|
Mureşan, Valentin
|
|
2004
|
20 |
1 |
p. 61-78
|
artikel
|
| 15 |
List of Reviewers
|
|
|
2004
|
20 |
1 |
p. 9-10
2 p.
|
artikel
|
| 16 |
List of Reviewers
|
|
|
2004
|
20 |
1 |
p. 9-10
|
artikel
|
| 17 |
Testing and Reliability Techniques for High-Bandwidth Embedded RAMs
|
Kanad Chakraborty
|
|
2004
|
20 |
1 |
p. 89-108
20 p.
|
artikel
|
| 18 |
Testing and Reliability Techniques for High-Bandwidth Embedded RAMs
|
Chakraborty, Kanad
|
|
2004
|
20 |
1 |
p. 89-108
|
artikel
|
| 19 |
Test-Per-Clock Logic BIST with Semi-Deterministic Test Patterns and Zero-Aliasing Compactor
|
O. Novák
|
|
2004
|
20 |
1 |
p. 109-122
14 p.
|
artikel
|
| 20 |
Test-Per-Clock Logic BIST with Semi-Deterministic Test Patterns and Zero-Aliasing Compactor
|
Novák, O.
|
|
2004
|
20 |
1 |
p. 109-122
|
artikel
|
| 21 |
Test Technology Technical Council Newsletter
|
A. Ivanov
|
|
2004
|
20 |
1 |
p. 7-8
2 p.
|
artikel
|
| 22 |
Test Technology Technical Council Newsletter
|
Ivanov, A.
|
|
2004
|
20 |
1 |
p. 7-8
|
artikel
|
Tijdschrift beschrijving