| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
A New On-Line Robust Approach to Design Noise-Immune Speech Recognition Systems
|
Fabian Vargas
|
|
2003
|
19 |
1 |
p. 61-72
12 p.
|
artikel
|
| 2 |
A New On-Line Robust Approach to Design Noise-Immune Speech Recognition Systems
|
Vargas, Fabian
|
|
2003
|
19 |
1 |
p. 61-72
|
artikel
|
| 3 |
Assessing the Soft Error Rate of Digital Architectures Devoted to Operate in Radiation Environment A Case Studied
|
R. Velazco
|
|
2003
|
19 |
1 |
p. 83-90
8 p.
|
artikel
|
| 4 |
Assessing the Soft Error Rate of Digital Architectures Devoted to Operate in Radiation Environment: A Case Studied
|
Velazco, R.
|
|
2003
|
19 |
1 |
p. 83-90
|
artikel
|
| 5 |
A Unified DFT Approach for BIST and External Test
|
M.-L. Flottes
|
|
2003
|
19 |
1 |
p. 49-60
12 p.
|
artikel
|
| 6 |
A Unified DFT Approach for BIST and External Test
|
Flottes, M.-L.
|
|
2003
|
19 |
1 |
p. 49-60
|
artikel
|
| 7 |
Design Error Diagnosis with Re-Synthesis in Combinational Circuits
|
Raimund Ubar
|
|
2003
|
19 |
1 |
p. 73-82
10 p.
|
artikel
|
| 8 |
Design Error Diagnosis with Re-Synthesis in Combinational Circuits
|
Ubar, Raimund
|
|
2003
|
19 |
1 |
p. 73-82
|
artikel
|
| 9 |
Editorial
|
Vishwani D. Agrawal
|
|
2003
|
19 |
1 |
p. 5-5
1 p.
|
artikel
|
| 10 |
Editorial
|
Agrawal, Vishwani D.
|
|
2003
|
19 |
1 |
p. 5
|
artikel
|
| 11 |
Guest Editorial
|
Victor Champac
|
|
2003
|
19 |
1 |
p. 11-11
1 p.
|
artikel
|
| 12 |
Guest Editorial
|
Champac, Victor
|
|
2003
|
19 |
1 |
p. 11
|
artikel
|
| 13 |
Innovative Built-In Self-Test Schemes for On-Chip Diagnosis, Compliant with the IEEE 1149.4 Mixed-Signal Test Bus Standard
|
Gladys Omayra Ducoudray-Acevedo
|
|
2003
|
19 |
1 |
p. 21-28
8 p.
|
artikel
|
| 14 |
Innovative Built-In Self-Test Schemes for On-Chip Diagnosis, Compliant with the IEEE 1149.4 Mixed-Signal Test Bus Standard
|
Ducoudray-Acevedo, Gladys Omayra
|
|
2003
|
19 |
1 |
p. 21-28
|
artikel
|
| 15 |
List of Reviewers
|
|
|
2003
|
19 |
1 |
p. 9-10
2 p.
|
artikel
|
| 16 |
List of Reviewers
|
|
|
2003
|
19 |
1 |
p. 9-10
|
artikel
|
| 17 |
Multiple Scan Chain Design for Two-Pattern Testing
|
Ilia Polian
|
|
2003
|
19 |
1 |
p. 37-48
12 p.
|
artikel
|
| 18 |
Multiple Scan Chain Design for Two-Pattern Testing
|
Polian, Ilia
|
|
2003
|
19 |
1 |
p. 37-48
|
artikel
|
| 19 |
Test Technology Technical Council Newsletter
|
André Ivanov
|
|
2003
|
19 |
1 |
p. 7-8
2 p.
|
artikel
|
| 20 |
Test Technology Technical Council Newsletter
|
Ivanov, André
|
|
2003
|
19 |
1 |
p. 7-8
|
artikel
|
| 21 |
The ΣΔ-BIST Method Applied to Analog Filters
|
L. Cassol
|
|
2003
|
19 |
1 |
p. 13-20
8 p.
|
artikel
|
| 22 |
The ΣΔ-BIST Method Applied to Analog Filters
|
Cassol, L.
|
|
2003
|
19 |
1 |
p. 13-20
|
artikel
|
| 23 |
Topological Considerations for the Diagnosability Conditions of Analogue Circuits Using a Pair of Conjugate Trees
|
Luis Hernández-Martínez
|
|
2003
|
19 |
1 |
p. 29-36
8 p.
|
artikel
|
| 24 |
Topological Considerations for the Diagnosability Conditions of Analogue Circuits Using a Pair of Conjugate Trees
|
Hernández-Martínez, Luis
|
|
2003
|
19 |
1 |
p. 29-36
|
artikel
|
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