| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
Digital Signature Proposal for Mixed-Signal Circuits
|
Anna Maria Brosa
|
|
2001
|
17 |
5 |
p. 385-393
9 p.
|
artikel
|
| 2 |
Digital Signature Proposal for Mixed-Signal Circuits
|
Brosa, Anna Maria
|
|
2001
|
17 |
5 |
p. 385-393
|
artikel
|
| 3 |
Editorial
|
Vishwani D. Agrawal
|
|
2001
|
17 |
5 |
p. 367-367
1 p.
|
artikel
|
| 4 |
Editorial
|
Agrawal, Vishwani D.
|
|
2001
|
17 |
5 |
p. 367
|
artikel
|
| 5 |
Fault Modeling and Fault Simulation in Mixed Micro-Fluidic Microelectronic Systems
|
Hans G. Kerkhoff
|
|
2001
|
17 |
5 |
p. 427-437
11 p.
|
artikel
|
| 6 |
Fault Modeling and Fault Simulation in Mixed Micro-Fluidic Microelectronic Systems
|
Kerkhoff, Hans G.
|
|
2001
|
17 |
5 |
p. 427-437
|
artikel
|
| 7 |
Frequency Response Verification of Analog Circuits Using Global Optimization Techniques
|
Suresh Seshadri
|
|
2001
|
17 |
5 |
p. 395-408
14 p.
|
artikel
|
| 8 |
Frequency Response Verification of Analog Circuits Using Global Optimization Techniques
|
Seshadri, Suresh
|
|
2001
|
17 |
5 |
p. 395-408
|
artikel
|
| 9 |
Guest Editorial
|
Michel Renovell
|
|
2001
|
17 |
5 |
p. 371-371
1 p.
|
artikel
|
| 10 |
Guest Editorial
|
Renovell, Michel
|
|
2001
|
17 |
5 |
p. 371
|
artikel
|
| 11 |
New BIST Schemes for Structural Testing of Pipelined Analog to Digital Converters
|
Eduardo J. Peralías
|
|
2001
|
17 |
5 |
p. 373-383
11 p.
|
artikel
|
| 12 |
New BIST Schemes for Structural Testing of Pipelined Analog to Digital Converters
|
Peralías, Eduardo J.
|
|
2001
|
17 |
5 |
p. 373-383
|
artikel
|
| 13 |
Process Deviations and Spot Defects Two Aspects of Test and Test Development for Mixed-Signal Circuits
|
Carsten Wegener
|
|
2001
|
17 |
5 |
p. 409-416
8 p.
|
artikel
|
| 14 |
Process Deviations and Spot Defects: Two Aspects of Test and Test Development for Mixed-Signal Circuits
|
Wegener, Carsten
|
|
2001
|
17 |
5 |
p. 409-416
|
artikel
|
| 15 |
Reducing Test Time in the High-Volume Production of Analog Circuits using Efficient Test-Vector Generation and Interpolation Techniques
|
Mustapha Slamani
|
|
2001
|
17 |
5 |
p. 417-425
9 p.
|
artikel
|
| 16 |
Reducing Test Time in the High-Volume Production of Analog Circuits using Efficient Test-Vector Generation and Interpolation Techniques
|
Slamani, Mustapha
|
|
2001
|
17 |
5 |
p. 417-425
|
artikel
|
| 17 |
Test and Testability of a Monolithic MEMS for Magnetic Field Sensing
|
V. Beroulle
|
|
2001
|
17 |
5 |
p. 439-450
12 p.
|
artikel
|
| 18 |
Test and Testability of a Monolithic MEMS for Magnetic Field Sensing
|
Beroulle, V.
|
|
2001
|
17 |
5 |
p. 439-450
|
artikel
|
| 19 |
Test Technology Newsletter
|
André Ivanov
|
|
2001
|
17 |
5 |
p. 369-370
2 p.
|
artikel
|
| 20 |
Test Technology Newsletter
|
Ivanov, André
|
|
2001
|
17 |
5 |
p. 369-370
|
artikel
|
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