nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
A Formalization of the IEEE 1149.1-1990 Diagnostic Methodology as Applied to Multichip Modules
|
Posse, Ken |
|
1997 |
10 |
1-2 |
p. 119-125 |
artikel |
2 |
An Effective Multi-Chip BIST Scheme
|
Zorian, Yervant |
|
1997 |
10 |
1-2 |
p. 87-95 |
artikel |
3 |
A Survey of Test Techniques for MCM Substrates
|
Swaminathan, Madhavan |
|
1997 |
10 |
1-2 |
p. 27-38 |
artikel |
4 |
A Test Methodology for High Performance MCMs
|
Storey, Thomas M. |
|
1997 |
10 |
1-2 |
p. 109-118 |
artikel |
5 |
Design-For-Test in a Multiple Substrate Multichip Module
|
Jorgenson, Joel A. |
|
1997 |
10 |
1-2 |
p. 97-107 |
artikel |
6 |
Designing “Dual Personality” IEEE 1149.1 Compliant Multi-Chip Modules
|
Jarwala, Najmi |
|
1997 |
10 |
1-2 |
p. 77-86 |
artikel |
7 |
Economic Analysis of Test Process Flows for Multichip Modules Using Known Good Die
|
Murphy, Cynthia F. |
|
1997 |
10 |
1-2 |
p. 151-166 |
artikel |
8 |
Editorial
|
Agrawal, Vishwani D. |
|
1997 |
10 |
1-2 |
p. 5 |
artikel |
9 |
Electron Beam Probing—A Solution for MCM Test and Failure Analysis
|
Schmid, R. |
|
1997 |
10 |
1-2 |
p. 55-63 |
artikel |
10 |
Fundamentals of MCM Testing and Design-for-Testability
|
Zorian, Yervant |
|
1997 |
10 |
1-2 |
p. 7-14 |
artikel |
11 |
Guest Editorial
|
Zorian, Yervant |
|
1997 |
10 |
1-2 |
p. 6 |
artikel |
12 |
Known Good Die
|
Gilg, Larry |
|
1997 |
10 |
1-2 |
p. 15-25 |
artikel |
13 |
MCM Test Strategy Synthesis from Chip Test and Board Test Approaches
|
Flint, Andrew |
|
1997 |
10 |
1-2 |
p. 65-76 |
artikel |
14 |
Multichip Module Diagnosis by Product-Code Signatures
|
Nagvajara, P. |
|
1997 |
10 |
1-2 |
p. 127-136 |
artikel |
15 |
Simulation Techniques for the Manufacturing Test of MCMs
|
Tegethoff, Mick |
|
1997 |
10 |
1-2 |
p. 137-149 |
artikel |
16 |
Smart Substrate MCMs
|
Gattiker, Anne E. |
|
1997 |
10 |
1-2 |
p. 39-53 |
artikel |