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                             34 results found
no title author magazine year volume issue page(s) type
1 A fast and stable Poisson-Schrödinger solver for the analysis of carbon nanotube transistors Pourfath, M.
2006
5 2-3 p. 155-159
article
2 An efficient numerical technique for the implementation of SSLS and cyclostationary noise analysis in physics-based device simulators Bertazzi, F.
2006
5 2-3 p. 85-89
article
3 A study of envelope functions in FD-SOI devices for non-parabolic bands Gómez-Campos, F. M.
2006
5 2-3 p. 167-170
article
4 A study of threshold voltage fluctuations of nanoscale double gate metal-oxide-semiconductor field effect transistors using quantum correction simulation Li, Yiming
2006
5 2-3 p. 125-129
article
5 Atomistic effect of delta doping layer in a 50 nm InP HEMT Seoane, N.
2006
5 2-3 p. 131-135
article
6 Channel noise modelling of nanoMOSFETs in a partially ballistic transport regime Mugnaini, Giorgio
2006
5 2-3 p. 91-95
article
7 Complementary split rings resonators (CSRRs): Towards the miniaturization of microwave device design Bonache, J.
2006
5 2-3 p. 193-197
article
8 Confined acoustic phonons in ultrathin SOI layers Donetti, L.
2006
5 2-3 p. 199-203
article
9 Dielectric ground plane design over bianisotropic media Toscano, Alessandro
2006
5 2-3 p. 229-234
article
10 2D Modeling of nanoscale DG SOI MOSFETs in and near the subthreshold regime Kolberg, Sigbjørn
2006
5 2-3 p. 217-222
article
11 Editorial: Modeling and simulation of electron devices Iannaccone, Giuseppe
2006
5 2-3 p. 69-70
article
12 Effect of layout parasitics on the current distribution of power MOSFETs operated at high switching frequency Biondi, Tonio
2006
5 2-3 p. 149-153
article
13 Efficient calculation of lifetime based direct tunneling through stacked dielectrics Karner, M.
2006
5 2-3 p. 161-165
article
14 Equivalent circuit for RF flexural free-free MEMS resonators Mastrangeli, M.
2006
5 2-3 p. 205-210
article
15 Excess drain noise simulation in ultrathin oxides MOSFETs Contaret, T.
2006
5 2-3 p. 187-192
article
16 High order explicit versus quasi-linear implicit finite-difference approximation for semiconductor device time-domain macroscopic modelling on parallel computer Moussati, Ali El
2006
5 2-3 p. 235-240
article
17 Modeling of non-equilibrium transport effects in Fully-Depleted GeOI-MOSFETs Pala, Marco
2006
5 2-3 p. 241-245
article
18 Modeling turn-off voltage rise in SOI LIGBT Napoli, Ettore
2006
5 2-3 p. 181-186
article
19 Monte Carlo simulation of terahertz quantum cascade lasers: The influence of the modelling of carrier-carrier scattering Bonno, O.
2006
5 2-3 p. 103-107
article
20 Monte Carlo study of electron transport in strained silicon inversion layers Ungersboeck, E.
2006
5 2-3 p. 79-83
article
21 Numerical modeling of TeraHertz electronic devices Varani, L.
2006
5 2-3 p. 71-77
article
22 Numerical simulation of ballistic surface transport in cylindrical nanosystems Marchi, Alex
2006
5 2-3 p. 177-180
article
23 Numerical simulation of electrical characteristics in nanoscale Si/GaAs MOSFETs Li, Yiming
2006
5 2-3 p. 255-258
article
24 Numerical simulation of small silicon partially insulated MOSFETs Klix, Wilfried
2006
5 2-3 p. 251-254
article
25 Numerical simulation of time resolved charge transport in semiconductor structures for electronic devices Citarella, G.
2006
5 2-3 p. 211-215
article
26 One-dimensional screening effects in bulk-modulated carbon nanotube transistors Latessa, L.
2006
5 2-3 p. 97-101
article
27 Scaling effects in AlGaN/GaN HEMTs: Comparison between Monte Carlo simulations and experimental data Russo, S.
2006
5 2-3 p. 109-113
article
28 Scattering resonances in 1D coherent transport through a correlated quantum dot: An application of the few-particle quantum transmitting boundary method Bertoni, Andrea
2006
5 2-3 p. 247-250
article
29 Sensitivity of single- and double-gate MOS architectures to residual discrete dopant distribution in the channel Dollfus, P.
2006
5 2-3 p. 119-123
article
30 Silicon-on-insulator non-volatile memories with second-bit effect Perniola, L.
2006
5 2-3 p. 137-142
article
31 Simulation of slow current transients and current collapse in GaN FETs Takayanagi, H.
2006
5 2-3 p. 223-227
article
32 Simulation of the gate tunnel current in the double gate (DG) MOS transistor Majkusiak, B.
2006
5 2-3 p. 143-148
article
33 Strain effects in SiN-passivated GaN-based HEMT devices Sacconi, Fabio
2006
5 2-3 p. 115-118
article
34 Validity of the effective potential approach for the simulation of quantum confinement effects: A Monte-Carlo study Jaud, M.-A.
2006
5 2-3 p. 171-175
article
                             34 results found
 
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