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                                       Details for article 33 of 34 found articles
 
 
  Strain effects in SiN-passivated GaN-based HEMT devices
 
 
Title: Strain effects in SiN-passivated GaN-based HEMT devices
Author: Sacconi, Fabio
Povolotskyi, Michael
Carlo, Aldo Di
Appeared in: Journal of computational electronics
Paging: Volume 5 (2006) nr. 2-3 pages 115-118
Year: 2006
Contents:
Publisher: Kluwer Academic Publishers, Boston
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 33 of 34 found articles
 
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