nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
A 2D Full-Band Monte Carlo Study of HgCdTe-Based Avalanche Photodiodes
|
Bellotti, Enrico |
|
2011 |
40 |
8 |
p. 1651-1656 |
artikel |
2 |
Calculation of Auger Lifetimes in HgCdTe
|
Bertazzi, Francesco |
|
2011 |
40 |
8 |
p. 1663-1667 |
artikel |
3 |
CdZnTe Radiation Detectors with HgTe/HgCdTe Superlattice Contacts for Leakage Current Reduction
|
Chang, Y. |
|
2011 |
40 |
8 |
p. 1854-1859 |
artikel |
4 |
Chemical Polishing of CdTe and CdZnTe in Iodine–Methanol Etching Solutions
|
Ivanits’ka, V. G. |
|
2011 |
40 |
8 |
p. 1802-1808 |
artikel |
5 |
Core–Shell ZnxCd1−xSe/ZnyCd1−ySe Quantum Dots for Nonvolatile Memory and Electroluminescent Device Applications
|
Al-Amoody, Fuad |
|
2011 |
40 |
8 |
p. 1699-1705 |
artikel |
6 |
Design and Modeling of HgCdTe nBn Detectors
|
Itsuno, A. M. |
|
2011 |
40 |
8 |
p. 1624-1629 |
artikel |
7 |
Dislocation Analysis in (112)B HgCdTe/CdTe/Si
|
Benson, J. D. |
|
2011 |
40 |
8 |
p. 1847-1853 |
artikel |
8 |
Dual-Color InAs/GaSb Superlattice Focal-Plane Array Technology
|
Rehm, Robert |
|
2011 |
40 |
8 |
p. 1738-1743 |
artikel |
9 |
Effect of As Passivation on Vapor-Phase Epitaxial Growth of Ge on (211)Si as a Buffer Layer for CdTe Epitaxy
|
Shintri, Shashidhar |
|
2011 |
40 |
8 |
p. 1637-1641 |
artikel |
10 |
Effect of Cycle Annealing Parameters on Dislocation Density Reduction for HgCdTe on Si
|
Farrell, S. |
|
2011 |
40 |
8 |
p. 1727-1732 |
artikel |
11 |
Effects of Varying MBE Growth Conditions on Layered Zn-Se-Te Structures
|
Roy, Bidisha |
|
2011 |
40 |
8 |
p. 1775-1780 |
artikel |
12 |
Foreword
|
Sivananthan, S. |
|
2011 |
40 |
8 |
p. 1613-1614 |
artikel |
13 |
HgCdTe Photon Trapping Structure for BroadbandMid-Wavelength Infrared Absorption
|
Wehner, J. G. A. |
|
2011 |
40 |
8 |
p. 1840-1846 |
artikel |
14 |
HgCdTe Quantum Detection: from Long-Wave IR down to UV
|
Gravrand, O. |
|
2011 |
40 |
8 |
p. 1781-1784 |
artikel |
15 |
High-Quality (211)B CdTe on (211)Si Substrates Using Metalorganic Vapor-Phase Epitaxy
|
Rao, S. R. |
|
2011 |
40 |
8 |
p. 1790-1794 |
artikel |
16 |
History-Dependent Impact Ionization Theory Applied to HgCdTe e-APDs
|
Rothman, Johan |
|
2011 |
40 |
8 |
p. 1757-1768 |
artikel |
17 |
Internal Electric Field Behavior of Cadmium Zinc Telluride Radiation Detectors Under High Carrier Injection
|
Yang, G. |
|
2011 |
40 |
8 |
p. 1689-1692 |
artikel |
18 |
Large-Format HgCdTe Dual-Band Long-Wavelength Infrared Focal-Plane Arrays
|
Smith, E. P. G. |
|
2011 |
40 |
8 |
p. 1630-1636 |
artikel |
19 |
Low-Pressure Chemical Vapor Deposition of CdS and Atomic Layer Deposition of CdTe Films for HgCdTe Surface Passivation
|
Licausi, Nicholas |
|
2011 |
40 |
8 |
p. 1668-1673 |
artikel |
20 |
Low-Roughness Plasma Etching of HgCdTe Masked with Patterned Silicon Dioxide
|
Ye, Z. H. |
|
2011 |
40 |
8 |
p. 1642-1646 |
artikel |
21 |
Microstructural Characterization of CdTe(211)B/ZnTe/Si(211) Heterostructures Grown by Molecular Beam Epitaxy
|
ZHAO, W. F. |
|
2011 |
40 |
8 |
p. 1733-1737 |
artikel |
22 |
Microstructure of Heteroepitaxial ZnTe Grown by Molecular Beam Epitaxy on Si(211) Substrates
|
Wang, X. J. |
|
2011 |
40 |
8 |
p. 1860-1866 |
artikel |
23 |
Molecular Beam Epitaxy Growth of HgCdTe on Large-Area Si and CdZnTe Substrates
|
Reddy, M. |
|
2011 |
40 |
8 |
p. 1706-1716 |
artikel |
24 |
Nonvolatile Memory Effect in Indium Gallium Arsenide-Based Metal–Oxide–Semiconductor Devices Using II–VI Tunnel Insulators
|
Chan, P.-Y. |
|
2011 |
40 |
8 |
p. 1685-1688 |
artikel |
25 |
Nonvolatile Silicon Memory Using GeOx-Cladded Ge Quantum Dots Self-Assembled on SiO2 and Lattice-Matched II–VI Tunnel Insulator
|
Gogna, M. |
|
2011 |
40 |
8 |
p. 1769-1774 |
artikel |
26 |
Optimization of Microlenses for InSb Infrared Focal-Plane Arrays
|
Guo, N. |
|
2011 |
40 |
8 |
p. 1647-1650 |
artikel |
27 |
Performance Comparison of Long-Wavelength Infrared Type II Superlattice Devices with HgCdTe
|
Rhiger, David R. |
|
2011 |
40 |
8 |
p. 1815-1822 |
artikel |
28 |
Planar n-on-p HgCdTe FPAs for LWIR and VLWIR Applications
|
Wollrab, R. |
|
2011 |
40 |
8 |
p. 1618-1623 |
artikel |
29 |
Reduction of Dislocation Density in HgCdTe on Si by Producing Highly Reticulated Structures
|
Stoltz, A. J. |
|
2011 |
40 |
8 |
p. 1785-1789 |
artikel |
30 |
Si Wafer Thinning Techniques Compatible With Epitaxy of CdTe Buffer Layers
|
Markunas, J. K. |
|
2011 |
40 |
8 |
p. 1809-1814 |
artikel |
31 |
Spatial Wavefunction-Switched (SWS) InGaAs FETs with II–VI Gate Insulators
|
Jain, F. C. |
|
2011 |
40 |
8 |
p. 1717-1726 |
artikel |
32 |
Spectral Response Model of Backside-Illuminated HgCdTe Detectors
|
D’Souza, A. I. |
|
2011 |
40 |
8 |
p. 1657-1662 |
artikel |
33 |
Status of p-on-n Arsenic-Implanted HgCdTe Technologies
|
Mollard, L. |
|
2011 |
40 |
8 |
p. 1830-1839 |
artikel |
34 |
Study of HgCdSe Material Grown by Molecular Beam Epitaxy
|
Brill, G. |
|
2011 |
40 |
8 |
p. 1679-1684 |
artikel |
35 |
The Effect of Various Detector Geometries on the Performance of CZT Using One Crystal
|
Washington, Aaron L. |
|
2011 |
40 |
8 |
p. 1744-1748 |
artikel |
36 |
The Effects of Microvoid Defects on MWIR HgCdTe-Based Diodes
|
Billman, C. A. |
|
2011 |
40 |
8 |
p. 1693-1698 |
artikel |
37 |
The William E. Spicer–Thomas N. Casselman Award for Best Student Paper
|
Reine, Marion B. |
|
2011 |
40 |
8 |
p. 1615-1617 |
artikel |
38 |
Three-Dimensional Electromagnetic and Electrical Simulation of HgCdTe Pixel Arrays
|
Keasler, Craig A. |
|
2011 |
40 |
8 |
p. 1795-1801 |
artikel |
39 |
Three-State Quantum Dot Gate FETs Using ZnS-ZnMgS Lattice-Matched Gate Insulator on Silicon
|
Karmakar, Supriya |
|
2011 |
40 |
8 |
p. 1749-1756 |
artikel |
40 |
Wet Etching of HgCdTe in Aqueous Bromine Solutions: a Quantitative Chemical Approach
|
Causier, A. |
|
2011 |
40 |
8 |
p. 1823-1829 |
artikel |
41 |
ZnO/ZnSe/ZnTe Heterojunctions for ZnTe-Based Solar Cells
|
Wang, W. |
|
2011 |
40 |
8 |
p. 1674-1678 |
artikel |