nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
Gas source molecular beam epitaxy grown strained-Si films on step-graded relaxed Si1−xGex for MOS applications
|
Bera, L. K. |
|
|
28 |
2 |
p. 98-104 |
artikel |
2 |
Gas source molecular beam epitaxy grown strained-Si films on step-graded relaxed Si1−xGex for MOS applications
|
Bera, L. K. |
|
1999 |
28 |
2 |
p. 98-104 |
artikel |
3 |
Impurity incorporation and the surface morphology of MOVPE grown GaAs
|
Li, Jiang |
|
|
28 |
2 |
p. 124-133 |
artikel |
4 |
Impurity incorporation and the surface morphology of MOVPE grown GaAs
|
Li, Jiang |
|
1999 |
28 |
2 |
p. 124-133 |
artikel |
5 |
Interfacial reactions between liquid indium and nickel substrate
|
Tseng, Y. H. |
|
|
28 |
2 |
p. 105-108 |
artikel |
6 |
Interfacial reactions between liquid indium and nickel substrate
|
Tseng, Y. H. |
|
1999 |
28 |
2 |
p. 105-108 |
artikel |
7 |
New plasma chemistries for etching III–V compound semiconductors: Bl3 and BBr3
|
Maeda, Takeshi |
|
|
28 |
2 |
p. 118-123 |
artikel |
8 |
New plasma chemistries for etching III–V compound semiconductors: Bl3 and BBr3
|
Maeda, Takeshi |
|
1999 |
28 |
2 |
p. 118-123 |
artikel |
9 |
Passivation of the facets of 980 nm GaAs pump lasers by a pulsed UV laser-assisted technique
|
Kerboeuf, S. |
|
|
28 |
2 |
p. 83-90 |
artikel |
10 |
Passivation of the facets of 980 nm GaAs pump lasers by a pulsed UV laser-assisted technique
|
Kerboeuf, S. |
|
1999 |
28 |
2 |
p. 83-90 |
artikel |
11 |
SIMS analysis of nitrided oxides grown on 4H-SiC
|
Tanner, P. |
|
|
28 |
2 |
p. 109-111 |
artikel |
12 |
SIMS analysis of nitrided oxides grown on 4H-SiC
|
Tanner, P. |
|
1999 |
28 |
2 |
p. 109-111 |
artikel |
13 |
Strain relaxation mechanisms in Si1−xGex layers grown by solid-phase epitaxy: Influence of the layer composition and growth temperature
|
Rodríguez, A. |
|
|
28 |
2 |
p. 77-82 |
artikel |
14 |
Strain relaxation mechanisms in Si1−xGex layers grown by solid-phase epitaxy: Influence of the layer composition and growth temperature
|
Rodríguez, A. |
|
1999 |
28 |
2 |
p. 77-82 |
artikel |
15 |
The structural changes in CdS-CdTe thin films due to annealing
|
Rogers, K. D. |
|
|
28 |
2 |
p. 112-117 |
artikel |
16 |
The structural changes in CdS-CdTe thin films due to annealing
|
Rogers, K. D. |
|
1999 |
28 |
2 |
p. 112-117 |
artikel |
17 |
Transient behavior of Hg1−xCdxTe film growth on (111)B CdTe substrates by chemical vapor transport
|
Ge, Yu-Ru |
|
|
28 |
2 |
p. 91-97 |
artikel |
18 |
Transient behavior of Hg1−xCdxTe film growth on (111)B CdTe substrates by chemical vapor transport
|
Ge, Yu-Ru |
|
1999 |
28 |
2 |
p. 91-97 |
artikel |