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                             22 gevonden resultaten
nr titel auteur tijdschrift jaar jaarg. afl. pagina('s) type
1 Application of atomic force microscopy in the study of microbiologically influenced corrosion Xu, Li-Chong
2002
48 2-3 p. 195-203
9 p.
artikel
2 B-induced reconstruction on Si(100)-(2×1) surface studied with scanning tunneling microscopy Hu, Yan-fang
2002
48 2-3 p. 183-188
6 p.
artikel
3 Characterization of materials' nanomechanical properties by force modulation and phase imaging atomic force microscopy with soft cantilevers Snitka, V.
2002
48 2-3 p. 147-152
6 p.
artikel
4 Comparison of strain gage and interferometric detection for measurement and control of piezoelectric actuators Colchero, L.
2002
48 2-3 p. 133-140
8 p.
artikel
5 Evaluation of surface and subsurface cracks in nanoscale-machined single-crystal silicon by scanning force microscope and scanning laser microscope Sumomogi, Tsunetaka
2002
48 2-3 p. 141-145
5 p.
artikel
6 Ferroelectric domain configuration and piezoelectric responses in (001)-oriented PMN-PT films Wang, J.
2002
48 2-3 p. 215-220
6 p.
artikel
7 Fluorinated fullerene thin films on Si(111)-(7×7) surface Sadowski, J.T
2002
48 2-3 p. 127-132
6 p.
artikel
8 Fractal processing of AFM images of rough ZnO films Sun, Xia
2002
48 2-3 p. 169-175
7 p.
artikel
9 Investigation of Si and Ge growth on Si3N4/Si Wang, Lei
2002
48 2-3 p. 189-194
6 p.
artikel
10 Magnetic force microscopy study of domain structures in magnetoresistance (Ni74Fe16Co10) x Ag1−x granular films Wang, Hao
2002
48 2-3 p. 153-158
6 p.
artikel
11 Nanotube-like structures naturally formed on HOPG surface Sun, Jielin
2002
48 2-3 p. 237-240
4 p.
artikel
12 Preface Xu, J.B.
2002
48 2-3 p. 115-
1 p.
artikel
13 Preparation of crystalline TiC thin films grown by pulsed Nd:YAG laser deposition using Ti target in methane gas Suda, Yoshiaki
2002
48 2-3 p. 221-228
8 p.
artikel
14 Purity-dependent structures of Al nanoclusters on HOPG observed by STM Endo, T
2002
48 2-3 p. 159-162
4 p.
artikel
15 Quantitative complex electrical impedance microscopy by scanning evanescent microwave microscope Xiang, X.-D.
2002
48 2-3 p. 117-125
9 p.
artikel
16 Sample refinement and manipulation of silicon nanowires He, J.Z
2002
48 2-3 p. 177-181
5 p.
artikel
17 Scaling analysis of Fe-implanted Ge surfaces using atomic force microscopy Venugopal, R.
2002
48 2-3 p. 241-247
7 p.
artikel
18 Studies of nanobubbles produced at liquid/solid interfaces Lou, Shitao
2002
48 2-3 p. 211-214
4 p.
artikel
19 Studying the high-field electron conduction of tetrahedral amorphous carbon thin films by conducting atomic force microscopy Luo, E.Z
2002
48 2-3 p. 205-210
6 p.
artikel
20 Study of polarization switching in PZT films with RuO2 electrodes by conducting atomic force microscopy Wang, B
2002
48 2-3 p. 249-253
5 p.
artikel
21 Surface and interface morphology of CoSi2 films formed by multilayer solid-state reaction Ru, Guo-Ping
2002
48 2-3 p. 229-235
7 p.
artikel
22 Surface oxidation of a Nb(100) single crystal by scanning tunneling microscopy Li, Y
2002
48 2-3 p. 163-167
5 p.
artikel
                             22 gevonden resultaten
 
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