no |
title |
author |
magazine |
year |
volume |
issue |
page(s) |
type |
1 |
Application of atomic force microscopy in the study of microbiologically influenced corrosion
|
Xu, Li-Chong |
|
2002 |
48 |
2-3 |
p. 195-203 9 p. |
article |
2 |
B-induced reconstruction on Si(100)-(2×1) surface studied with scanning tunneling microscopy
|
Hu, Yan-fang |
|
2002 |
48 |
2-3 |
p. 183-188 6 p. |
article |
3 |
Characterization of materials' nanomechanical properties by force modulation and phase imaging atomic force microscopy with soft cantilevers
|
Snitka, V. |
|
2002 |
48 |
2-3 |
p. 147-152 6 p. |
article |
4 |
Comparison of strain gage and interferometric detection for measurement and control of piezoelectric actuators
|
Colchero, L. |
|
2002 |
48 |
2-3 |
p. 133-140 8 p. |
article |
5 |
Evaluation of surface and subsurface cracks in nanoscale-machined single-crystal silicon by scanning force microscope and scanning laser microscope
|
Sumomogi, Tsunetaka |
|
2002 |
48 |
2-3 |
p. 141-145 5 p. |
article |
6 |
Ferroelectric domain configuration and piezoelectric responses in (001)-oriented PMN-PT films
|
Wang, J. |
|
2002 |
48 |
2-3 |
p. 215-220 6 p. |
article |
7 |
Fluorinated fullerene thin films on Si(111)-(7×7) surface
|
Sadowski, J.T |
|
2002 |
48 |
2-3 |
p. 127-132 6 p. |
article |
8 |
Fractal processing of AFM images of rough ZnO films
|
Sun, Xia |
|
2002 |
48 |
2-3 |
p. 169-175 7 p. |
article |
9 |
Investigation of Si and Ge growth on Si3N4/Si
|
Wang, Lei |
|
2002 |
48 |
2-3 |
p. 189-194 6 p. |
article |
10 |
Magnetic force microscopy study of domain structures in magnetoresistance (Ni74Fe16Co10) x Ag1−x granular films
|
Wang, Hao |
|
2002 |
48 |
2-3 |
p. 153-158 6 p. |
article |
11 |
Nanotube-like structures naturally formed on HOPG surface
|
Sun, Jielin |
|
2002 |
48 |
2-3 |
p. 237-240 4 p. |
article |
12 |
Preface
|
Xu, J.B. |
|
2002 |
48 |
2-3 |
p. 115- 1 p. |
article |
13 |
Preparation of crystalline TiC thin films grown by pulsed Nd:YAG laser deposition using Ti target in methane gas
|
Suda, Yoshiaki |
|
2002 |
48 |
2-3 |
p. 221-228 8 p. |
article |
14 |
Purity-dependent structures of Al nanoclusters on HOPG observed by STM
|
Endo, T |
|
2002 |
48 |
2-3 |
p. 159-162 4 p. |
article |
15 |
Quantitative complex electrical impedance microscopy by scanning evanescent microwave microscope
|
Xiang, X.-D. |
|
2002 |
48 |
2-3 |
p. 117-125 9 p. |
article |
16 |
Sample refinement and manipulation of silicon nanowires
|
He, J.Z |
|
2002 |
48 |
2-3 |
p. 177-181 5 p. |
article |
17 |
Scaling analysis of Fe-implanted Ge surfaces using atomic force microscopy
|
Venugopal, R. |
|
2002 |
48 |
2-3 |
p. 241-247 7 p. |
article |
18 |
Studies of nanobubbles produced at liquid/solid interfaces
|
Lou, Shitao |
|
2002 |
48 |
2-3 |
p. 211-214 4 p. |
article |
19 |
Studying the high-field electron conduction of tetrahedral amorphous carbon thin films by conducting atomic force microscopy
|
Luo, E.Z |
|
2002 |
48 |
2-3 |
p. 205-210 6 p. |
article |
20 |
Study of polarization switching in PZT films with RuO2 electrodes by conducting atomic force microscopy
|
Wang, B |
|
2002 |
48 |
2-3 |
p. 249-253 5 p. |
article |
21 |
Surface and interface morphology of CoSi2 films formed by multilayer solid-state reaction
|
Ru, Guo-Ping |
|
2002 |
48 |
2-3 |
p. 229-235 7 p. |
article |
22 |
Surface oxidation of a Nb(100) single crystal by scanning tunneling microscopy
|
Li, Y |
|
2002 |
48 |
2-3 |
p. 163-167 5 p. |
article |