| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
Adsorption of dodecahydroxylated-fullerene monolayers at the air–water interface
|
Liu, W.-J
|
|
2000
|
283 |
1-3 |
p. 49-52
4 p.
|
artikel
|
| 2 |
Analysis of the strain distribution in lateral nanostructures for interpreting photoluminescence data
|
Pietsch, U
|
|
2000
|
283 |
1-3 |
p. 92-96
5 p.
|
artikel
|
| 3 |
Bragg diffraction in a coherent X-ray scattering experiment
|
Kaganer, V.M
|
|
2000
|
283 |
1-3 |
p. 268-272
5 p.
|
artikel
|
| 4 |
Chemical and magnetization profile study of Ce in [CeLaCe/Fe] and [LaCeLa/Fe] multilayers by resonant X-ray reflectivity
|
Jaouen, N
|
|
2000
|
283 |
1-3 |
p. 175-179
5 p.
|
artikel
|
| 5 |
Determination of the layered structure in Mo/Si multilayers by grazing incidence X-ray reflectometry
|
Yakshin, A.E
|
|
2000
|
283 |
1-3 |
p. 143-148
6 p.
|
artikel
|
| 6 |
Dewetting of thin polymer-blend films examined with GISAS
|
Müller-Buschbaum, P.
|
|
2000
|
283 |
1-3 |
p. 53-59
7 p.
|
artikel
|
| 7 |
Experimental demonstration of phase determination in neutron reflectometry by variation of the surrounding media
|
Majkrzak, C.F.
|
|
2000
|
283 |
1-3 |
p. 248-252
5 p.
|
artikel
|
| 8 |
Focusing of coherent X-rays in a tapered planar waveguide
|
Zwanenburg, M.J
|
|
2000
|
283 |
1-3 |
p. 285-288
4 p.
|
artikel
|
| 9 |
Fully hydrated and highly oriented membranes: an experimental setup amenable to specular and diffuse X-ray scattering
|
Vogel, M
|
|
2000
|
283 |
1-3 |
p. 32-36
5 p.
|
artikel
|
| 10 |
Grazing incidence neutron diffraction from large scale 2D structures
|
Toperverg, B.P
|
|
2000
|
283 |
1-3 |
p. 149-152
4 p.
|
artikel
|
| 11 |
Grazing-incidence small-angle X-ray scattering applied to the characterization of aggregates in surface regions
|
Naudon, A
|
|
2000
|
283 |
1-3 |
p. 69-74
6 p.
|
artikel
|
| 12 |
Grazing incidence X-ray studies of twist-bonded Si/Si and Si/SiO2 interfaces
|
Buttard, D
|
|
2000
|
283 |
1-3 |
p. 103-107
5 p.
|
artikel
|
| 13 |
Hydrogen absorption in epitaxial W/Nb(001) and polycrystalline Fe/Nb(110) multilayers studied in situ by X-ray/neutron scattering techniques and X-ray absorption spectroscopy
|
Klose, F
|
|
2000
|
283 |
1-3 |
p. 184-188
5 p.
|
artikel
|
| 14 |
In-plane strain and shape analysis of Si/SiGe nanostructures by grazing incidence diffraction
|
Zhuang, Y
|
|
2000
|
283 |
1-3 |
p. 130-134
5 p.
|
artikel
|
| 15 |
Interfacial structures of block and graft copolymers with lamellar microphase-separated structures
|
Torikai, Naoya
|
|
2000
|
283 |
1-3 |
p. 12-16
5 p.
|
artikel
|
| 16 |
Investigation of the magnetism in thin single Ho(00.1) films via neutron reflectivity measurements
|
Leiner, V
|
|
2000
|
283 |
1-3 |
p. 167-170
4 p.
|
artikel
|
| 17 |
Lateral and vertical ordering of self-assembled PbSe quantum dots studied by high-resolution X-ray diffraction
|
Holý, V.
|
|
2000
|
283 |
1-3 |
p. 65-68
4 p.
|
artikel
|
| 18 |
Magnetic off-specular neutron scattering from Fe/Cr multilayers
|
Lauter-Pasyuk, V.
|
|
2000
|
283 |
1-3 |
p. 194-198
5 p.
|
artikel
|
| 19 |
Magnetism in lanthanide superlattices
|
Goff, J.P
|
|
2000
|
283 |
1-3 |
p. 180-183
4 p.
|
artikel
|
| 20 |
Molecular layering in a liquid on a solid substrate: an X-ray reflectivity study
|
Yu, C.-J
|
|
2000
|
283 |
1-3 |
p. 27-31
5 p.
|
artikel
|
| 21 |
Morphology of Au(1,1,1) vicinal surfaces studied by grazing incidence X-ray diffraction
|
Garreau, Y.
|
|
2000
|
283 |
1-3 |
p. 223-227
5 p.
|
artikel
|
| 22 |
Morphology of nanocermet thin films: X-ray scattering study
|
Hazra, S
|
|
2000
|
283 |
1-3 |
p. 97-102
6 p.
|
artikel
|
| 23 |
Morphology of off-specular neutron scattering pattern from islands on a lamellar film
|
Toperverg, B.
|
|
2000
|
283 |
1-3 |
p. 60-64
5 p.
|
artikel
|
| 24 |
Multilayers for the EUV/soft X-ray range
|
Schäfers, F
|
|
2000
|
283 |
1-3 |
p. 119-124
6 p.
|
artikel
|
| 25 |
Nonspecular scattering from extreme ultraviolet multilayer coatings
|
Stearns, D.G.
|
|
2000
|
283 |
1-3 |
p. 84-91
8 p.
|
artikel
|
| 26 |
On the use of a multilayer monochromator in neutron reflectometry
|
van Well, A.A
|
|
2000
|
283 |
1-3 |
p. 282-284
3 p.
|
artikel
|
| 27 |
Organization of tethered polyoxazoline polymer brushes at the air/water interface
|
Gutberlet, T
|
|
2000
|
283 |
1-3 |
p. 37-39
3 p.
|
artikel
|
| 28 |
Overflowing cylinder for neutron reflection research at expanding surfaces
|
Wagemaker, M
|
|
2000
|
283 |
1-3 |
p. 278-281
4 p.
|
artikel
|
| 29 |
Oxidation of Nb(110) thin films on a-plane sapphire substrates: an X-ray study
|
Hellwig, O.
|
|
2000
|
283 |
1-3 |
p. 228-231
4 p.
|
artikel
|
| 30 |
Oxidation of NiAl(100) studied with surface sensitive X-ray diffraction
|
Stierle, A.
|
|
2000
|
283 |
1-3 |
p. 208-211
4 p.
|
artikel
|
| 31 |
Phase determination in neutron reflection
|
Lipperheide, R
|
|
2000
|
283 |
1-3 |
p. 242-247
6 p.
|
artikel
|
| 32 |
Phase-sensitive surface X-ray scattering study of a crystalline organic–organic heterostructure
|
Schreiber, F
|
|
2000
|
283 |
1-3 |
p. 75-78
4 p.
|
artikel
|
| 33 |
Polarization analysis of neutron reflectometry on non-collinear magnetic media: polarized neutron reflectometry experiments on a thin cobalt film
|
van de Kruijs, R.W.E
|
|
2000
|
283 |
1-3 |
p. 189-193
5 p.
|
artikel
|
| 34 |
Polarized neutron reflectivity characterization of weakly coupled Co/Cu multilayers
|
Borchers, J.A.
|
|
2000
|
283 |
1-3 |
p. 162-166
5 p.
|
artikel
|
| 35 |
Practical aspects of inverse scattering methods applied to specular reflectivity data
|
van der Lee, A
|
|
2000
|
283 |
1-3 |
p. 273-277
5 p.
|
artikel
|
| 36 |
Protein insertion within a biological freestanding film
|
Cuvillier, Nicolas
|
|
2000
|
283 |
1-3 |
p. 1-5
5 p.
|
artikel
|
| 37 |
Reflectivity and off-specular neutron scattering from ferrofluid
|
Toperverg, B
|
|
2000
|
283 |
1-3 |
p. 203-207
5 p.
|
artikel
|
| 38 |
Resonance X-ray scattering from Pt(1 1 1) surfaces under water
|
You, H.
|
|
2000
|
283 |
1-3 |
p. 212-216
5 p.
|
artikel
|
| 39 |
Role of interfacial correlation in melting of Langmuir–Blodgett films
|
Basu, J.K.
|
|
2000
|
283 |
1-3 |
p. 6-11
6 p.
|
artikel
|
| 40 |
Roughness correlations in ultra-thin polymer blend films
|
Gutmann, J.S.
|
|
2000
|
283 |
1-3 |
p. 40-44
5 p.
|
artikel
|
| 41 |
Roughness effects on magnetic properties of thin films
|
Palasantzas, G
|
|
2000
|
283 |
1-3 |
p. 199-202
4 p.
|
artikel
|
| 42 |
Roughness in sputtered multilayers analyzed by transmission electron microscopy and X-ray diffuse scattering
|
Macrander, A.T.
|
|
2000
|
283 |
1-3 |
p. 157-161
5 p.
|
artikel
|
| 43 |
Selection of a model in reflectometry: use of the linear statistical inference
|
Samoilenko, I.
|
|
2000
|
283 |
1-3 |
p. 262-267
6 p.
|
artikel
|
| 44 |
Soft X-ray magnetic scattering from striped magnetic domain structures
|
van der Laan, G
|
|
2000
|
283 |
1-3 |
p. 171-174
4 p.
|
artikel
|
| 45 |
Structural and morphological studies of Co/SiO2 discontinuous multilayers
|
Thiaudière, D
|
|
2000
|
283 |
1-3 |
p. 114-118
5 p.
|
artikel
|
| 46 |
Structural investigations of sputter deposited thin films: reflection mode EXAFS, specular and non specular X-ray scattering
|
Lützenkirchen-Hecht, Dirk
|
|
2000
|
283 |
1-3 |
p. 108-113
6 p.
|
artikel
|
| 47 |
Structure of grafted polymers, investigated with neutron reflectometry
|
Currie, E.P.K
|
|
2000
|
283 |
1-3 |
p. 17-21
5 p.
|
artikel
|
| 48 |
Surface traveling X-rays from organic thin film
|
Hayashi, K
|
|
2000
|
283 |
1-3 |
p. 139-142
4 p.
|
artikel
|
| 49 |
Synchrotron X-ray study of the epitaxial Co/Pt multilayers on Al2O3
(11
2
̄
0) substrates with Pt/Mo buffer layers
|
Lee, Chih-Hao
|
|
2000
|
283 |
1-3 |
p. 153-156
4 p.
|
artikel
|
| 50 |
The genetic algorithm: refinement of X-ray reflectivity data from multilayers and thin films
|
Ulyanenkov, A.
|
|
2000
|
283 |
1-3 |
p. 237-241
5 p.
|
artikel
|
| 51 |
The ID01 beamline at the E.S.R.F.: the diffuse scattering technique applied to surface and interface studies
|
Capitan, M.J
|
|
2000
|
283 |
1-3 |
p. 256-261
6 p.
|
artikel
|
| 52 |
Transition between the 1×1 and (
3
×2
3
)R30° surface structures of GaN in the vapor-phase environment
|
Munkholm, A.
|
|
2000
|
283 |
1-3 |
p. 217-222
6 p.
|
artikel
|
| 53 |
Use of advanced optics in a neutron liquids reflectometer
|
Ankner, John F
|
|
2000
|
283 |
1-3 |
p. 253-255
3 p.
|
artikel
|
| 54 |
X-ray diffraction study of the 5-fold plane surface of a Al70.4Pd21.4Mn8.2 single-grain
|
Capitan, M.J
|
|
2000
|
283 |
1-3 |
p. 79-83
5 p.
|
artikel
|
| 55 |
X-ray measurements of the depth dependence of stress in gold films
|
Brennan, S.
|
|
2000
|
283 |
1-3 |
p. 125-129
5 p.
|
artikel
|
| 56 |
X-ray scattering from freely suspended smectic films: resolution and other effects
|
Sentenac, D.
|
|
2000
|
283 |
1-3 |
p. 232-236
5 p.
|
artikel
|
| 57 |
X-ray scattering from polymer films
|
Tolan, M.
|
|
2000
|
283 |
1-3 |
p. 22-26
5 p.
|
artikel
|
| 58 |
X-ray scattering studies of imperfect manganese stearate Langmuir–Blodgett films
|
Hazra, S.
|
|
2000
|
283 |
1-3 |
p. 45-48
4 p.
|
artikel
|
| 59 |
X-ray scattering study of porous silicon layers
|
Chamard, V.
|
|
2000
|
283 |
1-3 |
p. 135-138
4 p.
|
artikel
|
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