| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
A method for trace element determination of single Daphnia specimens using total reflection X-ray fluorescence spectrometry
|
Mages, Margarete
|
|
2001
|
56 |
11 |
p. 2209-2217
9 p.
|
artikel
|
| 2 |
A method of locating dried residue on a semiconductor wafer in vapor phase decomposition-total-reflection X-ray fluorescence spectrometry by monitoring scattered X-rays
|
Mori, Yoshihiro
|
|
2001
|
56 |
11 |
p. 2293-2300
8 p.
|
artikel
|
| 3 |
Analysis of trace metals in thin silicon nitride films by total-reflection X-ray fluorescence
|
Vereecke, G.
|
|
2001
|
56 |
11 |
p. 2321-2330
10 p.
|
artikel
|
| 4 |
Applicability of direct total reflection X-ray fluorescence analysis in the case of human blood serum samples
|
Zarkadas, Ch.
|
|
2001
|
56 |
11 |
p. 2219-2228
10 p.
|
artikel
|
| 5 |
Application of total-reflection X-ray fluorescence spectrometry and high-performance liquid chromatography for the chemical characterization of xylem saps of nickel contaminated cucumber plants
|
Mihucz, Victor G
|
|
2001
|
56 |
11 |
p. 2235-2246
12 p.
|
artikel
|
| 6 |
Assessment of serum selenium levels in 2-month-old sucking calves using total reflection X-ray fluorescence technique
|
Buoso, M.C.
|
|
2001
|
56 |
11 |
p. 2181-2186
6 p.
|
artikel
|
| 7 |
Beijing synchrotron radiation total-reflection X-ray fluorescence analysis facility and its applications on trace element study of cells
|
Yuying, Huang
|
|
2001
|
56 |
11 |
p. 2057-2062
6 p.
|
artikel
|
| 8 |
Calibration of straight total reflection X-ray fluorescence spectrometry — results of a European Round Robin test
|
Rink, I.
|
|
2001
|
56 |
11 |
p. 2283-2292
10 p.
|
artikel
|
| 9 |
Calibration of total-reflection X-ray fluorescence using a nickel bulk sample
|
Knoth, Joachim
|
|
2001
|
56 |
11 |
p. 2275-2281
7 p.
|
artikel
|
| 10 |
Capability and limitations of the determination of sulfur in inorganic and biological matrices by total reflection X-ray fluorescence spectrometry
|
Steinmeyer, S
|
|
2001
|
56 |
11 |
p. 2165-2173
9 p.
|
artikel
|
| 11 |
Characterization of trace elements in high viscosity materials by total reflection X-ray spectrometry
|
Vázquez, C
|
|
2001
|
56 |
11 |
p. 2253-2260
8 p.
|
artikel
|
| 12 |
Detection limit calculations for the total reflection techniques of X-ray fluorescence analysis
|
Sánchez, Héctor Jorge
|
|
2001
|
56 |
11 |
p. 2027-2036
10 p.
|
artikel
|
| 13 |
Determination of concentration distribution of trace elements near the detection limit
|
Kubala-Kukus, A
|
|
2001
|
56 |
11 |
p. 2037-2044
8 p.
|
artikel
|
| 14 |
Determination of technetium by total reflection X-ray fluorescence
|
Bermúdez, J.I.
|
|
2001
|
56 |
11 |
p. 2247-2251
5 p.
|
artikel
|
| 15 |
Determination of trace elements in macrozoobenthos samples by total reflection X-ray fluorescence analysis
|
Miesbauer, Hermann
|
|
2001
|
56 |
11 |
p. 2203-2207
5 p.
|
artikel
|
| 16 |
Determination of ultra trace contaminants on silicon wafer surfaces using total-reflection X-ray fluorescence TXRF ‘state-of-the-art’
|
Pahlke, S
|
|
2001
|
56 |
11 |
p. 2261-2274
14 p.
|
artikel
|
| 17 |
Determination of Zn/Cu ratio and oligoelements in serum samples by total reflection X-ray fluorescence spectrometry for cancer diagnosis
|
Marcó P., L.M.
|
|
2001
|
56 |
11 |
p. 2195-2201
7 p.
|
artikel
|
| 18 |
Electro-deposition as a sample preparation technique for total-reflection X-ray fluorescence analysis
|
Griesel, Simone
|
|
2001
|
56 |
11 |
p. 2107-2115
9 p.
|
artikel
|
| 19 |
Elemental analysis of human amniotic fluid and placenta by total-reflection X-ray fluorescence and energy-dispersive X-ray fluorescence: child weight and maternal age dependence
|
Carvalho, M.L
|
|
2001
|
56 |
11 |
p. 2175-2180
6 p.
|
artikel
|
| 20 |
Energy dispersion of X-ray continua in the energy range 8 keV to 16 keV by refraction on Si wafers
|
Ebel, H
|
|
2001
|
56 |
11 |
p. 2045-2048
4 p.
|
artikel
|
| 21 |
Evaluation of the protein concentration in enzymes via determination of sulfur by total reflection X-ray fluorescence spectrometry — limitations of the method
|
Mertens, M
|
|
2001
|
56 |
11 |
p. 2157-2164
8 p.
|
artikel
|
| 22 |
Feasibility study on in situ microwave digestion prior to analysis of biological samples by total reflection X-ray fluorescence
|
Marcó P., L.M.
|
|
2001
|
56 |
11 |
p. 2187-2193
7 p.
|
artikel
|
| 23 |
Improvement of total reflection X-ray fluorescence analysis of low Z elements on silicon wafer surfaces at the PTB monochromator beamline for undulator radiation at the electron storage ring BESSY II
|
Beckhoff, B
|
|
2001
|
56 |
11 |
p. 2073-2083
11 p.
|
artikel
|
| 24 |
Investigation of polyelectrolytes by total reflection X-ray fluorescence spectrometry
|
Varga, Imre
|
|
2001
|
56 |
11 |
p. 2229-2234
6 p.
|
artikel
|
| 25 |
Laboratory and synchrotron radiation total-reflection X-ray fluorescence: new perspectives in detection limits and data analysis
|
Baur, K
|
|
2001
|
56 |
11 |
p. 2049-2056
8 p.
|
artikel
|
| 26 |
Preface
|
|
|
2001
|
56 |
11 |
p. 2003-2004
2 p.
|
artikel
|
| 27 |
Publisher's note
|
|
|
2001
|
56 |
11 |
p. iii-
1 p.
|
artikel
|
| 28 |
Quality assurance of X-ray spectrometry for chemical analysis
|
Barreiros, M.A
|
|
2001
|
56 |
11 |
p. 2095-2106
12 p.
|
artikel
|
| 29 |
Sensitive detection of trace copper contamination on a silicon wafer by total reflection X-ray fluorescence using W–Lβ or Au–Lβ excitation source
|
Yamada, Takashi
|
|
2001
|
56 |
11 |
p. 2307-2312
6 p.
|
artikel
|
| 30 |
Size-fractionated sampling and chemical analysis by total-reflection X-ray fluorescence spectrometry of PMx in ambient air and emissions
|
John, A.C
|
|
2001
|
56 |
11 |
p. 2137-2146
10 p.
|
artikel
|
| 31 |
Some aspects of the high-temperature behavior of bismuth, strontium and barium on silicon surfaces studied by total reflection X-ray fluorescence spectrometry
|
Kilian, G
|
|
2001
|
56 |
11 |
p. 2313-2319
7 p.
|
artikel
|
| 32 |
Synchrotron radiation induced total reflection X-ray fluorescence of low Z elements on Si wafer surfaces at SSRL — comparison of excitation geometries and conditions
|
Streli, C
|
|
2001
|
56 |
11 |
p. 2085-2094
10 p.
|
artikel
|
| 33 |
Synchrotron radiation total reflection X-ray fluorescence and energy dispersive X-ray fluorescence analysis on AP1™ films applied to the analysis of trace elements in metal alloys for the construction of nuclear reactor core components: a comparison
|
Pepponi, G.
|
|
2001
|
56 |
11 |
p. 2063-2071
9 p.
|
artikel
|
| 34 |
Total-reflection X-ray fluorescence — a tool to obtain information about different air masses and air pollution
|
Schmeling, Martina
|
|
2001
|
56 |
11 |
p. 2127-2136
10 p.
|
artikel
|
| 35 |
Total-reflection X-ray fluorescence moving towards nanoanalysis: a survey
|
Klockenkämper, Reinhold
|
|
2001
|
56 |
11 |
p. 2005-2018
14 p.
|
artikel
|
| 36 |
Total reflection X-ray fluorescence spectrometers for multielement analysis: status of equipment
|
Ayala Jiménez, Rony E.
|
|
2001
|
56 |
11 |
p. 2331-2336
6 p.
|
artikel
|
| 37 |
Total-reflection X-ray fluorescence study of electrochemical deposition of metals on a glass-ceramic carbon electrode surface
|
Alov, N.V
|
|
2001
|
56 |
11 |
p. 2117-2126
10 p.
|
artikel
|
| 38 |
Total reflection X-ray fluorescence study of organic nanostructures
|
Zheludeva, S
|
|
2001
|
56 |
11 |
p. 2019-2026
8 p.
|
artikel
|
| 39 |
Trace analysis for 300 mm wafers and processes with total reflection X-ray fluorescence
|
Nutsch, A.
|
|
2001
|
56 |
11 |
p. 2301-2306
6 p.
|
artikel
|
| 40 |
Use of total-reflection X-ray fluorescence in search of a biomonitor for environmental pollution in Vietnam
|
Brauer, Hans
|
|
2001
|
56 |
11 |
p. 2147-2155
9 p.
|
artikel
|
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