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                             40 results found
no title author magazine year volume issue page(s) type
1 A method for trace element determination of single Daphnia specimens using total reflection X-ray fluorescence spectrometry Mages, Margarete
 2001
 56 11 p. 2209-2217
9 p.
 article
2 A method of locating dried residue on a semiconductor wafer in vapor phase decomposition-total-reflection X-ray fluorescence spectrometry by monitoring scattered X-rays Mori, Yoshihiro
 2001
 56 11 p. 2293-2300
8 p.
 article
3 Analysis of trace metals in thin silicon nitride films by total-reflection X-ray fluorescence Vereecke, G.
 2001
 56 11 p. 2321-2330
10 p.
 article
4 Applicability of direct total reflection X-ray fluorescence analysis in the case of human blood serum samples Zarkadas, Ch.
 2001
 56 11 p. 2219-2228
10 p.
 article
5 Application of total-reflection X-ray fluorescence spectrometry and high-performance liquid chromatography for the chemical characterization of xylem saps of nickel contaminated cucumber plants Mihucz, Victor G
 2001
 56 11 p. 2235-2246
12 p.
 article
6 Assessment of serum selenium levels in 2-month-old sucking calves using total reflection X-ray fluorescence technique Buoso, M.C.
 2001
 56 11 p. 2181-2186
6 p.
 article
7 Beijing synchrotron radiation total-reflection X-ray fluorescence analysis facility and its applications on trace element study of cells Yuying, Huang
 2001
 56 11 p. 2057-2062
6 p.
 article
8 Calibration of straight total reflection X-ray fluorescence spectrometry — results of a European Round Robin test Rink, I.
 2001
 56 11 p. 2283-2292
10 p.
 article
9 Calibration of total-reflection X-ray fluorescence using a nickel bulk sample Knoth, Joachim
 2001
 56 11 p. 2275-2281
7 p.
 article
10 Capability and limitations of the determination of sulfur in inorganic and biological matrices by total reflection X-ray fluorescence spectrometry Steinmeyer, S
 2001
 56 11 p. 2165-2173
9 p.
 article
11 Characterization of trace elements in high viscosity materials by total reflection X-ray spectrometry Vázquez, C
 2001
 56 11 p. 2253-2260
8 p.
 article
12 Detection limit calculations for the total reflection techniques of X-ray fluorescence analysis Sánchez, Héctor Jorge
 2001
 56 11 p. 2027-2036
10 p.
 article
13 Determination of concentration distribution of trace elements near the detection limit Kubala-Kukus, A
 2001
 56 11 p. 2037-2044
8 p.
 article
14 Determination of technetium by total reflection X-ray fluorescence Bermúdez, J.I.
 2001
 56 11 p. 2247-2251
5 p.
 article
15 Determination of trace elements in macrozoobenthos samples by total reflection X-ray fluorescence analysis Miesbauer, Hermann
 2001
 56 11 p. 2203-2207
5 p.
 article
16 Determination of ultra trace contaminants on silicon wafer surfaces using total-reflection X-ray fluorescence TXRF ‘state-of-the-art’ Pahlke, S
 2001
 56 11 p. 2261-2274
14 p.
 article
17 Determination of Zn/Cu ratio and oligoelements in serum samples by total reflection X-ray fluorescence spectrometry for cancer diagnosis Marcó P., L.M.
 2001
 56 11 p. 2195-2201
7 p.
 article
18 Electro-deposition as a sample preparation technique for total-reflection X-ray fluorescence analysis Griesel, Simone
 2001
 56 11 p. 2107-2115
9 p.
 article
19 Elemental analysis of human amniotic fluid and placenta by total-reflection X-ray fluorescence and energy-dispersive X-ray fluorescence: child weight and maternal age dependence Carvalho, M.L
 2001
 56 11 p. 2175-2180
6 p.
 article
20 Energy dispersion of X-ray continua in the energy range 8 keV to 16 keV by refraction on Si wafers Ebel, H
 2001
 56 11 p. 2045-2048
4 p.
 article
21 Evaluation of the protein concentration in enzymes via determination of sulfur by total reflection X-ray fluorescence spectrometry — limitations of the method Mertens, M
 2001
 56 11 p. 2157-2164
8 p.
 article
22 Feasibility study on in situ microwave digestion prior to analysis of biological samples by total reflection X-ray fluorescence Marcó P., L.M.
 2001
 56 11 p. 2187-2193
7 p.
 article
23 Improvement of total reflection X-ray fluorescence analysis of low Z elements on silicon wafer surfaces at the PTB monochromator beamline for undulator radiation at the electron storage ring BESSY II Beckhoff, B
 2001
 56 11 p. 2073-2083
11 p.
 article
24 Investigation of polyelectrolytes by total reflection X-ray fluorescence spectrometry Varga, Imre
 2001
 56 11 p. 2229-2234
6 p.
 article
25 Laboratory and synchrotron radiation total-reflection X-ray fluorescence: new perspectives in detection limits and data analysis Baur, K
 2001
 56 11 p. 2049-2056
8 p.
 article
26 Preface 2001
 56 11 p. 2003-2004
2 p.
 article
27 Publisher's note 2001
 56 11 p. iii-
1 p.
 article
28 Quality assurance of X-ray spectrometry for chemical analysis Barreiros, M.A
 2001
 56 11 p. 2095-2106
12 p.
 article
29 Sensitive detection of trace copper contamination on a silicon wafer by total reflection X-ray fluorescence using W–Lβ or Au–Lβ excitation source Yamada, Takashi
 2001
 56 11 p. 2307-2312
6 p.
 article
30 Size-fractionated sampling and chemical analysis by total-reflection X-ray fluorescence spectrometry of PMx in ambient air and emissions John, A.C
 2001
 56 11 p. 2137-2146
10 p.
 article
31 Some aspects of the high-temperature behavior of bismuth, strontium and barium on silicon surfaces studied by total reflection X-ray fluorescence spectrometry Kilian, G
 2001
 56 11 p. 2313-2319
7 p.
 article
32 Synchrotron radiation induced total reflection X-ray fluorescence of low Z elements on Si wafer surfaces at SSRL — comparison of excitation geometries and conditions Streli, C
 2001
 56 11 p. 2085-2094
10 p.
 article
33 Synchrotron radiation total reflection X-ray fluorescence and energy dispersive X-ray fluorescence analysis on AP1™ films applied to the analysis of trace elements in metal alloys for the construction of nuclear reactor core components: a comparison Pepponi, G.
 2001
 56 11 p. 2063-2071
9 p.
 article
34 Total-reflection X-ray fluorescence — a tool to obtain information about different air masses and air pollution Schmeling, Martina
 2001
 56 11 p. 2127-2136
10 p.
 article
35 Total-reflection X-ray fluorescence moving towards nanoanalysis: a survey Klockenkämper, Reinhold
 2001
 56 11 p. 2005-2018
14 p.
 article
36 Total reflection X-ray fluorescence spectrometers for multielement analysis: status of equipment Ayala Jiménez, Rony E.
 2001
 56 11 p. 2331-2336
6 p.
 article
37 Total-reflection X-ray fluorescence study of electrochemical deposition of metals on a glass-ceramic carbon electrode surface Alov, N.V
 2001
 56 11 p. 2117-2126
10 p.
 article
38 Total reflection X-ray fluorescence study of organic nanostructures Zheludeva, S
 2001
 56 11 p. 2019-2026
8 p.
 article
39 Trace analysis for 300 mm wafers and processes with total reflection X-ray fluorescence Nutsch, A.
 2001
 56 11 p. 2301-2306
6 p.
 article
40 Use of total-reflection X-ray fluorescence in search of a biomonitor for environmental pollution in Vietnam Brauer, Hans
 2001
 56 11 p. 2147-2155
9 p.
 article
                             40 results found
 
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