nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
ADXPS/STEM studies of surface and bulk microphase behavior in block- and graft-copolymers and their blends
|
Dwight, D.W. |
|
1990 |
52 |
C |
p. 457-473 17 p. |
artikel |
2 |
An AES study of the initial oxidation of Ni(110) and the influence of Al in clean NiAl
|
Roberts, R.H. |
|
1990 |
52 |
C |
p. 185-195 11 p. |
artikel |
3 |
A new ESCA instrument with improved surface sensitivity, fast imaging properties and excellent energy resolution
|
Gelius, U. |
|
1990 |
52 |
C |
p. 747-785 39 p. |
artikel |
4 |
A new multidetection spectrometer for studies of angle-resolved electron distributions
|
Roy, D. |
|
1990 |
52 |
C |
p. 787-796 10 p. |
artikel |
5 |
Angle-resolved electron stimulated desorption of metastable atoms from solid argon
|
Leclerc, G. |
|
1990 |
52 |
C |
p. 725-734 10 p. |
artikel |
6 |
Angle resolved photoemission using a toroidal energy analyser.
|
Leckey, R. |
|
1990 |
52 |
C |
p. 855-866 12 p. |
artikel |
7 |
An interelectrode distance dependent fringing field correction for the hemispherical deflector analyzer.
|
Louette, P. |
|
1990 |
52 |
C |
p. 867-874 8 p. |
artikel |
8 |
Author index
|
|
|
1990 |
52 |
C |
p. 875-878 4 p. |
artikel |
9 |
Binding energies and reference levels in photoelectron spectroscopy
|
Anderson, S.E. |
|
1990 |
52 |
C |
p. 293-302 10 p. |
artikel |
10 |
Core and valence XPS spectra of clean, cleaved single crystals of YBa2Cu3O7
|
Fowler, D.E. |
|
1990 |
52 |
C |
p. 323-339 17 p. |
artikel |
11 |
Core-Level line shapes of adsorbates: effects of electronic and vibrational excitations
|
Mårtensson, Nils |
|
1990 |
52 |
C |
p. 1-46 46 p. |
artikel |
12 |
Core level line widths of metallic systems
|
Stenborg, A. |
|
1990 |
52 |
C |
p. 47-48 2 p. |
artikel |
13 |
Core level photoelectron microscopy
|
Pianetta, P. |
|
1990 |
52 |
C |
p. 797-810 14 p. |
artikel |
14 |
Electron attenuation lengths at SiO2/Si interfaces
|
Yarmoff, J.A. |
|
1990 |
52 |
C |
p. 221-227 7 p. |
artikel |
15 |
Electron-electron coincidence studies of the decay of photoexcited rare gas core resonances
|
Von Raven, E. |
|
1990 |
52 |
C |
p. 677-688 12 p. |
artikel |
16 |
Electronic structure of Pd/Ag surface alloys
|
Prince, K.C. |
|
1990 |
52 |
C |
p. 61-66 6 p. |
artikel |
17 |
Electronic structure, orientation and symmetry of benzene and benzene coadsorbed with CO and NO on NI(111) and RU(001)
|
Steinrück, H.-P. |
|
1990 |
52 |
C |
p. 91-102 12 p. |
artikel |
18 |
Electron inelastic mean free paths in solids at low energies
|
Tanuma, S. |
|
1990 |
52 |
C |
p. 285-291 7 p. |
artikel |
19 |
Electron spectroscopy amd electron microscopy of a-C:H films
|
Henderson, A.E. |
|
1990 |
52 |
C |
p. 475-483 9 p. |
artikel |
20 |
Electron spectroscopy of polymers
|
Pireaux, J.J. |
|
1990 |
52 |
C |
p. 423-445 23 p. |
artikel |
21 |
Epitaxial growth of MnTe on CdTe(110)
|
Niles, David W. |
|
1990 |
52 |
C |
p. 139-147 9 p. |
artikel |
22 |
Escascope - a new imaging photoelectron spectrometer
|
Coxon, P. |
|
1990 |
52 |
C |
p. 821-836 16 p. |
artikel |
23 |
Evidence of reacting iodine species at the surface of a polyphenylacetylene film investigated by XPS
|
Polzonetti, G. |
|
1990 |
52 |
C |
p. 581-588 8 p. |
artikel |
24 |
Extensions to computer programs for quantitative surface analysis
|
Moir, P.A. |
|
1990 |
52 |
C |
p. 229-242 14 p. |
artikel |
25 |
Factor analysis of angle-dependent XPS Si 2p spectra from dry processed Si wafers
|
Moulder, J.F. |
|
1990 |
52 |
C |
p. 303-309 7 p. |
artikel |
26 |
High energy spectroscopic studies of the electronic structure of high Tc materials
|
Fuggle, J.C. |
|
1990 |
52 |
C |
p. 311-312 2 p. |
artikel |
27 |
Inelastic background correction and quantitative surface analysis
|
Tougaard, S. |
|
1990 |
52 |
C |
p. 243-271 29 p. |
artikel |
28 |
Information on structure and photoemission dynamics of molecular absorbates from circular dichroism in photoemission
|
Westphal, C. |
|
1990 |
52 |
C |
p. 613-622 10 p. |
artikel |
29 |
Inhomogeneous charging problem in XPS measurement of surface contaminated high-TC superconducting material
|
Zhao, Liang Zhong |
|
1990 |
52 |
C |
p. 395-404 10 p. |
artikel |
30 |
Inverse photoemission study of copper at variable photon energy
|
Lange, C. |
|
1990 |
52 |
C |
p. 49-60 12 p. |
artikel |
31 |
Investigation of electronic structures op high-Tc compounds La1.85Sr0.15CuO4,YBa2Cu3O7-X, Bi2Sr2CaCu2OX :leels studies
|
Grazhulis, V.A. |
|
1990 |
52 |
C |
p. 375-383 9 p. |
artikel |
32 |
Investigation of surfaces by scanning photoemission microscopy
|
Rotermund, H.H. |
|
1990 |
52 |
C |
p. 811-819 9 p. |
artikel |
33 |
LEELS study of the formation of the AG-semiconductor (Si. Ge.A3B5) interface at 10K
|
Aristov, V.Yu. |
|
1990 |
52 |
C |
p. 113-119 7 p. |
artikel |
34 |
Lifetimes of the 31,3P and 31,3D states of helium
|
Wedding, A.B. |
|
1990 |
52 |
C |
p. 689-696 8 p. |
artikel |
35 |
Low temperature adsorption of O 2 on Pt(111)
|
Grimblot, J. |
|
1990 |
52 |
C |
p. 161-174 14 p. |
artikel |
36 |
Multiplet structure in core-level XPS OF HIGH-Tc material La2CuO4 and related Cu-compounds
|
Okada, K. |
|
1990 |
52 |
C |
p. 313-322 10 p. |
artikel |
37 |
On the problem of the core level shifts at (110) surfaces of 111-v semiconductor compounds
|
Rodriguez-Hernández, P. |
|
1990 |
52 |
C |
p. 155-160 6 p. |
artikel |
38 |
Oxidation of alkali/GaAs(110) interfaces
|
Remmers, G. |
|
1990 |
52 |
C |
p. 79-89 11 p. |
artikel |
39 |
Oxide overlayers and the superconducting RF properties of yttrium-processed Nb
|
Palmer, F.L. |
|
1990 |
52 |
C |
p. 511-512 2 p. |
artikel |
40 |
Performance of electron spectroscopies from the point of view of EELS and auger microscopies
|
Cazaux, J. |
|
1990 |
52 |
C |
p. 837-853 17 p. |
artikel |
41 |
Photodissociation of core excited molecules
|
Nenner, I. |
|
1990 |
52 |
C |
p. 623-648 26 p. |
artikel |
42 |
Photoelectron dynamics of HI ionized by coherent VUV radiation
|
Mank, A. |
|
1990 |
52 |
C |
p. 661-670 10 p. |
artikel |
43 |
Photoelectron-photoelectron coincidence spectroscopy
|
Price, Stephen D. |
|
1990 |
52 |
C |
p. 649-660 12 p. |
artikel |
44 |
Photoelectron spectroscopy of excited molecular states
|
McKoy, V. |
|
1990 |
52 |
C |
p. 597-612 16 p. |
artikel |
45 |
Photoemission studies of the GaAs(100)-4xl surface
|
Kanski, J. |
|
1990 |
52 |
C |
p. 133-138 6 p. |
artikel |
46 |
Quantum yield of the X-ray photoelectric effect in negative electron affinity emitters
|
Andrushchenko, A.L. |
|
1990 |
52 |
C |
p. 513-527 15 p. |
artikel |
47 |
Scatter diagrams and hotelling transforms: application to surface analytical microscopy
|
Prutton, M. |
|
1990 |
52 |
C |
p. 197-219 23 p. |
artikel |
48 |
Selective observation of si(111) surface states by metastable atom electron spectroscopy
|
Ishii, H. |
|
1990 |
52 |
C |
p. 127-132 6 p. |
artikel |
49 |
Si - noble metal (Au,Cu,Ag) interface formation studies by AES
|
Adamchuk, V.K. |
|
1990 |
52 |
C |
p. 103-112 10 p. |
artikel |
50 |
Subject index
|
|
|
1990 |
52 |
C |
p. 879-887 9 p. |
artikel |
51 |
The energetic characteristics op the x-ray photocathodes
|
Prokhorov, A.M. |
|
1990 |
52 |
C |
p. 529-539 11 p. |
artikel |
52 |
The fermi surfaces and band dispersion of YBa2Cu3O6.9 as seen by angle-resolved photoemission
|
Campuzano, J.C. |
|
1990 |
52 |
C |
p. 363-373 11 p. |
artikel |
53 |
The high-TC superconductivity in the d-p electron system
|
Ivanov, Valery A |
|
1990 |
52 |
C |
p. 385-394 10 p. |
artikel |
54 |
Theoretical aspects for depth profiling by ARXPS
|
Seelmann-Eggebert, M. |
|
1990 |
52 |
C |
p. 273-283 11 p. |
artikel |
55 |
Thermal stability and hydrolytic properties of the As-received high-Tc superconductor studied by XPS
|
Zhao, L.Z. |
|
1990 |
52 |
C |
p. 405-413 9 p. |
artikel |
56 |
THE Sm/Si(100) interface studied by electron spectroscopy
|
Onsgaard, J. |
|
1990 |
52 |
C |
p. 67-78 12 p. |
artikel |
57 |
Threshold photoelectron spectrum of the argon 3S satellites
|
Medhurst, L.J. |
|
1990 |
52 |
C |
p. 671-675 5 p. |
artikel |
58 |
TSC and PL spectroscopic studies of polyacetylene
|
Renkuan, Yuan |
|
1990 |
52 |
C |
p. 589-596 8 p. |
artikel |
59 |
Understanding electronegativity effects in core-level electron spectroscopies; application to the high temperature superconductors
|
Ramaker, D.E. |
|
1990 |
52 |
C |
p. 341-354 14 p. |
artikel |
60 |
Ups of thiols and disulfides adsorbed on Cu(410): CH3SH, C2H5SH, C3H7SH, (CH3S)2, (C2H5S)2, (C3H7S)2
|
Anderson, S.E. |
|
1990 |
52 |
C |
p. 735-746 12 p. |
artikel |
61 |
Valence bands and surface states of CdTe(110)
|
Qu, Hua |
|
1990 |
52 |
C |
p. 149-154 6 p. |
artikel |
62 |
Valence core excited states and multielectron effects in the photoabsorption spectrum of Si(CH3)xCl4-x molecules, near the silicon and chlorine K edges
|
Ferrer, J.L. |
|
1990 |
52 |
C |
p. 711-724 14 p. |
artikel |
63 |
Valence electronic structure of polystyrenes with different tacticities : how to go (or not to go) too far ? A joint theoretical and experimental approach
|
Orti, E. |
|
1990 |
52 |
C |
p. 551-570 20 p. |
artikel |
64 |
XPS : A routine technique to characterize surface of practical catalysts ?
|
Grimbolt, Jean |
|
1990 |
52 |
C |
p. 485-509 25 p. |
artikel |
65 |
XPS investigation of low-temperature adsorption and thermal desorption of N2O on Ag(111)
|
Grimblot, J. |
|
1990 |
52 |
C |
p. 175-183 9 p. |
artikel |
66 |
XPS studies of oxidb films on transition metals
|
Zhao, Liang Zhong |
|
1990 |
52 |
C |
p. 571-580 10 p. |
artikel |
67 |
XPS study of copper dispersion in CuO/Al2O3 catalysts
|
Di Castro, V. |
|
1990 |
52 |
C |
p. 415-422 8 p. |
artikel |
68 |
XPS study of metal/SiOx/Si interfaces
|
He, Z.X. |
|
1990 |
52 |
C |
p. 121-126 6 p. |
artikel |
69 |
XPS study of the surface reaction between Au and Ar+ ion treated polyimide
|
Jeong, H.S. |
|
1990 |
52 |
C |
p. 447-455 9 p. |
artikel |
70 |
XPS study of water vapour effect on high-TC superconductor surface
|
Nefedov, V.I. |
|
1990 |
52 |
C |
p. 355-362 8 p. |
artikel |
71 |
X-ray photoelectron study of Al-Mn alloys
|
Chourasia, A.R. |
|
1990 |
52 |
C |
p. 541-550 10 p. |
artikel |
72 |
Zero-kinetic-energy photoelectrom-photoion coincidence measurements of AR in the 2p and N2 in the 1s region
|
Habenicht, Wieland |
|
1990 |
52 |
C |
p. 697-710 14 p. |
artikel |