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                             35 gevonden resultaten
nr titel auteur tijdschrift jaar jaarg. afl. pagina('s) type
1 Absolute calibration of optical flats using the three-flat test by considering the relative humidity change Yumoto, Hirokatsu
 2013
 710 C p. 2-6
5 p.
 artikel
2 Advance in a nano-accuracy surface profiler with an extended-angle test range Qian, Shinan
 2013
 710 C p. 52-58
7 p.
 artikel
3 A new phase-shift microscope designed for high accuracy stitching interferometry Thomasset, Muriel
 2013
 710 C p. 7-12
6 p.
 artikel
4 A reflectometer for at-wavelength characterisation of gratings Eggenstein, F.
 2013
 710 C p. 166-171
6 p.
 artikel
5 At-wavelength metrology using the moiré fringe analysis method based on a two dimensional grating interferometer Wang, Hongchang
 2013
 710 C p. 78-81
4 p.
 artikel
6 Author Index 2013
 710 C p. 172-176
5 p.
 artikel
7 Beamline mirrors and monochromator for X-ray free electron laser of SACLA Ohashi, Haruhiko
 2013
 710 C p. 139-142
4 p.
 artikel
8 Bimorph mirrors: The Good, the Bad, and the Ugly Alcock, Simon G.
 2013
 710 C p. 87-92
6 p.
 artikel
9 Characterization of the error budget of Alba-NOM Nicolas, Josep
 2013
 710 C p. 24-30
7 p.
 artikel
10 Committees 2013
 710 C p. ix-
1 p.
 artikel
11 contents 2013
 710 C p. x-xii
nvt p.
 artikel
12 Current status of the NSLS-II optical metrology laboratory Idir, Mourad
 2013
 710 C p. 17-23
7 p.
 artikel
13 Determination and compensation of the “reference surface” from redundant sets of surface measurements Polack, François
 2013
 710 C p. 67-71
5 p.
 artikel
14 Development of a high-performance gantry system for a new generation of optical slope measuring profilers Assoufid, Lahsen
 2013
 710 C p. 31-36
6 p.
 artikel
15 Editorial 2013
 710 C p. 1-
1 p.
 artikel
16 Ex situ metrology of x-ray diffraction gratings Yashchuk, Valeriy V.
 2013
 710 C p. 59-66
8 p.
 artikel
17 High accuracy flatness metrology within the European Metrology Research Program Schulz, Michael
 2013
 710 C p. 37-41
5 p.
 artikel
18 Inside front cover (Editorial Board) 2013
 710 C p. IFC-
1 p.
 artikel
19 In situ fine tuning of bendable soft x-ray mirrors using a lateral shearing interferometer Merthe, Daniel J.
 2013
 710 C p. 82-86
5 p.
 artikel
20 Investigations on the spatial resolution of autocollimator-based slope measuring profilers Siewert, F.
 2013
 710 C p. 42-47
6 p.
 artikel
21 Ion beam etching of a flat silicon mirror surface: A study of the shape error evolution Preda, I.
 2013
 710 C p. 98-100
3 p.
 artikel
22 Measurement and analysis of active synchrotron mirrors under operating conditions Sutter, John P.
 2013
 710 C p. 72-77
6 p.
 artikel
23 Microfocusing of the FERMI@Elettra FEL beam with a K–B active optics system: Spot size predictions by application of the WISE code Raimondi, L.
 2013
 710 C p. 131-138
8 p.
 artikel
24 Novel approaches in the SR beamline design Kaznatcheev, K.
 2013
 710 C p. 161-165
5 p.
 artikel
25 Optics requirements for x-ray astronomy and developments at the Marshall Space Flight Center Ramsey, B.D.
 2013
 710 C p. 143-150
8 p.
 artikel
26 Performance of the APS optical slope measuring system Qian, Jun
 2013
 710 C p. 48-51
4 p.
 artikel
27 Polarization properties of Mo/Si multilayers in the EUV range Uschakow, S.
 2013
 710 C p. 120-124
5 p.
 artikel
28 Protocol to study wavefront preservation capabilities of reflective X-ray optics with coherent synchrotron light Rack, A.
 2013
 710 C p. 101-105
5 p.
 artikel
29 Thermal bump removal of a crystal monochromator by designing an optimal shape Micha, Jean-Sébastien
 2013
 710 C p. 155-160
6 p.
 artikel
30 The upgraded LTP-V at SLS Flechsig, U.
 2013
 710 C p. 13-16
4 p.
 artikel
31 The Variable Polarization XUV Beamline P04 at PETRA III: Optics, mechanics and their performance Viefhaus, Jens
 2013
 710 C p. 151-154
4 p.
 artikel
32 Ultra-short-period WC/SiC multilayer coatings for x-ray applications Fernández-Perea, Mónica
 2013
 710 C p. 114-119
6 p.
 artikel
33 X-ray beam-shaping via deformable mirrors: Analytical computation of the required mirror profile Spiga, Daniele
 2013
 710 C p. 125-130
6 p.
 artikel
34 X-ray nanofocusing using a piezoelectric deformable mirror and at-wavelength metrology methods Nakamori, Hiroki
 2013
 710 C p. 93-97
5 p.
 artikel
35 X-ray scattering of periodic and graded multilayers: Comparison of experiments to simulations from surface microroughness characterization Salmaso, Bianca
 2013
 710 C p. 106-113
8 p.
 artikel
                             35 gevonden resultaten
 
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