| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
Analysis of sulphur with external beam proton induced gamma-ray emission analysis
|
Räisänen, J.
|
|
1988
|
30 |
1 |
p. 90-93
4 p.
|
artikel
|
| 2 |
A variable-energy positron beam for low to medium energy research
|
Schultz, Peter J.
|
|
1988
|
30 |
1 |
p. 94-104
11 p.
|
artikel
|
| 3 |
Calendar
|
|
|
1988
|
30 |
1 |
p. 111-113
3 p.
|
artikel
|
| 4 |
Conversion electron Mössbauer spectroscopic study on phosphorus implanted iron
|
Reuther, H.
|
|
1988
|
30 |
1 |
p. 61-66
6 p.
|
artikel
|
| 5 |
Distributions of boron and phosphorus implanted in silicon in the energy range 0.1–1.5 MeV
|
Oosterhoff, S.
|
|
1988
|
30 |
1 |
p. 1-12
12 p.
|
artikel
|
| 6 |
Editorial
|
Picraux, Tom
|
|
1988
|
30 |
1 |
p. v-
1 p.
|
artikel
|
| 7 |
Editorial Board
|
|
|
1988
|
30 |
1 |
p. ii-iii
nvt p.
|
artikel
|
| 8 |
Fission yields in experiments using thick samples in contact with solid state track detectors
|
de Lima, D.A.
|
|
1988
|
30 |
1 |
p. 67-73
7 p.
|
artikel
|
| 9 |
Measurement of channeling radiation using a 45 MeV betatron
|
Buschhorn, G.
|
|
1988
|
30 |
1 |
p. 29-33
5 p.
|
artikel
|
| 10 |
Monte Carlo investigations of the ion microprobe
|
Takaaki, Kato
|
|
1988
|
30 |
1 |
p. 44-50
7 p.
|
artikel
|
| 11 |
Neutron scattering data analysis
|
Lebech, B.
|
|
1988
|
30 |
1 |
p. 110-
1 p.
|
artikel
|
| 12 |
Nonlinear beam optics with real fields in compact storage rings
|
Moser, Herbert O.
|
|
1988
|
30 |
1 |
p. 105-109
5 p.
|
artikel
|
| 13 |
Planar optical waveguides fabricated in LiNbO3 by multiple He+ implantations
|
Weiss, B.L.
|
|
1988
|
30 |
1 |
p. 51-55
5 p.
|
artikel
|
| 14 |
Range profiles of Ar implanted into C films
|
Abel, F.
|
|
1988
|
30 |
1 |
p. 13-15
3 p.
|
artikel
|
| 15 |
Study of alignment and orientation in alkali ion-inert gas atom collisions with the polarized photon-quasi-coincidence technique
|
Staudenmayer, B.
|
|
1988
|
30 |
1 |
p. 21-28
8 p.
|
artikel
|
| 16 |
Superconducting and transport properties and the mixing process in Al/Si multilayer films
|
Xiao-Xing, Xi
|
|
1988
|
30 |
1 |
p. 56-60
5 p.
|
artikel
|
| 17 |
The measurement of impact parameter dependence of K-shell ionization probability by protons
|
Li, Jianying
|
|
1988
|
30 |
1 |
p. 16-20
5 p.
|
artikel
|
| 18 |
The relation between depth and energy in channeling experiments
|
Vos, M.
|
|
1988
|
30 |
1 |
p. 38-43
6 p.
|
artikel
|
| 19 |
Thick target PIXE analyses of the elemental distributions across the surface and inside human fingernails
|
Frey, H.U.
|
|
1988
|
30 |
1 |
p. 83-89
7 p.
|
artikel
|
| 20 |
Transverse straggling of MeV oxygen ions implanted in silicon
|
Grob, J.J.
|
|
1988
|
30 |
1 |
p. 34-37
4 p.
|
artikel
|
| 21 |
Variation of yield with thickness in SIMS and PDMS: Measurements of secondary ion emission from organized molecular films
|
Bolbach, G.
|
|
1988
|
30 |
1 |
p. 74-82
9 p.
|
artikel
|
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