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                             75 results found
no title author magazine year volume issue page(s) type
1 AFM anodization studied by spectromicroscopy Lazzarino, M.
 2003
 200 C p. 46-51
6 p.
 article
2 Angle dependence of the O K edge absorption spectra of TiO2 thin films with preferential texture Räth, S.
 2003
 200 C p. 248-254
7 p.
 article
3 Anomalous diffraction in grazing incidence to study the strain induced by GaN quantum dots stacked in an AlN multilayer Chamard, V.
 2003
 200 C p. 95-99
5 p.
 article
4 Atomic ordering in (InGa)(AsN) quantum wells: An In K-edge X-ray absorption investigation Ciatto, G.
 2003
 200 C p. 34-39
6 p.
 article
5 Author index 2003
 200 C p. 451-460
10 p.
 article
6 Characterisation of grains in tungsten–carbon films Dubček, P.
 2003
 200 C p. 329-332
4 p.
 article
7 Characterisation of new hybrid organic–inorganic nickel silicates by polarised EXAFS Richard-Plouet, Mireille
 2003
 200 C p. 148-154
7 p.
 article
8 Characterization of isolated Ag cations in homoionic Ag-Y zeolites: A combined anomalous XRPD and EXAFS study Lamberti, C.
 2003
 200 C p. 155-159
5 p.
 article
9 Charge ordering and local structure in manganese oxide perovskites studied by EXAFS Bardelli, F.
 2003
 200 C p. 226-230
5 p.
 article
10 Contents 2003
 200 C p. ix-xii
nvt p.
 article
11 Damage assessment in metallic structural materials using high resolution synchrotron X-ray tomography Babout, L.
 2003
 200 C p. 303-307
5 p.
 article
12 Depth resolved investigations of boron implanted silicon Sztucki, M
 2003
 200 C p. 52-59
8 p.
 article
13 Description of a flexible cell for in situ X-ray and far-IR characterization of the surface of powdered materials Lamberti, C.
 2003
 200 C p. 196-201
6 p.
 article
14 Deviation from the virtual crystal approximation in disordered Au–Cu alloy nanocrystals: EXAFS and GIXRD investigation Maurizio, C.
 2003
 200 C p. 178-184
7 p.
 article
15 Direct 3D microscale imaging of carbon–carbon composites with computed holotomography Coindreau, O.
 2003
 200 C p. 308-314
7 p.
 article
16 Dislocation transmission through a Σ=3 grain boundary in Fe 6 at.% Si: In situ experiments in compression specimen Jacques, A.
 2003
 200 C p. 261-266
6 p.
 article
17 Editorial Amenitsch, H
 2003
 200 C p. vii-
1 p.
 article
18 Editorial board 2003
 200 C p. IFC-
1 p.
 article
19 EXAFS and local thermal expansion: The case of silver oxide a Beccara, S.
 2003
 200 C p. 237-241
5 p.
 article
20 Formation and structure of Sn and Sb nanoclusters in thin SiO2 films Spiga, S.
 2003
 200 C p. 171-177
7 p.
 article
21 GISAXS studies of morphology and size distribution of CdS nanocrystals formed in SiO2 by ion implantation Desnica, U.V.
 2003
 200 C p. 191-195
5 p.
 article
22 GISAXS study of shape and size of CDS nanocrystals formed in monocrystalline silicon by ion implantation Dubček, P.
 2003
 200 C p. 138-141
4 p.
 article
23 GISAXS study of structural relaxation in amorphous silicon Dubček, P.
 2003
 200 C p. 110-113
4 p.
 article
24 GIXRD of nanoscale strain patterning in wafer bonding Eymery, J.
 2003
 200 C p. 73-78
6 p.
 article
25 Grain boundary liquid metal wetting: A synchrotron micro-radiographic investigation Pereiro-López, E.
 2003
 200 C p. 333-338
6 p.
 article
26 Grazing incidence diffraction anomalous fine structure of self-assembled semiconductor nanostructures Grenier, S.
 2003
 200 C p. 24-33
10 p.
 article
27 Grazing incidence synchrotron X-ray diffraction study of crystal orientation in microporous films Mintova, S.
 2003
 200 C p. 160-164
5 p.
 article
28 High pressure and high temperature X-ray diffraction study of InAs Pascarelli, S.
 2003
 200 C p. 439-443
5 p.
 article
29 High-pressure X-ray diffraction study of InAs Aquilanti, G.
 2003
 200 C p. 90-94
5 p.
 article
30 Implanted dielectrics: Synchrotron radiation studies by absorption and diffraction techniques Maurizio, C.
 2003
 200 C p. 126-137
12 p.
 article
31 Influence of impurities on the density of states at the fermi level in the c(6×4)-C60/Ag(100) two-dimensional superstructure Vobornik, I.
 2003
 200 C p. 1-4
4 p.
 article
32 Influences of Si spacer layers on the structures of Ge/Si quantum dot bilayers Jiang, X
 2003
 200 C p. 40-45
6 p.
 article
33 In situ microtomography investigation of metal powder compacts during sintering Lame, Olivier
 2003
 200 C p. 287-294
8 p.
 article
34 Interaction of molecular oxygen with single wall nanotubes: Role of surfactant contamination Larciprete, R.
 2003
 200 C p. 5-10
6 p.
 article
35 Internal stress measurements by high-energy synchrotron X-ray diffraction at increased specimen-detector distance Böhm, J
 2003
 200 C p. 315-322
8 p.
 article
36 In x Ga(1−x)As quantum dots grown on GaAs studied by EXAFS in total reflection mode (ReflEXAFS) d’Acapito, F.
 2003
 200 C p. 85-89
5 p.
 article
37 Lattice relaxation around impurity atoms in semiconductors – arsenic in silicon – a comparison between experiment and theory Koteski, V
 2003
 200 C p. 60-65
6 p.
 article
38 Local structure of iron implanted in indium phosphide Ciatto, G.
 2003
 200 C p. 100-104
5 p.
 article
39 Mechanical testing device for in situ experiments on reversibility of dislocation motion in silicon Feiereisen, J.P.
 2003
 200 C p. 339-345
7 p.
 article
40 Microimaging and tomography with chemical speciation Rau, C
 2003
 200 C p. 444-450
7 p.
 article
41 Microstructural characterization of In x Ga1−x N MBE samples Katsikini, M.
 2003
 200 C p. 114-119
6 p.
 article
42 NEXAFS and AFM characterization of Si implanted GaN Katsikini, M
 2003
 200 C p. 120-125
6 p.
 article
43 Ni atomic environment in epitaxial NiO layers on Ag(001) Luches, P.
 2003
 200 C p. 371-375
5 p.
 article
44 Non-destructive microstructural analysis with depth resolution Zolotoyabko, E.
 2003
 200 C p. 382-389
8 p.
 article
45 Order in poly(di-n-alkyl itaconate)s revealed by X-ray scattering experiments Holmes, P.F.
 2003
 200 C p. 411-415
5 p.
 article
46 Photoemission spectroscopy study of the hole-doped Haldane chain Y2−x Sr x BaNiO5 Fagot-Revurat, Y.
 2003
 200 C p. 242-247
6 p.
 article
47 Poly(tetrafluoroethylene) under pressure: X-diffraction studies Lorenzen, M.
 2003
 200 C p. 416-420
5 p.
 article
48 Precipitate scanning in Ni-base γ/γ′-superalloys Roth, S.V.
 2003
 200 C p. 255-260
6 p.
 article
49 Probing the initial stages of solid-state reactions by total reflection EXAFS (reflEXAFS) d’Acapito, F.
 2003
 200 C p. 421-424
4 p.
 article
50 Pulse plating of Pt on n-GaAs (100) wafer surfaces: Synchrotron induced photoelectron spectroscopy and XPS of wet fabrication processes Ensling, D.
 2003
 200 C p. 432-438
7 p.
 article
51 Resonant inelastic X-ray scattering from magnetic systems: Mn in MnFe2O4 Ferriani, P.
 2003
 200 C p. 220-225
6 p.
 article
52 Scanning X-ray microdiffraction of complex materials: Diffraction geometry considerations Paris, O.
 2003
 200 C p. 390-396
7 p.
 article
53 Silver nanocluster formation in ion-exchanged glasses by annealing, ion beam and laser beam irradiation: An EXAFS study Battaglin, G.
 2003
 200 C p. 185-190
6 p.
 article
54 Size and ordering of sputtered Co nanoparticles in Co/Cu multilayers Spizzo, F.
 2003
 200 C p. 142-147
6 p.
 article
55 Small angle X-ray scattering study of oxygen precipitation in silicon Pivac, B
 2003
 200 C p. 105-109
5 p.
 article
56 Soft X-ray magnetic scattering as a probe of recording media Fullerton, Eric E.
 2003
 200 C p. 202-209
8 p.
 article
57 Spectro-microscopy of ultra-thin SiN films on Si(111) Schmidt, Th.
 2003
 200 C p. 79-84
6 p.
 article
58 Spin and orbital moments in Au/Co/Au(111)/W(110) across the spin-reorientation transition-temperature Removic-Langer, K.
 2003
 200 C p. 210-214
5 p.
 article
59 Structural investigation of semiconductor nanostructures by X-ray techniques Stangl, J.
 2003
 200 C p. 11-23
13 p.
 article
60 Structure–activity relationships of heterogeneous catalysts from time-resolved X-ray absorption spectroscopy Ressler, T.
 2003
 200 C p. 165-170
6 p.
 article
61 Structure and magnetic properties in CoCu granular alloys Meneghini, C.
 2003
 200 C p. 215-219
5 p.
 article
62 Structure of bioapatite in human foetal bones: An X-ray diffraction study Dalconi, M.C.
 2003
 200 C p. 406-410
5 p.
 article
63 Study by microtomography of 3D porosity networks in irradiated beryllium Rabaglino, E.
 2003
 200 C p. 352-357
6 p.
 article
64 Synchrotron topography of high temperature–pressure treated silicon implanted with helium Misiuk, A.
 2003
 200 C p. 358-362
5 p.
 article
65 The γ/γ′ mismatch in Ni based superalloys: In situ measurements during a creep test Diologent, F.
 2003
 200 C p. 346-351
6 p.
 article
66 The structure of organic langmuir films on liquid metal surfaces Kraack, H
 2003
 200 C p. 363-370
8 p.
 article
67 The thermal behaviour of cuprite: An XRD–EXAFS combined approach Dapiaggi, M.
 2003
 200 C p. 231-236
6 p.
 article
68 Time-resolved photoelectron spectroscopy of oxidation on the Ti(0001) surface Takakuwa, Y.
 2003
 200 C p. 376-381
6 p.
 article
69 Tomography studies of human foreskin fibroblasts on polymer yarns Thurner, Philipp
 2003
 200 C p. 397-405
9 p.
 article
70 XAFS characterization of buried Si x N y O z samples Pinakidou, F
 2003
 200 C p. 66-72
7 p.
 article
71 XAS study of chromium in Li2MSiO4 (M=Mg, Zn) Jousseaume, C.
 2003
 200 C p. 425-431
7 p.
 article
72 X-ray grazing incidence study of inhomogeneous strain relaxation in Si/SiGe wires Hesse, A.
 2003
 200 C p. 267-272
6 p.
 article
73 X-ray “magnifying” imaging investigation of giant Burgers vector micropipe-dislocations in 4H-SiC Härtwig, J.
 2003
 200 C p. 323-328
6 p.
 article
74 X-ray micro-tomography an attractive characterisation technique in materials science Salvo, L
 2003
 200 C p. 273-286
14 p.
 article
75 X-ray tomographic imaging of Al/SiCp functionally graded composites fabricated by centrifugal casting Velhinho, A
 2003
 200 C p. 295-302
8 p.
 article
                             75 results found
 
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