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                             9 results found
no title author magazine year volume issue page(s) type
1 An application of Raman spectroscopy on the measurement of residual stress in porous silicon Kang, Yilan
 2005
 43 8 p. 847-855
9 p.
 article
2 Bulge deformation measurement and elastic modulus analysis of nanoporous alumina membrane using time sequence speckle pattern interferometry Miao, H.
 2005
 43 8 p. 885-894
10 p.
 article
3 Damage and fracture prediction of plastic-bonded explosive by digital image correlation processing Li, M.
 2005
 43 8 p. 856-868
13 p.
 article
4 Deformation measurements using mutual information: principle and applications Wang, S.B.
 2005
 43 8 p. 895-903
9 p.
 article
5 Development nano-Moiré method with high-resolution microscopy at FML Xie, Huimin
 2005
 43 8 p. 904-918
15 p.
 article
6 Editorial Board 2005
 43 8 p. CO2-
1 p.
 article
7 Full field and microregion deformation measurement of thin films using electronic speckle pattern interferometry and array microindentation marker method Li, Xide
 2005
 43 8 p. 869-884
16 p.
 article
8 Microoptical metrology in China Li, Xide
 2005
 43 8 p. 833-835
3 p.
 article
9 Two-step digital image correlation for micro-region measurement Chen, Jinlong
 2005
 43 8 p. 836-846
11 p.
 article
                             9 results found
 
 Koninklijke Bibliotheek - National Library of the Netherlands