| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
Analog signal generator for BIST of wideband IF signals bandpass sigma–delta modulator
|
Huang, Feng
|
|
|
34 |
1 |
p. 85-91
|
artikel
|
| 2 |
Concurrent error detection of fault-based side-channel cryptanalysis of 128-bit RC6 block cipher
|
Wu, Kaijie
|
|
|
34 |
1 |
p. 31-39
|
artikel
|
| 3 |
Data structures with C++ using STL, 2/e
|
Stojcev, Mile
|
|
|
34 |
1 |
p. 93-94
|
artikel
|
| 4 |
Editorial Board
|
|
|
|
34 |
1 |
p. i
|
artikel
|
| 5 |
Extraction technique for characterization of electric field distribution and drain current in VDMOS power transistor
|
Kaushik, N.
|
|
|
34 |
1 |
p. 77-83
|
artikel
|
| 6 |
New techniques for efficiently assessing reliability of SOCs
|
Civera, P
|
|
|
34 |
1 |
p. 53-61
|
artikel
|
| 7 |
Numerical investigation of characteristics of p-channel Ge/Si hetero-nanocrystal memory
|
Yang, H.G.
|
|
|
34 |
1 |
p. 71-75
|
artikel
|
| 8 |
Parallel testing of multi-port static random access memories
|
Karimi, F.
|
|
|
34 |
1 |
p. 3-21
|
artikel
|
| 9 |
Scan flip-flops with on-line testing ability with respect to input delay and crosstalk faults
|
Metra, C.
|
|
|
34 |
1 |
p. 23-29
|
artikel
|
| 10 |
Special section on defect and fault tolerance in VLSI systems
|
Leveugle, Régis
|
|
|
34 |
1 |
p. 1
|
artikel
|
| 11 |
Study, comparison and application of different VHDL-based fault injection techniques for the experimental validation of a fault-tolerant system
|
Gil, D
|
|
|
34 |
1 |
p. 41-51
|
artikel
|
| 12 |
The measurement of the dielectric and optical properties of nano thin films by THz differential time-domain spectroscopy
|
Lee, Kwang-Su
|
|
|
34 |
1 |
p. 63-69
|
artikel
|
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