Digital Library
Close Browse articles from a journal
 
<< previous    next >>
     Journal description
       All volumes of the corresponding journal
         All issues of the corresponding volume
           All articles of the corresponding issues
                                       Details for article 8 of 12 found articles
 
 
  Parallel testing of multi-port static random access memories
 
 
Title: Parallel testing of multi-port static random access memories
Author: Karimi, F.
Irrinki, S.
Crosby, T.
Park, N.
Lombardi, F.
Appeared in: Microelectronics journal
Paging: Volume 34 () nr. 1 pages 3-21
Year: 2003
Contents:
Publisher: Elsevier Science Ltd
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 8 of 12 found articles
 
<< previous    next >>
 
 Koninklijke Bibliotheek - National Library of the Netherlands