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Journal description
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All articles of the corresponding issues
Details for article 8 of 12 found articles
| Title: |
Parallel testing of multi-port static random access memories |
| Author: |
Karimi, F. Irrinki, S. Crosby, T. Park, N. Lombardi, F. |
| Appeared in: |
Microelectronics journal |
| Paging: | Volume 34 () nr. 1 pages 3-21 |
| Year: |
2003 |
| Contents: | |
| Publisher: |
Elsevier Science Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 8 of 12 found articles
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