|
| << previous | next >> |
Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
Details for article 9 of 12 found articles
| Title: |
Scan flip-flops with on-line testing ability with respect to input delay and crosstalk faults |
| Author: |
Metra, C. Di Francescantonio, S. Favalli, M. Riccò, B. |
| Appeared in: |
Microelectronics journal |
| Paging: | Volume 34 () nr. 1 pages 23-29 |
| Year: |
2003 |
| Contents: | |
| Publisher: |
Elsevier Science Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 9 of 12 found articles
| << previous | next >> |