| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
A novel on-chip electrostatic discharge protection design for RF ICs
|
Feng, H.G.
|
|
|
32 |
3 |
p. 189-195
|
artikel
|
| 2 |
A versatile 3.3V CMOS laser driver system
|
Colonna, V
|
|
|
32 |
3 |
p. 253-263
|
artikel
|
| 3 |
Compact DC model for submicron GaAs MESFETs including gate-source modulation effects
|
McNally, P.J.
|
|
|
32 |
3 |
p. 249-251
|
artikel
|
| 4 |
Conductivity of conductive polymer for flip chip bonding and BGA socket
|
Sun, M
|
|
|
32 |
3 |
p. 197-203
|
artikel
|
| 5 |
Design and testing of a CMOS BDJ detector for integrated micro-analysis systems
|
Lu, G.N.
|
|
|
32 |
3 |
p. 227-234
|
artikel
|
| 6 |
Development of a rapid and automated TEM sample preparation method in semiconductor failure analysis and the study of the relevant TEM artifact
|
Dai, J.Y.
|
|
|
32 |
3 |
p. 221-226
|
artikel
|
| 7 |
Effective modeling of temperature-dependent body current for submicron devices under Bi–MOS hybrid-mode operation
|
Seah, Siau Hing Lionel
|
|
|
32 |
3 |
p. 205-214
|
artikel
|
| 8 |
Erratum to “Mechanical-thermal noise in micromachined gyros” [Microelectron. J. 30 (1999) 1227–1230]
|
Annovazzi-Lodi, V.
|
|
|
32 |
3 |
p. 285
|
artikel
|
| 9 |
Handbook Series on Semiconductors Parameters
|
Henini, M.
|
|
|
32 |
3 |
p. 274-275
|
artikel
|
| 10 |
I d–V d characteristics of optically biased short channel GaAs MESFET
|
Bose, S.
|
|
|
32 |
3 |
p. 241-247
|
artikel
|
| 11 |
Rail-to-rail adaptive biased low-power Op-Amp
|
Ferri, G.
|
|
|
32 |
3 |
p. 265-272
|
artikel
|
| 12 |
RF Circuit Design — Theory and Applications
|
Krstić, D.
|
|
|
32 |
3 |
p. 274
|
artikel
|
| 13 |
Sampling in Digital Signal Processing and Control
|
Naumović, M.
|
|
|
32 |
3 |
p. 273-274
|
artikel
|
| 14 |
Surface-potential-based charge sheet model for the polysilicon thin film transistors without considering kink effect
|
Siddiqui, M.J.
|
|
|
32 |
3 |
p. 235-240
|
artikel
|
| 15 |
Thickness-dependent thermal reliability of low-dielectric constant polycrystalline PTFE submicron dielectric thin films
|
Kim, H.K.
|
|
|
32 |
3 |
p. 215-219
|
artikel
|
Tijdschrift beschrijving