nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
A new family of highly linear CMOS transconductors based on the current tail differential pair
|
Ismail, A.M |
|
|
30 |
8 |
p. 753-767 |
artikel |
2 |
A special mode of AC switching for the electronic material As10Ge15Te75
|
Singla, C.R. |
|
|
30 |
8 |
p. 773-781 |
artikel |
3 |
A VHDL PRIMER, 3rd ed. J. Bhasker, Prentice Hall PTR, Upper Saddle River, New Jersey 07458, 1999, hardcover, 373pp., $64,49, ISBN 0-13-096575-8
|
Stojčev, M |
|
|
30 |
8 |
p. 809-810 |
artikel |
4 |
Digital Signal Processing: A Computer Based Approach. Sanjit K. Mitra. McGraw-Hill, New York, 1998, hardcover, 864pp., £68.99 ISBN 0-07-042953-7
|
Stojćev, M |
|
|
30 |
8 |
p. 807 |
artikel |
5 |
Discrimination of individual gas/odor using responses of integrated thick film tin oxide sensor array and fuzzy-neuro concept
|
Das, R.R. |
|
|
30 |
8 |
p. 793-800 |
artikel |
6 |
Effects of high energetic He+ ion irradiation on the structure of polymeric hydrogenated amorphous carbon
|
Zhang, Q. |
|
|
30 |
8 |
p. 801-805 |
artikel |
7 |
Enhanced electron density in two Si δ-doped Al0.33Ga0.67As/GaAs heterojunctions
|
Sfaxi, L. |
|
|
30 |
8 |
p. 769-772 |
artikel |
8 |
Erratum to Sun Ming, Michael Pecht, Marjorie Ann E. Natishan, A comparative assessment of gold plating thickness required for stationary electrical contacts
|
|
|
|
30 |
8 |
p. 811 |
artikel |
9 |
IC manufacturing test cost estimation at early stages of the design cycle
|
Chen, Tom |
|
|
30 |
8 |
p. 733-738 |
artikel |
10 |
IC yield estimation at early stages of the design cycle
|
Chen, Tom |
|
|
30 |
8 |
p. 725-732 |
artikel |
11 |
Inductorless hyperchaos generator
|
Elwakil, A.S. |
|
|
30 |
8 |
p. 739-743 |
artikel |
12 |
Optoelectronic devices on novel index surfaces
|
Towe, E. |
|
|
30 |
8 |
p. 783-791 |
artikel |
13 |
Study of In0.48Ga0.52P/In0.2Ga0.8As/GaAs pseudomorphic high electron mobility transistor using a two-dimensional device simulator
|
Yoon, S.F |
|
|
30 |
8 |
p. 745-752 |
artikel |
14 |
The 8051 Microcontroller, 3rd ed., I. Scott Mackenzie, Prentice Hall, Upper Saddle River, New Jersey, 1999, hardcover, 366pp., $36.95, ISBN 0-13-780008-8
|
Stojčev, M. |
|
|
30 |
8 |
p. 808-809 |
artikel |
15 |
VLSI Testing; Digital and Mixed Analogue/Digital Techniques; by S.L. Hurst; The Institution of Electrical Engineers, London, 1988 (reprinted with corrections), 532 pp., ISBN 0-85296-901-5, £48.00
|
Harris, M.S. |
|
|
30 |
8 |
p. 808 |
artikel |