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                             19 gevonden resultaten
nr titel auteur tijdschrift jaar jaarg. afl. pagina('s) type
1 A 12-bit 1.25 GS/s RF sampling pipelined ADC using a bandwidth-expanded residue amplifier with bias-free gain-boost technique Zhang, Chenghao

130 C p.
artikel
2 A 16-bit 2.5-MS/s SAR ADC with on-chip foreground calibration Zhang, Xiao-Wei

130 C p.
artikel
3 A comparative study on performance of junctionless Bulk SiGe and Si FinFET Shi, Xinlong

130 C p.
artikel
4 Advances in neuromorphic devices for the hardware implementation of neuromorphic computing systems for future artificial intelligence applications: A critical review Ajayan, J.

130 C p.
artikel
5 A 33.33 Gb/s/wire pin-efficient 1.06 pJ/bit wireline transceiver based on CNRZ-5 for Chiplet in 28 nm CMOS Lai, Mingche

130 C p.
artikel
6 A low gate charge field-plate trench MOSFET with hollow split gate structure Qiao, Ming

130 C p.
artikel
7 Analysis on electrical parameters including temperature and interface trap charges in gate overlap Ge source step shape double gate TFET Saha, Rajesh

130 C p.
artikel
8 An ultra-low-power highly integrated novel one-cell battery management chip for wearables Wu, Kai-Kai

130 C p.
artikel
9 A silicon carbide high gain differential amplifier for extreme temperature applications Yang, Jie

130 C p.
artikel
10 A very low-power discrete-time delta-sigma modulator for wireless body area network Khoshkam, Z.

130 C p.
artikel
11 A 28V NMOS power switch and bootstrap driver with integrated PA gate driver Xu, Honglin

130 C p.
artikel
12 Design and implementation of LTCC coreless transformers for intelligent solid-state switch Lu, Yufang

130 C p.
artikel
13 Editorial Board
130 C p.
artikel
14 High-k field plate DeNMOS design for enhanced performance and electrothermal SOA in switching applications Pali, Shraddha

130 C p.
artikel
15 Impact of band gap and gate dielectric engineering on novel Si0.1Ge0.9-GaAs lateral N-type charge plasma based JLTFET Kumar, Kaushal

130 C p.
artikel
16 Impact of process-induced variability on multi-bit phase change memory devices Kumari, Sudha

130 C p.
artikel
17 Investigation of geometrical impact on a P+ buried negative capacitance SOI FET Santra, Toushik

130 C p.
artikel
18 Measurement method of the IGBT chip temperature fluctuation based on electrothermal model derivation Li, Lie

130 C p.
artikel
19 Split-gate trench metal-oxide-semiconductor field effect transistor with an inverted L-shaped source region Fang, Dong

130 C p.
artikel
                             19 gevonden resultaten
 
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