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Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
3 results found
| no | title | author | magazine | year | volume | issue | page(s) | type |
| 1 | Characterization of plasmonic effects in thin films and metamaterials using spectroscopic ellipsometry |
Oates, T.W.H. |
2011 |
86 | 11-12 |
p. 328-376 49 p. |
article |
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| 2 | Nanometer interface and materials control for multilayer EUV-optical applications |
Louis, E. |
2011 |
86 | 11-12 |
p. 255-294 40 p. |
article |
|
| 3 | The epitaxial crystalline silicon-oxynitride layer on SiC(0001): Formation of an ideal SiC–insulator interface |
Tochihara, Hiroshi |
2011 |
86 | 11-12 |
p. 295-327 33 p. |
article |
3 results found