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  Characterization of plasmonic effects in thin films and metamaterials using spectroscopic ellipsometry
 
 
Title: Characterization of plasmonic effects in thin films and metamaterials using spectroscopic ellipsometry
Author: Oates, T.W.H.
Wormeester, H.
Arwin, H.
Appeared in: Progress in surface science
Paging: Volume 86 (2011) nr. 11-12 pages 49 p.
Year: 2011
Contents:
Publisher: Elsevier Ltd
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

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