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                             33 results found
no title author magazine year volume issue page(s) type
1 Analytical modeling of random discrete traps induced threshold voltage fluctuations in double-gate MOSFET with HfO2/SiO2 gate dielectric stack S.R., Sriram
2019
99 C p. 87-95
article
2 A no-reference error-tolerability test technique for videos via edge and extreme-value checking and its hardware implementation Hsieh, Tong-Yu
2019
99 C p. 1-11
article
3 A thermally-resilient all-optical network-on-chip Karimi, Roshanak
2019
99 C p. 74-86
article
4 Atmospheric neutron single event effect test on Xilinx 28 nm system on chip at CSNS-BL09 Yang, Weitao
2019
99 C p. 119-124
article
5 CIRCA: Towards a modular and extensible framework for approximate circuit generation Witschen, Linus
2019
99 C p. 277-290
article
6 Correctable and uncorrectable errors using large scale DRAM DIMMs in replacement network servers Baeg, Sanghyeon
2019
99 C p. 104-112
article
7 Degradation of AlInAs/InGaAs/InP quantum cascade lasers due to electrode adhesion failure Pierścińska, D.
2019
99 C p. 113-118
article
8 Double parallel barrier height behavior of Au/Poly (linoleic acid)-g-poly (methyl methacrylate) (PLiMMA)/n-Si structure Gökçen, Muharrem
2019
99 C p. 132-136
article
9 Editorial Board 2019
99 C p. ii
article
10 Effect of copper over-pad metallization on reliability of aluminum wire bonds Kawashiro, Fumiyoshi
2019
99 C p. 168-176
article
11 Experimental determination of critical adhesion energies with the Advanced Button Shear Test Pflügler, Nadine
2019
99 C p. 177-185
article
12 Failure analysis and process improvement of copper diffusion Yuan, Luyue
2019
99 C p. 291-294
article
13 In-Operando X-ray diffraction imaging of thermal strains in fully packaged silicon devices Tanner, B.K.
2019
99 C p. 232-238
article
14 Intermetallic compound growth between Sn-Cu-Cr lead-free solder and Cu substrate Bang, Junghwan
2019
99 C p. 62-73
article
15 Kinematics and reliable analysis of decoupled parallel mechanism for ankle rehabilitation Chang, Ting-Cheng
2019
99 C p. 203-212
article
16 Life cycle trends of electronic materials, processes and components Huang, Chien-Ming
2019
99 C p. 262-276
article
17 Life prediction of copper wire bonds in commercial devices using principal component analysis (PCA) Manoharan, Subramani
2019
99 C p. 137-151
article
18 Mechanism to improve the reliability of copper wire bonding with palladium-coating of the wire Qin, Wentao
2019
99 C p. 239-244
article
19 Microstructural evolution and failure mechanism of 62Sn36Pb2Ag/Cu solder joint during thermal cycling Li, Qi-hai
2019
99 C p. 12-18
article
20 Modeling and detecting approach for the change point of electronic product infant failure rate He, Yihai
2019
99 C p. 222-231
article
21 Multi-objective optimal design of motion precision for fork robot arm in LCD panel manufacturing process system Kuo, Jian-Long
2019
99 C p. 19-30
article
22 Numerical simulation of harmful gas distribution in a range hood with an improved flow channel Wu, Wen-Chung
2019
99 C p. 245-261
article
23 Oxidation characteristics of commercial copper-based lead frame surface and the bonding with epoxy molding compounds Chao, Shih-Chieh
2019
99 C p. 161-167
article
24 Photovoltaics battery module power supply system with CIGS film applied in portable devices Liou, Jian-Chiun
2019
99 C p. 96-103
article
25 Reliability analysis of complex brain networks based on chaotic time series Sun, Gengxin
2019
99 C p. 295-301
article
26 Review of shelf life evaluation methods and a physics of failure approach for shelf life estimation for electronic components Li, Nga Man Jennifa
2019
99 C p. 152-160
article
27 Scaling and optimisation of lateral super-junction multi-gate MOSFET for high drive current and low specific on-resistance in sub–50 V applications Adenekan, Olujide A.
2019
99 C p. 213-221
article
28 Sense amplifier offset voltage analysis for both time-zero and time-dependent variability Agbo, Innocent
2019
99 C p. 52-61
article
29 Shear strength of off-eutectic AuGe joints at high-temperature Larsson, Andreas
2019
99 C p. 31-43
article
30 Stress investigation of annular-trench-isolated TSV by polarized Raman spectroscopy measurement and finite element simulation Feng, Wei
2019
99 C p. 125-131
article
31 Study of grain size effect of Cu metallization on interfacial microstructures of solder joints Zheng, Zeyang
2019
99 C p. 44-51
article
32 Study of wire bonding reliability of Ag-Pd-Au alloy wire with flash-gold after chlorination and sulfidation Wu, Yu-Hsien
2019
99 C p. 186-196
article
33 The influence of thermal ageing on the flow-stress of copper traces on PCB's Yuile, Adam
2019
99 C p. 197-202
article
                             33 results found
 
 Koninklijke Bibliotheek - National Library of the Netherlands