nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
A comparison of the effects of cobalt-60 γ ray irradiation on DPSA bipolar transistors at high and low injection levels
|
Zhang, Peijian |
|
2017 |
71 |
C |
p. 86-90 5 p. |
artikel |
2 |
A statistical study to identify the effects of packaging structures on lumen reliability of LEDs
|
Chen, Qi |
|
2017 |
71 |
C |
p. 51-55 5 p. |
artikel |
3 |
Development of numerical algorithm to guide solder joint structure and component structural design during manufacturing
|
Chen, Yilong |
|
2017 |
71 |
C |
p. 134-142 9 p. |
artikel |
4 |
Dynamic pull-in and pull-out analysis of viscoelastic nanoplates under electrostatic and Casimir forces via sinusoidal shear deformation theory
|
Shokravi, M. |
|
2017 |
71 |
C |
p. 17-28 12 p. |
artikel |
5 |
Editorial Board
|
|
|
2017 |
71 |
C |
p. IFC- 1 p. |
artikel |
6 |
Effects of twin grain boundaries on the subgrain rotation of the solder joint during thermal shock
|
Tan, Shihai |
|
2017 |
71 |
C |
p. 126-133 8 p. |
artikel |
7 |
Energetic deposition, measurement and simulation of graphitic contacts to 6H-SiC
|
Tran, Hiep |
|
2017 |
71 |
C |
p. 82-85 4 p. |
artikel |
8 |
Evaluating the material properties of underfill for a reliable 3D TSV integration package using numerical analysis
|
Yoon, Hyungseok |
|
2017 |
71 |
C |
p. 41-50 10 p. |
artikel |
9 |
Fatigue life prediction of Package-on-Package stacking assembly under random vibration loading
|
Xia, Jiang |
|
2017 |
71 |
C |
p. 111-118 8 p. |
artikel |
10 |
Fault detection using thermal image based on soft computing methods: Comparative study
|
Al-Obaidy, Furat |
|
2017 |
71 |
C |
p. 56-64 9 p. |
artikel |
11 |
Finite element analysis of thermal and mechanical stresses due to the grain anisotropy of polycrystalline β-Sn
|
Sakamoto, Junji |
|
2017 |
71 |
C |
p. 29-34 6 p. |
artikel |
12 |
High-current stressing of organic light-emitting diodes with different electron-transport materials
|
Liu, L. |
|
2017 |
71 |
C |
p. 106-110 5 p. |
artikel |
13 |
High cycle fatigue testing of thermosonic ball bonds
|
Lassnig, A. |
|
2017 |
71 |
C |
p. 91-98 8 p. |
artikel |
14 |
Improved on-chip self-triggered single-event transient measurement circuit design and applications
|
Chen, Rongmei |
|
2017 |
71 |
C |
p. 99-105 7 p. |
artikel |
15 |
Interfacial reactions and mechanical strength of Sn-3.0Ag-0.5Cu/Ni/Cu and Au-20Sn/Ni/Cu solder joints for power electronics applications
|
Lee, Byung-Suk |
|
2017 |
71 |
C |
p. 119-125 7 p. |
artikel |
16 |
Numerical simulations of migration and coalescence behavior of microvoids driven by diffusion and electric field in solder interconnects
|
Liang, S.B. |
|
2017 |
71 |
C |
p. 71-81 11 p. |
artikel |
17 |
On the short-circuit and avalanche ruggedness reliability assessment of SiC MOSFET modules
|
Ionita, Claudiu |
|
2017 |
71 |
C |
p. 6-16 11 p. |
artikel |
18 |
Operational frequency degradation induced trapping in scaled GaN HEMTs
|
Ubochi, Brendan |
|
2017 |
71 |
C |
p. 35-40 6 p. |
artikel |
19 |
Self-triggered stacked silicon-controlled rectifier structure (STSSCR) for on-chip electrostatic discharge (ESD) protection
|
Jizhi, Liu |
|
2017 |
71 |
C |
p. 1-5 5 p. |
artikel |
20 |
Single event effects sensitivity of low energy proton in Xilinx Zynq-7010 system-on chip
|
Du, Xuecheng |
|
2017 |
71 |
C |
p. 65-70 6 p. |
artikel |