| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
Accurate reliability analysis of concurrent checking circuits employing an efficient analytical method
|
An, T.
|
|
2015
|
55 |
3-4 |
p. 696-703
8 p.
|
artikel
|
| 2 |
A dual-rail compact defect-tolerant multiplexer
|
Ben Dhia, A.
|
|
2015
|
55 |
3-4 |
p. 662-670
9 p.
|
artikel
|
| 3 |
Ageing and thermal recovery of advanced SiGe heterojunction bipolar transistors under long-term mixed-mode and reverse stress conditions
|
Fischer, G.G.
|
|
2015
|
55 |
3-4 |
p. 498-507
10 p.
|
artikel
|
| 4 |
An accurate closed-expression model for FinFETs parasitic resistance
|
Pereira, A.S.N.
|
|
2015
|
55 |
3-4 |
p. 470-480
11 p.
|
artikel
|
| 5 |
An efficient BTX sensor based on p-type nanoporous titania thin films
|
Dutta, K.
|
|
2015
|
55 |
3-4 |
p. 558-564
7 p.
|
artikel
|
| 6 |
An evaluation of dwell time and mean cyclic temperature parameters in the Engelmaier model
|
George, Elviz
|
|
2015
|
55 |
3-4 |
p. 582-587
6 p.
|
artikel
|
| 7 |
A return on investment analysis of applying health monitoring to LED lighting systems
|
Chang, Moon-Hwan
|
|
2015
|
55 |
3-4 |
p. 527-537
11 p.
|
artikel
|
| 8 |
Burnout properties of microwave pulse injected on GaAs PHEMT
|
Zhang, Cunbo
|
|
2015
|
55 |
3-4 |
p. 508-513
6 p.
|
artikel
|
| 9 |
Characterization and modeling of power MOSFET switching times variations under constant electrical stress
|
Sezgin, Hatice Gül
|
|
2015
|
55 |
3-4 |
p. 492-497
6 p.
|
artikel
|
| 10 |
Cross-layer investigation of continuous-time sigma–delta modulator under aging effects
|
Cai, Hao
|
|
2015
|
55 |
3-4 |
p. 645-653
9 p.
|
artikel
|
| 11 |
Degradation behavior by DC-accelerated and pulse-current stress in Co/Cr/Y/Al/Ni co-doped ZnO–PrO1.83-based varistors
|
Nahm, Choon-W.
|
|
2015
|
55 |
3-4 |
p. 565-571
7 p.
|
artikel
|
| 12 |
Design and analyze of transient-induced latch-up in RS485 transceiver with on-chip TVS
|
Jiang, Qi
|
|
2015
|
55 |
3-4 |
p. 637-644
8 p.
|
artikel
|
| 13 |
Design of a folded cascode opamp with increased immunity to conducted electromagnetic interference in 0.18μm CMOS
|
Richelli, Anna
|
|
2015
|
55 |
3-4 |
p. 654-661
8 p.
|
artikel
|
| 14 |
Development of a fast method for optimization of Au ball bond process
|
Gomes, J.
|
|
2015
|
55 |
3-4 |
p. 602-607
6 p.
|
artikel
|
| 15 |
Effect of aluminum concentration on the microstructure and mechanical properties of Sn–Cu–Al solder alloy
|
Yang, Li
|
|
2015
|
55 |
3-4 |
p. 596-601
6 p.
|
artikel
|
| 16 |
Elimination of stress induced dislocation in deep Poly Sinker LDMOS technology
|
Xu, Xiangming
|
|
2015
|
55 |
3-4 |
p. 486-491
6 p.
|
artikel
|
| 17 |
Extended Sensor Reliability Evaluation Method in multi-sensor control systems
|
Łęczycki, Paweł
|
|
2015
|
55 |
3-4 |
p. 671-678
8 p.
|
artikel
|
| 18 |
Fatigue life and resistance analysis of COG assemblies under hygrothermal aging
|
Zhang, Wenguo
|
|
2015
|
55 |
3-4 |
p. 623-629
7 p.
|
artikel
|
| 19 |
Hot carrier effect on the bipolar transistors’ response to electromagnetic interference
|
Xiong, Cen
|
|
2015
|
55 |
3-4 |
p. 514-519
6 p.
|
artikel
|
| 20 |
Improving the power cycling performance of IGBT modules by plating the emitter contact
|
Özkol, Emre
|
|
2015
|
55 |
3-4 |
p. 552-557
6 p.
|
artikel
|
| 21 |
Improving the reliability of the Benes network for use in large-scale systems
|
Jahanshahi, Mohsen
|
|
2015
|
55 |
3-4 |
p. 679-695
17 p.
|
artikel
|
| 22 |
Inside front cover - Editorial board
|
|
|
2015
|
55 |
3-4 |
p. IFC-
1 p.
|
artikel
|
| 23 |
Leakage current study and relevant defect localization in integrated circuit failure analysis
|
Wu, Chunlei
|
|
2015
|
55 |
3-4 |
p. 463-469
7 p.
|
artikel
|
| 24 |
Maximum pulse current estimation for high accuracy power capability prediction of a Li-Ion battery
|
Lee, Seongjun
|
|
2015
|
55 |
3-4 |
p. 572-581
10 p.
|
artikel
|
| 25 |
Microstructure, tensile and electrical properties of gold-coated silver bonding wire
|
Tseng, Yi-Wei
|
|
2015
|
55 |
3-4 |
p. 608-612
5 p.
|
artikel
|
| 26 |
MOSFET channel resistance characterization from the triode region to impact ionization region with the inductive breakdown network
|
Lee, Chie-In
|
|
2015
|
55 |
3-4 |
p. 481-485
5 p.
|
artikel
|
| 27 |
Real-time fault-tolerance with hot-standby topology for conditional sum adder
|
Mukherjee, Atin
|
|
2015
|
55 |
3-4 |
p. 704-712
9 p.
|
artikel
|
| 28 |
Reliability of thin films: Experimental study on mechanical and thermal behavior of indium tin oxide and poly(3,4-ethylenedioxythiophene)
|
Alkhazaili, Atif
|
|
2015
|
55 |
3-4 |
p. 538-546
9 p.
|
artikel
|
| 29 |
Robust dual-direction SCR with low trigger voltage, tunable holding voltage for high-voltage ESD protection
|
Wang, Yang
|
|
2015
|
55 |
3-4 |
p. 520-526
7 p.
|
artikel
|
| 30 |
Temperature mapping by μ-Raman spectroscopy over cross-section area of power diode in forward biased conditions
|
Kociniewski, T.
|
|
2015
|
55 |
3-4 |
p. 547-551
5 p.
|
artikel
|
| 31 |
The effect of the echo-time of a bipolar pulse waveform on molten metallic droplet formation by squeeze mode piezoelectric inkjet printing
|
Wu, Cheng-Han
|
|
2015
|
55 |
3-4 |
p. 630-636
7 p.
|
artikel
|
| 32 |
The fundamentals of thermal-mass diffusion analogy
|
Wong, E.H.
|
|
2015
|
55 |
3-4 |
p. 588-595
8 p.
|
artikel
|
| 33 |
Vacuum effect on the void formation of the molded underfill process in flip chip packaging
|
Guo, Xue-Ru
|
|
2015
|
55 |
3-4 |
p. 613-622
10 p.
|
artikel
|
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