| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
Accurate negative bias temperature instability lifetime prediction based on hole injection
|
Teramoto, Akinobu
|
|
2008
|
48 |
10 |
p. 1649-1654
6 p.
|
artikel
|
| 2 |
An explanation of the dependence of the effective saturation velocity on gate voltage in sub-0.1μm metal–oxide–semiconductor transistors by quasi-ballistic transport theory
|
Lau, W.S.
|
|
2008
|
48 |
10 |
p. 1641-1648
8 p.
|
artikel
|
| 3 |
A note on “using intuitionistic fuzzy sets for fault-tree analysis on printed circuit board assembly”
|
Li, Deng-Feng
|
|
2008
|
48 |
10 |
p. 1741-
1 p.
|
artikel
|
| 4 |
Calendar
|
|
|
2008
|
48 |
10 |
p. I-II
nvt p.
|
artikel
|
| 5 |
Characterization of defects in flexible circuits with ultrasonic atomic force microscopy
|
Nalladega, Vijayaraghava
|
|
2008
|
48 |
10 |
p. 1683-1688
6 p.
|
artikel
|
| 6 |
Dynamic study of the thermal laser stimulation response on advanced technology structures
|
Reverdy, A.
|
|
2008
|
48 |
10 |
p. 1689-1695
7 p.
|
artikel
|
| 7 |
Effect of crystallographic defects on the reverse performance of 4H–SiC JBS diodes
|
Grekov, A.
|
|
2008
|
48 |
10 |
p. 1664-1668
5 p.
|
artikel
|
| 8 |
Effects of continuously applied stress on tin whisker growth
|
Lin, Chih-Kuang
|
|
2008
|
48 |
10 |
p. 1737-1740
4 p.
|
artikel
|
| 9 |
Electrothermal compact macromodel of monolithic switching voltage regulator MC34063A
|
Zarębski, Janusz
|
|
2008
|
48 |
10 |
p. 1703-1710
8 p.
|
artikel
|
| 10 |
FPGA-based switch-level fault emulation using module-based dynamic partial reconfiguration
|
Lee, Peter Ming-Han
|
|
2008
|
48 |
10 |
p. 1724-1733
10 p.
|
artikel
|
| 11 |
Fractal description of dendrite growth during electrochemical migration
|
Dominkovics, Csaba
|
|
2008
|
48 |
10 |
p. 1628-1634
7 p.
|
artikel
|
| 12 |
Heat dissipation effect of Al plate embedded substrate in network system
|
Cho, Seung Hyun
|
|
2008
|
48 |
10 |
p. 1696-1702
7 p.
|
artikel
|
| 13 |
High-temperature performance of AlGaN/GaN HFETs and MOSHFETs
|
Donoval, D.
|
|
2008
|
48 |
10 |
p. 1669-1672
4 p.
|
artikel
|
| 14 |
High temperature reliability of aluminium wire-bonds to thin film, thick film and low temperature co-fired ceramic (LTCC) substrate metallization
|
Johannessen, Rolf
|
|
2008
|
48 |
10 |
p. 1711-1719
9 p.
|
artikel
|
| 15 |
Inside front cover - Editorial board
|
|
|
2008
|
48 |
10 |
p. IFC-
1 p.
|
artikel
|
| 16 |
Investigation of diode geometry and metal line pattern for robust ESD protection applications
|
Li, You
|
|
2008
|
48 |
10 |
p. 1660-1663
4 p.
|
artikel
|
| 17 |
Key reliability concerns with lead-free connectors
|
Shibutani, Tadahiro
|
|
2008
|
48 |
10 |
p. 1613-1627
15 p.
|
artikel
|
| 18 |
Leakage currents and dielectric breakdown of Si1−x−y Ge x C y thermal oxides
|
Cuadras, A.
|
|
2008
|
48 |
10 |
p. 1635-1640
6 p.
|
artikel
|
| 19 |
Negative bias temperature instability (NBTI) recovery with bake
|
Katsetos, Anastasios A.
|
|
2008
|
48 |
10 |
p. 1655-1659
5 p.
|
artikel
|
| 20 |
[No title]
|
Stojcev, Mile
|
|
2008
|
48 |
10 |
p. 1744-1745
2 p.
|
artikel
|
| 21 |
[No title]
|
Stojcev, Mile
|
|
2008
|
48 |
10 |
p. 1742-1743
2 p.
|
artikel
|
| 22 |
Saline soak tests to determine the short-term reliability of an in situ thin film resistance temperature detector
|
Post, Julian W.
|
|
2008
|
48 |
10 |
p. 1673-1682
10 p.
|
artikel
|
| 23 |
Tensile tests of micro anchors anodically bonded between Pyrex glass and aluminum thin film coated on silicon wafer
|
Hu, Yu-Qun
|
|
2008
|
48 |
10 |
p. 1720-1723
4 p.
|
artikel
|
| 24 |
Two-dimensional dopant profiling in semiconductor devices by electron holography and chemical etching delineation techniques with the same specimen
|
Shaislamov, Ulugbek
|
|
2008
|
48 |
10 |
p. 1734-1736
3 p.
|
artikel
|
Tijdschrift beschrijving