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                                       Details for article 19 of 24 found articles
 
 
  Negative bias temperature instability (NBTI) recovery with bake
 
 
Title: Negative bias temperature instability (NBTI) recovery with bake
Author: Katsetos, Anastasios A.
Appeared in: Microelectronics reliability
Paging: Volume 48 (2008) nr. 10 pages 5 p.
Year: 2008
Contents:
Publisher: Elsevier Ltd
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 19 of 24 found articles
 
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