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                             23 gevonden resultaten
nr titel auteur tijdschrift jaar jaarg. afl. pagina('s) type
1 A high-linear wide-tunable CMOS transconductor for video frequency applications Calvo, Belén
2004
44 7 p. 1189-1198
10 p.
artikel
2 Analytical investigation of dead space effect under near-breakdown conditions in GaInP/GaAs composite double heterojunction bipolar transistors Goh, Y.L
2004
44 7 p. 1199-1202
4 p.
artikel
3 A two-dimensional analytical subthreshold behavior model for short-channel AlGaAs/GaAs HFETs Chiang, T.K
2004
44 7 p. 1093-1099
7 p.
artikel
4 Cycling copper flip chip interconnects Roesch, William J
2004
44 7 p. 1047-1054
8 p.
artikel
5 Degradation of AlGaN/GaN HEMTs under elevated temperature lifetesting Chou, Y.C
2004
44 7 p. 1033-1038
6 p.
artikel
6 Design strategy of localized halo profile for achieving sub-50 nm bulk MOSFET Shih, Chun-Hsing
2004
44 7 p. 1069-1075
7 p.
artikel
7 High-resolution transmission electron microscopy on aged InP HBTs Paine, Bruce M
2004
44 7 p. 1055-1060
6 p.
artikel
8 Impact life prediction modeling of TFBGA packages under board level drop test Tee, Tong Yan
2004
44 7 p. 1131-1142
12 p.
artikel
9 Impact of device geometry and doping strategy on linearity and RF performance in Si/SiGe MODFETs Yang, L
2004
44 7 p. 1101-1107
7 p.
artikel
10 Lifetime acceleration model for HAST tests of a pHEMT process Ersland, Peter
2004
44 7 p. 1039-1045
7 p.
artikel
11 Long-term reliability of Ti–Pt–Au metallization system for Schottky contact and first-level metallization on SiC MESFET Sozza, A
2004
44 7 p. 1109-1113
5 p.
artikel
12 Low frequency noise as a tool to study optocouplers with phototransistors Jevtić, Milan M
2004
44 7 p. 1123-1129
7 p.
artikel
13 Low frequency noise characterization in 0.13 μm p-MOSFETs. Impact of scaled-down 0.25, 0.18 and 0.13 μm technologies on 1/f noise Marin, M.
2004
44 7 p. 1077-1085
9 p.
artikel
14 Memory architecture exploration for programmable embedded systems; Peter Grun, Nikil Dutt, Alexandru Nicolau. Kluwer Academic Publishers, Boston. 2003. Hardcover, pp. 128, plus XVII, 116 euro. ISBN 1-4020-7324-0. Stojcev, Mile
2004
44 7 p. 1205-1206
2 p.
artikel
15 Networks on Chip; Axel Jantsch, Hannu Tenhunen (Eds.). Kluwer Academic Publishers, Boston; 2003. Hardcover, pp. 303, plus VIII, euro 117. ISBN 1-4020-7392-5 Stojcev, Mile
2004
44 7 p. 1203-1204
2 p.
artikel
16 [No title] Ersland, Peter
2004
44 7 p. 1031-
1 p.
artikel
17 Reliability enhancement of electronic packages by design of optimal parameters Batra, Ashish
2004
44 7 p. 1157-1163
7 p.
artikel
18 Role of carrier depletion effects and material properties in advanced microscale thermal modeling of N-GaInP–Si/p-GaAs–C heterojunction bipolar transistor (HBT) devices Madra, Satbir S
2004
44 7 p. 1061-1068
8 p.
artikel
19 Staggered heat sinks with aerodynamic cooling fins Leon, Octavio A
2004
44 7 p. 1181-1187
7 p.
artikel
20 2-Step algorithm for automatic alignment in wafer dicing process Kim, Hyong Tae
2004
44 7 p. 1165-1179
15 p.
artikel
21 Study of swing potential on deep submicron on-chip interconnect Ma, Qungang
2004
44 7 p. 1087-1091
5 p.
artikel
22 Temperature influence on energy losses in MOSFET capacitors Gołda, A
2004
44 7 p. 1115-1121
7 p.
artikel
23 Vibration fatigue experiments of SMT solder joint Wang, Hongfang
2004
44 7 p. 1143-1156
14 p.
artikel
                             23 gevonden resultaten
 
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