nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
A high-linear wide-tunable CMOS transconductor for video frequency applications
|
Calvo, Belén |
|
2004 |
44 |
7 |
p. 1189-1198 10 p. |
artikel |
2 |
Analytical investigation of dead space effect under near-breakdown conditions in GaInP/GaAs composite double heterojunction bipolar transistors
|
Goh, Y.L |
|
2004 |
44 |
7 |
p. 1199-1202 4 p. |
artikel |
3 |
A two-dimensional analytical subthreshold behavior model for short-channel AlGaAs/GaAs HFETs
|
Chiang, T.K |
|
2004 |
44 |
7 |
p. 1093-1099 7 p. |
artikel |
4 |
Cycling copper flip chip interconnects
|
Roesch, William J |
|
2004 |
44 |
7 |
p. 1047-1054 8 p. |
artikel |
5 |
Degradation of AlGaN/GaN HEMTs under elevated temperature lifetesting
|
Chou, Y.C |
|
2004 |
44 |
7 |
p. 1033-1038 6 p. |
artikel |
6 |
Design strategy of localized halo profile for achieving sub-50 nm bulk MOSFET
|
Shih, Chun-Hsing |
|
2004 |
44 |
7 |
p. 1069-1075 7 p. |
artikel |
7 |
High-resolution transmission electron microscopy on aged InP HBTs
|
Paine, Bruce M |
|
2004 |
44 |
7 |
p. 1055-1060 6 p. |
artikel |
8 |
Impact life prediction modeling of TFBGA packages under board level drop test
|
Tee, Tong Yan |
|
2004 |
44 |
7 |
p. 1131-1142 12 p. |
artikel |
9 |
Impact of device geometry and doping strategy on linearity and RF performance in Si/SiGe MODFETs
|
Yang, L |
|
2004 |
44 |
7 |
p. 1101-1107 7 p. |
artikel |
10 |
Lifetime acceleration model for HAST tests of a pHEMT process
|
Ersland, Peter |
|
2004 |
44 |
7 |
p. 1039-1045 7 p. |
artikel |
11 |
Long-term reliability of Ti–Pt–Au metallization system for Schottky contact and first-level metallization on SiC MESFET
|
Sozza, A |
|
2004 |
44 |
7 |
p. 1109-1113 5 p. |
artikel |
12 |
Low frequency noise as a tool to study optocouplers with phototransistors
|
Jevtić, Milan M |
|
2004 |
44 |
7 |
p. 1123-1129 7 p. |
artikel |
13 |
Low frequency noise characterization in 0.13 μm p-MOSFETs. Impact of scaled-down 0.25, 0.18 and 0.13 μm technologies on 1/f noise
|
Marin, M. |
|
2004 |
44 |
7 |
p. 1077-1085 9 p. |
artikel |
14 |
Memory architecture exploration for programmable embedded systems; Peter Grun, Nikil Dutt, Alexandru Nicolau. Kluwer Academic Publishers, Boston. 2003. Hardcover, pp. 128, plus XVII, 116 euro. ISBN 1-4020-7324-0.
|
Stojcev, Mile |
|
2004 |
44 |
7 |
p. 1205-1206 2 p. |
artikel |
15 |
Networks on Chip; Axel Jantsch, Hannu Tenhunen (Eds.). Kluwer Academic Publishers, Boston; 2003. Hardcover, pp. 303, plus VIII, euro 117. ISBN 1-4020-7392-5
|
Stojcev, Mile |
|
2004 |
44 |
7 |
p. 1203-1204 2 p. |
artikel |
16 |
[No title]
|
Ersland, Peter |
|
2004 |
44 |
7 |
p. 1031- 1 p. |
artikel |
17 |
Reliability enhancement of electronic packages by design of optimal parameters
|
Batra, Ashish |
|
2004 |
44 |
7 |
p. 1157-1163 7 p. |
artikel |
18 |
Role of carrier depletion effects and material properties in advanced microscale thermal modeling of N-GaInP–Si/p-GaAs–C heterojunction bipolar transistor (HBT) devices
|
Madra, Satbir S |
|
2004 |
44 |
7 |
p. 1061-1068 8 p. |
artikel |
19 |
Staggered heat sinks with aerodynamic cooling fins
|
Leon, Octavio A |
|
2004 |
44 |
7 |
p. 1181-1187 7 p. |
artikel |
20 |
2-Step algorithm for automatic alignment in wafer dicing process
|
Kim, Hyong Tae |
|
2004 |
44 |
7 |
p. 1165-1179 15 p. |
artikel |
21 |
Study of swing potential on deep submicron on-chip interconnect
|
Ma, Qungang |
|
2004 |
44 |
7 |
p. 1087-1091 5 p. |
artikel |
22 |
Temperature influence on energy losses in MOSFET capacitors
|
Gołda, A |
|
2004 |
44 |
7 |
p. 1115-1121 7 p. |
artikel |
23 |
Vibration fatigue experiments of SMT solder joint
|
Wang, Hongfang |
|
2004 |
44 |
7 |
p. 1143-1156 14 p. |
artikel |