| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
A case study of IC storage failures in Taipei trains
|
Zhang, Y
|
|
1998
|
38 |
12 |
p. 1811-1816
6 p.
|
artikel
|
| 2 |
Analysis method of pooled data for accelerated life testing
|
Seki, T.
|
|
1998
|
38 |
12 |
p. 1931-1934
4 p.
|
artikel
|
| 3 |
A new method for extracting the effective channel length of MOSFETs
|
Ortiz-Conde, A.
|
|
1998
|
38 |
12 |
p. 1867-1870
4 p.
|
artikel
|
| 4 |
Application of a ‘surrogate’ layer for lower bending stress in a vulnerable material of a tri-material body
|
Suhir, E.
|
|
1998
|
38 |
12 |
p. 1949-1954
6 p.
|
artikel
|
| 5 |
Application of 1/f noise measurements to the characterization of near-interface oxide traps in ULSI n-MOSFETs
|
Villa, S.
|
|
1998
|
38 |
12 |
p. 1919-1923
5 p.
|
artikel
|
| 6 |
Book review
|
|
|
1998
|
38 |
12 |
p. 1977-
1 p.
|
artikel
|
| 7 |
Book review
|
|
|
1998
|
38 |
12 |
p. 1975-1976
2 p.
|
artikel
|
| 8 |
Cut off frequency and transit time analysis of lightly doped drain (LDD) MOSFETs
|
Thomas, Ciby
|
|
1998
|
38 |
12 |
p. 1955-1961
7 p.
|
artikel
|
| 9 |
Degradation of AlGaAs/GaAs HBTs induced by hot carriers
|
Song, Chung-Kun
|
|
1998
|
38 |
12 |
p. 1907-1912
6 p.
|
artikel
|
| 10 |
Design rule related defects formation
|
Hsieh, Y.F.
|
|
1998
|
38 |
12 |
p. 1871-1880
10 p.
|
artikel
|
| 11 |
Finite element analysis for solder ball failures in chip scale package
|
Lee, Taekoo
|
|
1998
|
38 |
12 |
p. 1941-1947
7 p.
|
artikel
|
| 12 |
Hydrostatic high pressure studies of polymer thick-film resistors
|
Dziedzic, Andrzej
|
|
1998
|
38 |
12 |
p. 1893-1898
6 p.
|
artikel
|
| 13 |
Index
|
|
|
1998
|
38 |
12 |
p. 1993-1996
4 p.
|
artikel
|
| 14 |
Laser-based electro-optic testing of multichip module structures
|
Mechtel, D.M.
|
|
1998
|
38 |
12 |
p. 1847-1853
7 p.
|
artikel
|
| 15 |
Low temperature delamination of plastic encapsulated microcircuits
|
McCluskey, P
|
|
1998
|
38 |
12 |
p. 1829-1834
6 p.
|
artikel
|
| 16 |
Microchannel gate temperature analysis
|
Kim, Q.
|
|
1998
|
38 |
12 |
p. 1823-1827
5 p.
|
artikel
|
| 17 |
Multi-function protective relay on FPGA
|
Manzoul, M.A.
|
|
1998
|
38 |
12 |
p. 1963-1968
6 p.
|
artikel
|
| 18 |
New positive charge trapping dynamics in SiO2 gate oxide, based on bulk impact ionization processes under Fowler–Nordheim stress
|
Samanta, Piyas
|
|
1998
|
38 |
12 |
p. 1969-1973
5 p.
|
artikel
|
| 19 |
On the determination of the time-dependent degradation laws and device lifetime in deep submicron n- and p- channel SOI MOSFETs
|
Renn, S.-H
|
|
1998
|
38 |
12 |
p. 1817-1822
6 p.
|
artikel
|
| 20 |
Power rectifier model including self heating effects
|
Strollo, Antonio G.M.
|
|
1998
|
38 |
12 |
p. 1899-1906
8 p.
|
artikel
|
| 21 |
Rapid IC performance yield and distribution prediction using a rotation of the circuit parameter principals components
|
Horan, John
|
|
1998
|
38 |
12 |
p. 1913-1918
6 p.
|
artikel
|
| 22 |
Studies on the heat removal features of stacked SOI structures with a dedicated field solver program (SUNRED)
|
Kohári, Zs
|
|
1998
|
38 |
12 |
p. 1881-1891
11 p.
|
artikel
|
| 23 |
The effects of duty cycle and voltage swing of gate pulse on the AC-stress-induced degradation of nMOSFETs with N2O gate oxides
|
Zeng, X
|
|
1998
|
38 |
12 |
p. 1925-1929
5 p.
|
artikel
|
| 24 |
The effects of process induced gate-to-source/drain junction separation in MOSFET structures
|
Rowlands, David
|
|
1998
|
38 |
12 |
p. 1855-1866
12 p.
|
artikel
|
| 25 |
The effects of SiO2 barrier between active layer and substrate on the performance and reliability of polycrystalline silicon thin film transistors
|
Wang, Y.Z
|
|
1998
|
38 |
12 |
p. 1835-1846
12 p.
|
artikel
|
| 26 |
Total dose effects on power-MOSFET switching converters
|
Pizano, J.E
|
|
1998
|
38 |
12 |
p. 1935-1939
5 p.
|
artikel
|
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