nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
A low-frequency noise study of hot-carrier stressing effects in submicron Si p-MOSFETs
|
Vasina, P |
|
1998 |
38 |
1 |
p. 23-27 5 p. |
artikel |
2 |
A study of the influence of inter-metal dielectrics on electromigration performance
|
Foley, Sean |
|
1998 |
38 |
1 |
p. 107-113 7 p. |
artikel |
3 |
Change in d.c. and 1/f noise characteristics of n-submicron MOSFETs due to hot-carrier degradation
|
Vandamme, L.K.J. |
|
1998 |
38 |
1 |
p. 29-35 7 p. |
artikel |
4 |
Component level ESD testing
|
Verhaege, Koen |
|
1998 |
38 |
1 |
p. 115-128 14 p. |
artikel |
5 |
Degradation mechanism of GaAs MESFETs
|
Mun, Jae Kyoung |
|
1998 |
38 |
1 |
p. 171-178 8 p. |
artikel |
6 |
Dielectric Reliability Measurement Methods: A Review
|
Martin, Andreas |
|
1998 |
38 |
1 |
p. 37-72 36 p. |
artikel |
7 |
Editorial
|
|
|
1998 |
38 |
1 |
p. iii- 1 p. |
artikel |
8 |
Gate oxide leakage due to temperature accelerated degradation under plasma charging conditions
|
Brożek, Tomasz |
|
1998 |
38 |
1 |
p. 73-79 7 p. |
artikel |
9 |
Hot-carrier injections in SiO2
|
Vuillaume, D |
|
1998 |
38 |
1 |
p. 7-22 16 p. |
artikel |
10 |
Linewidth control effects on MOSFET ESD robustness
|
Voldman, S |
|
1998 |
38 |
1 |
p. 145-152 8 p. |
artikel |
11 |
Numerical analysis on determining the physical mechanisms contributing to the abnormal base current in post-burn-in AlGaAs/GaAs HBTs
|
Sheu, S |
|
1998 |
38 |
1 |
p. 163-170 8 p. |
artikel |
12 |
Reliability of III–V based heterojunction bipolar transistors
|
Christianson, K.A |
|
1998 |
38 |
1 |
p. 153-161 9 p. |
artikel |
13 |
Reliability phenomena under AC stress
|
Hu, Chenming |
|
1998 |
38 |
1 |
p. 1-5 5 p. |
artikel |
14 |
The influence of addition elements on the early resistance changes observed during electromigration testing of Al metal lines
|
De Ceuninck, W.A |
|
1998 |
38 |
1 |
p. 87-98 12 p. |
artikel |
15 |
The modeling of resistance changes in the early phase of electromigration
|
Mouthaan, Ton J |
|
1998 |
38 |
1 |
p. 99-105 7 p. |
artikel |
16 |
Ultrathin RTP oxynitride dielectrics on planar, trench and three dimensional structures
|
Nguyen, Son V. |
|
1998 |
38 |
1 |
p. 81-85 5 p. |
artikel |
17 |
Using charged device model testing to eliminate real-world ESD failures
|
Olney, Andrew H. |
|
1998 |
38 |
1 |
p. 129-143 15 p. |
artikel |