nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
A mechanism of threshold voltage changes for WN x gate GaAs MESFETs in high temperature storage life tests
|
Kitaura, Y. |
|
1995 |
35 |
12 |
p. 1515-1520 6 p. |
artikel |
2 |
A recursive algorithm evaluating the exact reliability of a consecutive κ-within-m-out-of-n:F system
|
Malinowski, Jacek |
|
1995 |
35 |
12 |
p. 1461-1465 5 p. |
artikel |
3 |
Diffusion approximations to the dependability of a transport system
|
Yadavalli, V.S.S. |
|
1995 |
35 |
12 |
p. 1495-1499 5 p. |
artikel |
4 |
Modeling latent and patent failures of electronic products
|
Yan, Li |
|
1995 |
35 |
12 |
p. 1501-1510 10 p. |
artikel |
5 |
On the reliability of a cold standby system attended by a single repairman
|
Vanderperre, E.J. |
|
1995 |
35 |
12 |
p. 1511-1513 3 p. |
artikel |
6 |
Optimal reliability allocation of redundant units and repair facilities by arbitrary failure and repair distributions
|
Gurov, Sergey V. |
|
1995 |
35 |
12 |
p. 1451-1460 10 p. |
artikel |
7 |
Reliability analysis method in the presence of fuzziness attached to operating time
|
Huang, H.-Z. |
|
1995 |
35 |
12 |
p. 1483-1487 5 p. |
artikel |
8 |
Reliability bounds and other inequalities for discrete life distributions
|
Sengupta, Debasis |
|
1995 |
35 |
12 |
p. 1473-1478 6 p. |
artikel |
9 |
Reliability of imperfect switching of cold stanby systems with multiple non-critical and critical errors
|
Chung, Who Kee |
|
1995 |
35 |
12 |
p. 1479-1482 4 p. |
artikel |
10 |
Stochastic analysis of a two-dissimilar unit warm standby redundant system with two types of repair facilities
|
Mokaddis, G.S. |
|
1995 |
35 |
12 |
p. 1467-1472 6 p. |
artikel |
11 |
Stochastic analysis of a two-unit cold standby system subject to maximum operation and repair time
|
Singh, S.K. |
|
1995 |
35 |
12 |
p. 1489-1493 5 p. |
artikel |