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                                       Details for article 9 of 11 found articles
 
 
  Reliability of imperfect switching of cold stanby systems with multiple non-critical and critical errors
 
 
Title: Reliability of imperfect switching of cold stanby systems with multiple non-critical and critical errors
Author: Chung, Who Kee
Appeared in: Microelectronics reliability
Paging: Volume 35 (1995) nr. 12 pages 4 p.
Year: 1995
Contents:
Publisher: Published by Elsevier B.V.
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 9 of 11 found articles
 
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 Koninklijke Bibliotheek - National Library of the Netherlands