| no |
title |
author |
magazine |
year |
volume |
issue |
page(s) |
type |
| 1 |
A mechanism of threshold voltage changes for WN x gate GaAs MESFETs in high temperature storage life tests
|
Kitaura, Y.
|
|
1995
|
35 |
12 |
p. 1515-1520
6 p.
|
article
|
| 2 |
A recursive algorithm evaluating the exact reliability of a consecutive κ-within-m-out-of-n:F system
|
Malinowski, Jacek
|
|
1995
|
35 |
12 |
p. 1461-1465
5 p.
|
article
|
| 3 |
Diffusion approximations to the dependability of a transport system
|
Yadavalli, V.S.S.
|
|
1995
|
35 |
12 |
p. 1495-1499
5 p.
|
article
|
| 4 |
Modeling latent and patent failures of electronic products
|
Yan, Li
|
|
1995
|
35 |
12 |
p. 1501-1510
10 p.
|
article
|
| 5 |
On the reliability of a cold standby system attended by a single repairman
|
Vanderperre, E.J.
|
|
1995
|
35 |
12 |
p. 1511-1513
3 p.
|
article
|
| 6 |
Optimal reliability allocation of redundant units and repair facilities by arbitrary failure and repair distributions
|
Gurov, Sergey V.
|
|
1995
|
35 |
12 |
p. 1451-1460
10 p.
|
article
|
| 7 |
Reliability analysis method in the presence of fuzziness attached to operating time
|
Huang, H.-Z.
|
|
1995
|
35 |
12 |
p. 1483-1487
5 p.
|
article
|
| 8 |
Reliability bounds and other inequalities for discrete life distributions
|
Sengupta, Debasis
|
|
1995
|
35 |
12 |
p. 1473-1478
6 p.
|
article
|
| 9 |
Reliability of imperfect switching of cold stanby systems with multiple non-critical and critical errors
|
Chung, Who Kee
|
|
1995
|
35 |
12 |
p. 1479-1482
4 p.
|
article
|
| 10 |
Stochastic analysis of a two-dissimilar unit warm standby redundant system with two types of repair facilities
|
Mokaddis, G.S.
|
|
1995
|
35 |
12 |
p. 1467-1472
6 p.
|
article
|
| 11 |
Stochastic analysis of a two-unit cold standby system subject to maximum operation and repair time
|
Singh, S.K.
|
|
1995
|
35 |
12 |
p. 1489-1493
5 p.
|
article
|
Journal description