Digitale Bibliotheek
Sluiten Bladeren door artikelen uit een tijdschrift
     Tijdschrift beschrijving
       Alle jaargangen van het bijbehorende tijdschrift
         Alle afleveringen van het bijbehorende jaargang
                                       Alle artikelen van de bijbehorende aflevering
 
                             139 gevonden resultaten
nr titel auteur tijdschrift jaar jaarg. afl. pagina('s) type
1 A Bayes procedure for estimation of current system reliability 1994
34 8 p. 1414-
1 p.
artikel
2 A class of efficient tests for increasing-failure-rate-average distribution under random censoring 1994
34 8 p. 1417-
1 p.
artikel
3 A consecutive k-out-of-n reliability system in random environment Råde, Lennart
1994
34 8 p. 1311-1318
8 p.
artikel
4 Adaptive fuzzy systems 1994
34 8 p. 1416-
1 p.
artikel
5 A discrete Bayes explanation of a failure-rate paradox 1994
34 8 p. 1416-
1 p.
artikel
6 Advanced “contact engineering” for submicron VLSI multilevel metallization 1994
34 8 p. 1422-
1 p.
artikel
7 Advances in capacitor designs keep pace with trends in portable equipment 1994
34 8 p. 1413-
1 p.
artikel
8 A failure-repair model with minimal and major maintenance 1994
34 8 p. 1414-1415
2 p.
artikel
9 A high-density and low-power charge-based Hamming network 1994
34 8 p. 1419-
1 p.
artikel
10 A high-speed two's complement multiplier using differential split-level CMOS 1994
34 8 p. 1427-
1 p.
artikel
11 A layout-driven yield predictor and fault generator for VLSI 1994
34 8 p. 1421-1422
2 p.
artikel
12 A model for the integrity assessment of ageing repairable systems 1994
34 8 p. 1415-
1 p.
artikel
13 A Monte Carlo approach for power estimation 1994
34 8 p. 1426-
1 p.
artikel
14 A multichip packaged GaAs 16 × 16 parallel multiplier 1994
34 8 p. 1427-
1 p.
artikel
15 An AI constraint network-based approach to bed-of-nails DFT for digital circuit design 1994
34 8 p. 1421-
1 p.
artikel
16 An alternate and simpler method for finding the field-dependent defect density of SiO2 films using MOS capacitor devices Bhan, R.K.
1994
34 8 p. 1361-1364
4 p.
artikel
17 Analysis of drain breakdown voltage in enhancement-mode SOI MOSFETs 1994
34 8 p. 1429-
1 p.
artikel
18 A neural implementation of complex activation functions for digital VLSI neural networks 1994
34 8 p. 1427-
1 p.
artikel
19 A new type of fiber optic connector designed for military optical backplanes 1994
34 8 p. 1410-
1 p.
artikel
20 An experimental procedure for measuring silicon lattice heating due to hot carriers in MOSFETs 1994
34 8 p. 1428-
1 p.
artikel
21 An expert process planning system for electronics PCB assembly 1994
34 8 p. 1423-1424
2 p.
artikel
22 Annealing behaviour of hole traps in irradiated gate oxides 1994
34 8 p. 1427-
1 p.
artikel
23 An O (k · n)-time algorithm for computing the reliability of a circular consecutive-k-out-of-n:F system 1994
34 8 p. 1416-
1 p.
artikel
24 An O (n · log(n)) algorithm to compute the all-terminal reliability of (K5, K2,2,2 ) free networks 1994
34 8 p. 1414-
1 p.
artikel
25 Are components still the major problem: a review of electronic system and device field failure returns 1994
34 8 p. 1409-
1 p.
artikel
26 A reliability and cost analysis of an automatic prototype generator test paradigm 1994
34 8 p. 1417-
1 p.
artikel
27 A review of modern power semiconductor devices 1994
34 8 p. 1411-1412
2 p.
artikel
28 A sequential test to control up and down times when their distributions are gamma Jain, Sudha
1994
34 8 p. 1375-1376
2 p.
artikel
29 A statistical method for obtaining the factors in electronic-component reliability-prediction models 1994
34 8 p. 1412-
1 p.
artikel
30 A study of failures identified during board level environmental stress testing 1994
34 8 p. 1422-
1 p.
artikel
31 A two-unit system with allowed down time and random check of standby Gupta, Rakesh
1994
34 8 p. 1381-1385
5 p.
artikel
32 Automated malfunction diagnosis of semiconductor fabrication equipment: a plasma etch application 1994
34 8 p. 1421-
1 p.
artikel
33 Automated wafer level QBD measurement for production control 1994
34 8 p. 1422-
1 p.
artikel
34 Automatic assembly equipment gains capabilities, improves performance 1994
34 8 p. 1426-
1 p.
artikel
35 b and its temperature dependence are the important criteria of the reliability of semiconductor lasers Jiawei, Shi
1994
34 8 p. 1405-1408
4 p.
artikel
36 Basic hybrid IC technology must adapt to dense mounting 1994
34 8 p. 1429-
1 p.
artikel
37 Bayes computation for life testing and reliability estimation 1994
34 8 p. 1419-
1 p.
artikel
38 Bayes parameter estimation for the bivariate Weibull model of Marshall-Olkin for censored data 1994
34 8 p. 1417-
1 p.
artikel
39 Boundary walking test: an accelerated scan method for greater system reliability 1994
34 8 p. 1411-
1 p.
artikel
40 Bounds for reliability of consecutive k-within-m-out-of-n:F systems 1994
34 8 p. 1414-
1 p.
artikel
41 CBS-CAD: a CAD process management system 1994
34 8 p. 1420-
1 p.
artikel
42 Chi-square tests-of-fit for location-scale families using type-II censored data 1994
34 8 p. 1414-
1 p.
artikel
43 Co-implantation of Mg and Si in GaAs MESFETs 1994
34 8 p. 1429-1430
2 p.
artikel
44 Computational and experimental environments for fuzzy logic and control 1994
34 8 p. 1419-
1 p.
artikel
45 Computationally-efficient phased-mission reliability analysis for systems with variable configurations 1994
34 8 p. 1420-
1 p.
artikel
46 Conduction mechanisms in contaminant layers on printed circuit boards 1994
34 8 p. 1413-
1 p.
artikel
47 Confidence limits for steady state availability of systems Chandrasekhar, P.
1994
34 8 p. 1365-1367
3 p.
artikel
48 Constitutive relations for tin-based solder joints 1994
34 8 p. 1412-
1 p.
artikel
49 Coprocessor design for multilayer surface-mounted PCB routing 1994
34 8 p. 1425-1426
2 p.
artikel
50 Cost-benefit analysis of a two-unit standby system with a proviso of repair-machine failure Gupta, Rakesh
1994
34 8 p. 1391-1394
4 p.
artikel
51 Curiosities in choosing system components: a Bayes analysis 1994
34 8 p. 1411-
1 p.
artikel
52 Demand grows for industrial-use semiconductor lasers 1994
34 8 p. 1430-
1 p.
artikel
53 Design of precision capacitors for analog applications 1994
34 8 p. 1410-
1 p.
artikel
54 Development proceeds on chip fixed inductors, their applications 1994
34 8 p. 1413-
1 p.
artikel
55 Dielectric degradation of Pt/SiO2/Si structures during thermal annealing 1994
34 8 p. 1428-
1 p.
artikel
56 DIGamber: a digital design and diagnostic tool in expert system environment 1994
34 8 p. 1426-
1 p.
artikel
57 Direct chip interconnect with adhesive conductor films 1994
34 8 p. 1423-
1 p.
artikel
58 Discrete surface mount products for power applications 1994
34 8 p. 1423-
1 p.
artikel
59 Efficient algorithm for reliability of a circular consecutive-k-out-of-n F system 1994
34 8 p. 1414-
1 p.
artikel
60 Ellipsometric measurements of surface roughness of silicon wafers 1994
34 8 p. 1429-
1 p.
artikel
61 Estimating defects in commercial software during operational use 1994
34 8 p. 1415-
1 p.
artikel
62 Estimation methods for the mean of the exponential distribution based on grouped and censored data 1994
34 8 p. 1416-
1 p.
artikel
63 Evaluating layout area tradeoffs for high level applications 1994
34 8 p. 1416-1417
2 p.
artikel
64 Evaluating the performance of software-reliability models 1994
34 8 p. 1418-
1 p.
artikel
65 Experimental and analytical studies of encapsulated flip chip solder bumps on surface laminar circuit boards 1994
34 8 p. 1410-
1 p.
artikel
66 Failure mechanism models for Ductile fracture 1994
34 8 p. 1413-1414
2 p.
artikel
67 Fast enumeration of every path in a reliability graph using subgraphs Aziz, M.A.
1994
34 8 p. 1395-1396
2 p.
artikel
68 Feature-scale simulation of resist-patterned electrode-position 1994
34 8 p. 1424-
1 p.
artikel
69 Finding nonfaulty subtrees in faulty binary tree architectures Mittal, Ravi
1994
34 8 p. 1301-1310
10 p.
artikel
70 Finite range survival model Siddiqui, S.A.
1994
34 8 p. 1377-1380
4 p.
artikel
71 Fixed resistors serve to reduce equipment size 1994
34 8 p. 1410-
1 p.
artikel
72 Functional flexibility keeps ASICs in demand 1994
34 8 p. 1419-
1 p.
artikel
73 Gaussian parametric failure-rate model with application to Quartz-Crystal device aging 1994
34 8 p. 1412-
1 p.
artikel
74 Gigabit age microelectronics and their manufacture 1994
34 8 p. 1420-
1 p.
artikel
75 Gold-to-aluminum bonding for TAB applications 1994
34 8 p. 1424-
1 p.
artikel
76 Goodness-of-fit tests for the power-law process based on the TTT-plot 1994
34 8 p. 1418-
1 p.
artikel
77 Graphical techniques for analyzing failure data with the percentile residual-life function 1994
34 8 p. 1415-
1 p.
artikel
78 Grown-in-deep-level defects in vapour phase epitaxial GaAs 1 − x P x 1994
34 8 p. 1428-
1 p.
artikel
79 HIC application technologies enhance high density mounting in printed circuit boards 1994
34 8 p. 1425-
1 p.
artikel
80 HIMOS: an attractive flash EEPROM cell for embedded memory applications 1994
34 8 p. 1411-
1 p.
artikel
81 Increased reliability of drypumps due to process related adaptation and prefailure warning 1994
34 8 p. 1412-1413
2 p.
artikel
82 Independent control of ion density and ion bombardment energy in a dual RF excitation plasma 1994
34 8 p. 1430-
1 p.
artikel
83 In situ measurement of wafer temperatures in a low pressure chemical vapor deposition furnace 1994
34 8 p. 1428-1429
2 p.
artikel
84 Is boundary scan short on fault coverage? 1994
34 8 p. 1410-
1 p.
artikel
85 Low moisture polymer adhesive for hermetic packages 1994
34 8 p. 1426-1427
2 p.
artikel
86 Majority carrier mobility in ultra heavily doped n-type Si in the presence of defects and dislocations 1994
34 8 p. 1429-
1 p.
artikel
87 Mechanical design failure models for buckling 1994
34 8 p. 1409-
1 p.
artikel
88 Mixing 3-V and 5-V ICs 1994
34 8 p. 1427-
1 p.
artikel
89 Modelling, optimization and control of spatial uniformity in manufacturing processes 1994
34 8 p. 1420-1421
2 p.
artikel
90 Nonparametric estimation of mean time to failure with unknown stochastic censoring Schäbe, Hendrik
1994
34 8 p. 1291-1299
9 p.
artikel
91 On a general imperfect debugging software reliability growth model Kapur, P.K.
1994
34 8 p. 1397-1403
7 p.
artikel
92 On the interval reliability of systems modelled by finite semi-Markov processes Csenki, A.
1994
34 8 p. 1319-1335
17 p.
artikel
93 On the optimal design of k-out-of-n:G subsystems 1994
34 8 p. 1418-1419
2 p.
artikel
94 Optimal apportionment of reliability and redundancy in series systems under multiple objectives 1994
34 8 p. 1417-
1 p.
artikel
95 Optimal design of parallel-series systems with competing failure modes 1994
34 8 p. 1416-
1 p.
artikel
96 Optimal properties of the Laplace trend test for soft-ware-reliability models 1994
34 8 p. 1416-
1 p.
artikel
97 Optimization of process parameters for laser soldering of surface mounted devices 1994
34 8 p. 1430-
1 p.
artikel
98 Optimizing force and geometry parameters in design of reduced insertion force connectors 1994
34 8 p. 1411-
1 p.
artikel
99 Optimum design of sampling plans in electronic industry Sultan, Torky I.
1994
34 8 p. 1369-1373
5 p.
artikel
100 Packaging of high-density fiber/laser modules using passive alignment techniques 1994
34 8 p. 1430-
1 p.
artikel
101 Percentiles of pivotal ratios for the MLE of the parameters of a Weibull regression model 1994
34 8 p. 1414-
1 p.
artikel
102 Performance testing of cellular modems 1994
34 8 p. 1426-
1 p.
artikel
103 Portable, cordless phone requirements give rise to chip monolithic microfilters 1994
34 8 p. 1411-
1 p.
artikel
104 Positron annihilation spectroscopy of vacancy-related defects in semiconductors 1994
34 8 p. 1429-
1 p.
artikel
105 Power semiconductor devices for the 1990s 1994
34 8 p. 1410-1411
2 p.
artikel
106 Precision flip-chip solder bump interconnects for optical packaging 1994
34 8 p. 1424-1425
2 p.
artikel
107 Predicting performability of a fault-tolerant microcomputer for process control 1994
34 8 p. 1418-
1 p.
artikel
108 Profit analysis of a system with two-units having guarantee periods and delayed operation of standby Gupta, Rakesh
1994
34 8 p. 1387-1390
4 p.
artikel
109 Recursive estimation of time-dependent reliability Singh, N.
1994
34 8 p. 1355-1359
5 p.
artikel
110 Reliability analysis of a cold standby system with multiple critical errors Chung, Who Kee
1994
34 8 p. 1343-1347
5 p.
artikel
111 Reliability and availability analysis of a k-out-of-N:G redundant system with repair in the presence of chance of multiple critical errors Chung, Who Kee
1994
34 8 p. 1337-1341
5 p.
artikel
112 Reliability assessment of high lead count TAB package 1994
34 8 p. 1422-1423
2 p.
artikel
113 Reliability modeling of soldered interconnections 1994
34 8 p. 1412-
1 p.
artikel
114 Review. A survey of the present status of vacuum microelectronics 1994
34 8 p. 1419-1420
2 p.
artikel
115 Rework of multi-chip modules: device removal 1994
34 8 p. 1410-
1 p.
artikel
116 Selecting the most reliable design under Type-II censored accelerated testing 1994
34 8 p. 1418-
1 p.
artikel
117 Short-pulse propagation technique for characterizing resistive package interconnections 1994
34 8 p. 1413-
1 p.
artikel
118 Shrunken estimators of Weibull shape parameter from Type-II censored samples 1994
34 8 p. 1418-
1 p.
artikel
119 SIGMA: a VLSI systolic array implementation of a Galois Field [ GF(2)m)] based multiplication and division algorithm 1994
34 8 p. 1419-
1 p.
artikel
120 Silver-induced volatile species generation from conductive die attach adhesives 1994
34 8 p. 1424-
1 p.
artikel
121 Software-reliability growth with a Weibull test-effort: a model and application 1994
34 8 p. 1415-
1 p.
artikel
122 Spin coating over topography 1994
34 8 p. 1422-
1 p.
artikel
123 Standards encourage use of ultra-mini connectors for IC cards 1994
34 8 p. 1413-
1 p.
artikel
124 Statistical analysis of the geometric de-eutrophication software-reliability model 1994
34 8 p. 1418-
1 p.
artikel
125 Systematic design of phase-shifting masks with extended depth of focus and/or shifted focus plane 1994
34 8 p. 1421-
1 p.
artikel
126 The effect of fan-reliability and cooling-performance on electronic-chassis reliability 1994
34 8 p. 1421-
1 p.
artikel
127 The effect on the non-uniform doping profile on I–V characteristics of a MOSFET 1994
34 8 p. 1429-
1 p.
artikel
128 The inventory replenishment problem with a linear trend in demand 1994
34 8 p. 1409-
1 p.
artikel
129 The Panther range of test synthesis products 1994
34 8 p. 1427-
1 p.
artikel
130 The transition from a two-dimensional to a zero-dimensional electron system on silicon 1994
34 8 p. 1428-
1 p.
artikel
131 Thin QFP—the next generation high pincount surface mount challenge 1994
34 8 p. 1425-
1 p.
artikel
132 Toward high-level synthesis for ASIC design 1994
34 8 p. 1424-
1 p.
artikel
133 Transient behaviour and parametric sensitivity in failure prone systems 1994
34 8 p. 1415-
1 p.
artikel
134 Two new replacement policies 1994
34 8 p. 1409-
1 p.
artikel
135 Two unit redundant system with adjustable failure rate, critical human error (CHE) and inspection Agnihotri, R.K.
1994
34 8 p. 1349-1354
6 p.
artikel
136 Ultra-miniature chip inductors for communications equipment down-sizing requirements 1994
34 8 p. 1410-
1 p.
artikel
137 Use of cooperating expert systems for real-time fault detection and correction in a manufacturing cell 1994
34 8 p. 1423-
1 p.
artikel
138 Water soluble paste survey for fine pitch SMT attach 1994
34 8 p. 1425-
1 p.
artikel
139 Wire bonding—toward 6-σ yield and fine pitch 1994
34 8 p. 1425-
1 p.
artikel
                             139 gevonden resultaten
 
 Koninklijke Bibliotheek - Nationale Bibliotheek van Nederland