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                             139 results found
no title author magazine year volume issue page(s) type
1 A Bayes procedure for estimation of current system reliability 1994
 34 8 p. 1414-
1 p.
 article
2 A class of efficient tests for increasing-failure-rate-average distribution under random censoring 1994
 34 8 p. 1417-
1 p.
 article
3 A consecutive k-out-of-n reliability system in random environment Råde, Lennart
 1994
 34 8 p. 1311-1318
8 p.
 article
4 Adaptive fuzzy systems 1994
 34 8 p. 1416-
1 p.
 article
5 A discrete Bayes explanation of a failure-rate paradox 1994
 34 8 p. 1416-
1 p.
 article
6 Advanced “contact engineering” for submicron VLSI multilevel metallization 1994
 34 8 p. 1422-
1 p.
 article
7 Advances in capacitor designs keep pace with trends in portable equipment 1994
 34 8 p. 1413-
1 p.
 article
8 A failure-repair model with minimal and major maintenance 1994
 34 8 p. 1414-1415
2 p.
 article
9 A high-density and low-power charge-based Hamming network 1994
 34 8 p. 1419-
1 p.
 article
10 A high-speed two's complement multiplier using differential split-level CMOS 1994
 34 8 p. 1427-
1 p.
 article
11 A layout-driven yield predictor and fault generator for VLSI 1994
 34 8 p. 1421-1422
2 p.
 article
12 A model for the integrity assessment of ageing repairable systems 1994
 34 8 p. 1415-
1 p.
 article
13 A Monte Carlo approach for power estimation 1994
 34 8 p. 1426-
1 p.
 article
14 A multichip packaged GaAs 16 × 16 parallel multiplier 1994
 34 8 p. 1427-
1 p.
 article
15 An AI constraint network-based approach to bed-of-nails DFT for digital circuit design 1994
 34 8 p. 1421-
1 p.
 article
16 An alternate and simpler method for finding the field-dependent defect density of SiO2 films using MOS capacitor devices Bhan, R.K.
 1994
 34 8 p. 1361-1364
4 p.
 article
17 Analysis of drain breakdown voltage in enhancement-mode SOI MOSFETs 1994
 34 8 p. 1429-
1 p.
 article
18 A neural implementation of complex activation functions for digital VLSI neural networks 1994
 34 8 p. 1427-
1 p.
 article
19 A new type of fiber optic connector designed for military optical backplanes 1994
 34 8 p. 1410-
1 p.
 article
20 An experimental procedure for measuring silicon lattice heating due to hot carriers in MOSFETs 1994
 34 8 p. 1428-
1 p.
 article
21 An expert process planning system for electronics PCB assembly 1994
 34 8 p. 1423-1424
2 p.
 article
22 Annealing behaviour of hole traps in irradiated gate oxides 1994
 34 8 p. 1427-
1 p.
 article
23 An O (k · n)-time algorithm for computing the reliability of a circular consecutive-k-out-of-n:F system 1994
 34 8 p. 1416-
1 p.
 article
24 An O (n · log(n)) algorithm to compute the all-terminal reliability of (K5, K2,2,2 ) free networks 1994
 34 8 p. 1414-
1 p.
 article
25 Are components still the major problem: a review of electronic system and device field failure returns 1994
 34 8 p. 1409-
1 p.
 article
26 A reliability and cost analysis of an automatic prototype generator test paradigm 1994
 34 8 p. 1417-
1 p.
 article
27 A review of modern power semiconductor devices 1994
 34 8 p. 1411-1412
2 p.
 article
28 A sequential test to control up and down times when their distributions are gamma Jain, Sudha
 1994
 34 8 p. 1375-1376
2 p.
 article
29 A statistical method for obtaining the factors in electronic-component reliability-prediction models 1994
 34 8 p. 1412-
1 p.
 article
30 A study of failures identified during board level environmental stress testing 1994
 34 8 p. 1422-
1 p.
 article
31 A two-unit system with allowed down time and random check of standby Gupta, Rakesh
 1994
 34 8 p. 1381-1385
5 p.
 article
32 Automated malfunction diagnosis of semiconductor fabrication equipment: a plasma etch application 1994
 34 8 p. 1421-
1 p.
 article
33 Automated wafer level QBD measurement for production control 1994
 34 8 p. 1422-
1 p.
 article
34 Automatic assembly equipment gains capabilities, improves performance 1994
 34 8 p. 1426-
1 p.
 article
35 b and its temperature dependence are the important criteria of the reliability of semiconductor lasers Jiawei, Shi
 1994
 34 8 p. 1405-1408
4 p.
 article
36 Basic hybrid IC technology must adapt to dense mounting 1994
 34 8 p. 1429-
1 p.
 article
37 Bayes computation for life testing and reliability estimation 1994
 34 8 p. 1419-
1 p.
 article
38 Bayes parameter estimation for the bivariate Weibull model of Marshall-Olkin for censored data 1994
 34 8 p. 1417-
1 p.
 article
39 Boundary walking test: an accelerated scan method for greater system reliability 1994
 34 8 p. 1411-
1 p.
 article
40 Bounds for reliability of consecutive k-within-m-out-of-n:F systems 1994
 34 8 p. 1414-
1 p.
 article
41 CBS-CAD: a CAD process management system 1994
 34 8 p. 1420-
1 p.
 article
42 Chi-square tests-of-fit for location-scale families using type-II censored data 1994
 34 8 p. 1414-
1 p.
 article
43 Co-implantation of Mg and Si in GaAs MESFETs 1994
 34 8 p. 1429-1430
2 p.
 article
44 Computational and experimental environments for fuzzy logic and control 1994
 34 8 p. 1419-
1 p.
 article
45 Computationally-efficient phased-mission reliability analysis for systems with variable configurations 1994
 34 8 p. 1420-
1 p.
 article
46 Conduction mechanisms in contaminant layers on printed circuit boards 1994
 34 8 p. 1413-
1 p.
 article
47 Confidence limits for steady state availability of systems Chandrasekhar, P.
 1994
 34 8 p. 1365-1367
3 p.
 article
48 Constitutive relations for tin-based solder joints 1994
 34 8 p. 1412-
1 p.
 article
49 Coprocessor design for multilayer surface-mounted PCB routing 1994
 34 8 p. 1425-1426
2 p.
 article
50 Cost-benefit analysis of a two-unit standby system with a proviso of repair-machine failure Gupta, Rakesh
 1994
 34 8 p. 1391-1394
4 p.
 article
51 Curiosities in choosing system components: a Bayes analysis 1994
 34 8 p. 1411-
1 p.
 article
52 Demand grows for industrial-use semiconductor lasers 1994
 34 8 p. 1430-
1 p.
 article
53 Design of precision capacitors for analog applications 1994
 34 8 p. 1410-
1 p.
 article
54 Development proceeds on chip fixed inductors, their applications 1994
 34 8 p. 1413-
1 p.
 article
55 Dielectric degradation of Pt/SiO2/Si structures during thermal annealing 1994
 34 8 p. 1428-
1 p.
 article
56 DIGamber: a digital design and diagnostic tool in expert system environment 1994
 34 8 p. 1426-
1 p.
 article
57 Direct chip interconnect with adhesive conductor films 1994
 34 8 p. 1423-
1 p.
 article
58 Discrete surface mount products for power applications 1994
 34 8 p. 1423-
1 p.
 article
59 Efficient algorithm for reliability of a circular consecutive-k-out-of-n F system 1994
 34 8 p. 1414-
1 p.
 article
60 Ellipsometric measurements of surface roughness of silicon wafers 1994
 34 8 p. 1429-
1 p.
 article
61 Estimating defects in commercial software during operational use 1994
 34 8 p. 1415-
1 p.
 article
62 Estimation methods for the mean of the exponential distribution based on grouped and censored data 1994
 34 8 p. 1416-
1 p.
 article
63 Evaluating layout area tradeoffs for high level applications 1994
 34 8 p. 1416-1417
2 p.
 article
64 Evaluating the performance of software-reliability models 1994
 34 8 p. 1418-
1 p.
 article
65 Experimental and analytical studies of encapsulated flip chip solder bumps on surface laminar circuit boards 1994
 34 8 p. 1410-
1 p.
 article
66 Failure mechanism models for Ductile fracture 1994
 34 8 p. 1413-1414
2 p.
 article
67 Fast enumeration of every path in a reliability graph using subgraphs Aziz, M.A.
 1994
 34 8 p. 1395-1396
2 p.
 article
68 Feature-scale simulation of resist-patterned electrode-position 1994
 34 8 p. 1424-
1 p.
 article
69 Finding nonfaulty subtrees in faulty binary tree architectures Mittal, Ravi
 1994
 34 8 p. 1301-1310
10 p.
 article
70 Finite range survival model Siddiqui, S.A.
 1994
 34 8 p. 1377-1380
4 p.
 article
71 Fixed resistors serve to reduce equipment size 1994
 34 8 p. 1410-
1 p.
 article
72 Functional flexibility keeps ASICs in demand 1994
 34 8 p. 1419-
1 p.
 article
73 Gaussian parametric failure-rate model with application to Quartz-Crystal device aging 1994
 34 8 p. 1412-
1 p.
 article
74 Gigabit age microelectronics and their manufacture 1994
 34 8 p. 1420-
1 p.
 article
75 Gold-to-aluminum bonding for TAB applications 1994
 34 8 p. 1424-
1 p.
 article
76 Goodness-of-fit tests for the power-law process based on the TTT-plot 1994
 34 8 p. 1418-
1 p.
 article
77 Graphical techniques for analyzing failure data with the percentile residual-life function 1994
 34 8 p. 1415-
1 p.
 article
78 Grown-in-deep-level defects in vapour phase epitaxial GaAs 1 − x P x 1994
 34 8 p. 1428-
1 p.
 article
79 HIC application technologies enhance high density mounting in printed circuit boards 1994
 34 8 p. 1425-
1 p.
 article
80 HIMOS: an attractive flash EEPROM cell for embedded memory applications 1994
 34 8 p. 1411-
1 p.
 article
81 Increased reliability of drypumps due to process related adaptation and prefailure warning 1994
 34 8 p. 1412-1413
2 p.
 article
82 Independent control of ion density and ion bombardment energy in a dual RF excitation plasma 1994
 34 8 p. 1430-
1 p.
 article
83 In situ measurement of wafer temperatures in a low pressure chemical vapor deposition furnace 1994
 34 8 p. 1428-1429
2 p.
 article
84 Is boundary scan short on fault coverage? 1994
 34 8 p. 1410-
1 p.
 article
85 Low moisture polymer adhesive for hermetic packages 1994
 34 8 p. 1426-1427
2 p.
 article
86 Majority carrier mobility in ultra heavily doped n-type Si in the presence of defects and dislocations 1994
 34 8 p. 1429-
1 p.
 article
87 Mechanical design failure models for buckling 1994
 34 8 p. 1409-
1 p.
 article
88 Mixing 3-V and 5-V ICs 1994
 34 8 p. 1427-
1 p.
 article
89 Modelling, optimization and control of spatial uniformity in manufacturing processes 1994
 34 8 p. 1420-1421
2 p.
 article
90 Nonparametric estimation of mean time to failure with unknown stochastic censoring Schäbe, Hendrik
 1994
 34 8 p. 1291-1299
9 p.
 article
91 On a general imperfect debugging software reliability growth model Kapur, P.K.
 1994
 34 8 p. 1397-1403
7 p.
 article
92 On the interval reliability of systems modelled by finite semi-Markov processes Csenki, A.
 1994
 34 8 p. 1319-1335
17 p.
 article
93 On the optimal design of k-out-of-n:G subsystems 1994
 34 8 p. 1418-1419
2 p.
 article
94 Optimal apportionment of reliability and redundancy in series systems under multiple objectives 1994
 34 8 p. 1417-
1 p.
 article
95 Optimal design of parallel-series systems with competing failure modes 1994
 34 8 p. 1416-
1 p.
 article
96 Optimal properties of the Laplace trend test for soft-ware-reliability models 1994
 34 8 p. 1416-
1 p.
 article
97 Optimization of process parameters for laser soldering of surface mounted devices 1994
 34 8 p. 1430-
1 p.
 article
98 Optimizing force and geometry parameters in design of reduced insertion force connectors 1994
 34 8 p. 1411-
1 p.
 article
99 Optimum design of sampling plans in electronic industry Sultan, Torky I.
 1994
 34 8 p. 1369-1373
5 p.
 article
100 Packaging of high-density fiber/laser modules using passive alignment techniques 1994
 34 8 p. 1430-
1 p.
 article
101 Percentiles of pivotal ratios for the MLE of the parameters of a Weibull regression model 1994
 34 8 p. 1414-
1 p.
 article
102 Performance testing of cellular modems 1994
 34 8 p. 1426-
1 p.
 article
103 Portable, cordless phone requirements give rise to chip monolithic microfilters 1994
 34 8 p. 1411-
1 p.
 article
104 Positron annihilation spectroscopy of vacancy-related defects in semiconductors 1994
 34 8 p. 1429-
1 p.
 article
105 Power semiconductor devices for the 1990s 1994
 34 8 p. 1410-1411
2 p.
 article
106 Precision flip-chip solder bump interconnects for optical packaging 1994
 34 8 p. 1424-1425
2 p.
 article
107 Predicting performability of a fault-tolerant microcomputer for process control 1994
 34 8 p. 1418-
1 p.
 article
108 Profit analysis of a system with two-units having guarantee periods and delayed operation of standby Gupta, Rakesh
 1994
 34 8 p. 1387-1390
4 p.
 article
109 Recursive estimation of time-dependent reliability Singh, N.
 1994
 34 8 p. 1355-1359
5 p.
 article
110 Reliability analysis of a cold standby system with multiple critical errors Chung, Who Kee
 1994
 34 8 p. 1343-1347
5 p.
 article
111 Reliability and availability analysis of a k-out-of-N:G redundant system with repair in the presence of chance of multiple critical errors Chung, Who Kee
 1994
 34 8 p. 1337-1341
5 p.
 article
112 Reliability assessment of high lead count TAB package 1994
 34 8 p. 1422-1423
2 p.
 article
113 Reliability modeling of soldered interconnections 1994
 34 8 p. 1412-
1 p.
 article
114 Review. A survey of the present status of vacuum microelectronics 1994
 34 8 p. 1419-1420
2 p.
 article
115 Rework of multi-chip modules: device removal 1994
 34 8 p. 1410-
1 p.
 article
116 Selecting the most reliable design under Type-II censored accelerated testing 1994
 34 8 p. 1418-
1 p.
 article
117 Short-pulse propagation technique for characterizing resistive package interconnections 1994
 34 8 p. 1413-
1 p.
 article
118 Shrunken estimators of Weibull shape parameter from Type-II censored samples 1994
 34 8 p. 1418-
1 p.
 article
119 SIGMA: a VLSI systolic array implementation of a Galois Field [ GF(2)m)] based multiplication and division algorithm 1994
 34 8 p. 1419-
1 p.
 article
120 Silver-induced volatile species generation from conductive die attach adhesives 1994
 34 8 p. 1424-
1 p.
 article
121 Software-reliability growth with a Weibull test-effort: a model and application 1994
 34 8 p. 1415-
1 p.
 article
122 Spin coating over topography 1994
 34 8 p. 1422-
1 p.
 article
123 Standards encourage use of ultra-mini connectors for IC cards 1994
 34 8 p. 1413-
1 p.
 article
124 Statistical analysis of the geometric de-eutrophication software-reliability model 1994
 34 8 p. 1418-
1 p.
 article
125 Systematic design of phase-shifting masks with extended depth of focus and/or shifted focus plane 1994
 34 8 p. 1421-
1 p.
 article
126 The effect of fan-reliability and cooling-performance on electronic-chassis reliability 1994
 34 8 p. 1421-
1 p.
 article
127 The effect on the non-uniform doping profile on I–V characteristics of a MOSFET 1994
 34 8 p. 1429-
1 p.
 article
128 The inventory replenishment problem with a linear trend in demand 1994
 34 8 p. 1409-
1 p.
 article
129 The Panther range of test synthesis products 1994
 34 8 p. 1427-
1 p.
 article
130 The transition from a two-dimensional to a zero-dimensional electron system on silicon 1994
 34 8 p. 1428-
1 p.
 article
131 Thin QFP—the next generation high pincount surface mount challenge 1994
 34 8 p. 1425-
1 p.
 article
132 Toward high-level synthesis for ASIC design 1994
 34 8 p. 1424-
1 p.
 article
133 Transient behaviour and parametric sensitivity in failure prone systems 1994
 34 8 p. 1415-
1 p.
 article
134 Two new replacement policies 1994
 34 8 p. 1409-
1 p.
 article
135 Two unit redundant system with adjustable failure rate, critical human error (CHE) and inspection Agnihotri, R.K.
 1994
 34 8 p. 1349-1354
6 p.
 article
136 Ultra-miniature chip inductors for communications equipment down-sizing requirements 1994
 34 8 p. 1410-
1 p.
 article
137 Use of cooperating expert systems for real-time fault detection and correction in a manufacturing cell 1994
 34 8 p. 1423-
1 p.
 article
138 Water soluble paste survey for fine pitch SMT attach 1994
 34 8 p. 1425-
1 p.
 article
139 Wire bonding—toward 6-σ yield and fine pitch 1994
 34 8 p. 1425-
1 p.
 article
                             139 results found
 
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