| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
Adding intelligence to the proper/handler-tester interface
|
|
|
1986
|
26 |
6 |
p. 1194-
1 p.
|
artikel
|
| 2 |
Advanced dielectric isolation through selective epitaxial growth techniques
|
|
|
1986
|
26 |
6 |
p. 1197-
1 p.
|
artikel
|
| 3 |
Advances in metalizations technology
|
|
|
1986
|
26 |
6 |
p. 1193-
1 p.
|
artikel
|
| 4 |
A heuristic method to upgrade system availability for hot or cold standby and voting systems
|
|
|
1986
|
26 |
6 |
p. 1190-
1 p.
|
artikel
|
| 5 |
Alternative schemes for utility services to semiconductor process equipment
|
|
|
1986
|
26 |
6 |
p. 1196-
1 p.
|
artikel
|
| 6 |
A method of rapid Markov reliability calculation
|
|
|
1986
|
26 |
6 |
p. 1192-
1 p.
|
artikel
|
| 7 |
A new algorithm for the reliability evaluation of computer-communication network
|
Xu, Wenxin
|
|
1986
|
26 |
6 |
p. 1013-1017
5 p.
|
artikel
|
| 8 |
Approaches to resists for two-level RIE pattern transfer applications
|
|
|
1986
|
26 |
6 |
p. 1195-
1 p.
|
artikel
|
| 9 |
Approaches toward silicon compilation
|
|
|
1986
|
26 |
6 |
p. 1193-
1 p.
|
artikel
|
| 10 |
A probability bound estimation method in Markov reliability analysis
|
|
|
1986
|
26 |
6 |
p. 1192-
1 p.
|
artikel
|
| 11 |
Aqueous developable bilayer resist system
|
|
|
1986
|
26 |
6 |
p. 1193-
1 p.
|
artikel
|
| 12 |
A reliability optimization computer algorithm for complex systems
|
Cǎtuneanu, V.M.
|
|
1986
|
26 |
6 |
p. 1019-1023
5 p.
|
artikel
|
| 13 |
A reliability-program case-history on design review
|
|
|
1986
|
26 |
6 |
p. 1191-1192
2 p.
|
artikel
|
| 14 |
A simple but effective method of electrical connections checking of IC layout and its implementation
|
|
|
1986
|
26 |
6 |
p. 1194-
1 p.
|
artikel
|
| 15 |
A simple method of calculating the minority-carrier current in heavily doped silicon
|
|
|
1986
|
26 |
6 |
p. 1196-
1 p.
|
artikel
|
| 16 |
A simplified design procedure for life tests based on Kullback-Leibler information
|
|
|
1986
|
26 |
6 |
p. 1190-
1 p.
|
artikel
|
| 17 |
A test structure for the electrical measurement of the misalignment between gate and diffusion regions in MOS/LSI circuits
|
|
|
1986
|
26 |
6 |
p. 1194-
1 p.
|
artikel
|
| 18 |
Availability analysis of a two unit repairable parallel redundant system with common-mode failures and arbitrarily distributed down times
|
Dichirico, Canio
|
|
1986
|
26 |
6 |
p. 1183-1188
6 p.
|
artikel
|
| 19 |
Availability measures for various multi-unit systems
|
Kapur, P.K.
|
|
1986
|
26 |
6 |
p. 1089-1097
9 p.
|
artikel
|
| 20 |
A view from inside “the surface-mounting revolution”
|
|
|
1986
|
26 |
6 |
p. 1193-
1 p.
|
artikel
|
| 21 |
Barrier-height measurements of tantalum silicide on silicon
|
|
|
1986
|
26 |
6 |
p. 1196-
1 p.
|
artikel
|
| 22 |
Bayes estimation of the reliability function of normal distribution
|
|
|
1986
|
26 |
6 |
p. 1190-
1 p.
|
artikel
|
| 23 |
Bayes inference from failure data contaminated due to maintenance
|
|
|
1986
|
26 |
6 |
p. 1191-
1 p.
|
artikel
|
| 24 |
Bibliography of literature on mining equipment reliability
|
Dhillon, Balbir S.
|
|
1986
|
26 |
6 |
p. 1131-1138
8 p.
|
artikel
|
| 25 |
Biochips, fact or fiction?
|
|
|
1986
|
26 |
6 |
p. 1193-
1 p.
|
artikel
|
| 26 |
Calendar of international conferences, symposia, lectures and meetings of interest
|
|
|
1986
|
26 |
6 |
p. 1003-1004
2 p.
|
artikel
|
| 27 |
Characterizing plasma deposited silicon nitride
|
|
|
1986
|
26 |
6 |
p. 1196-1197
2 p.
|
artikel
|
| 28 |
Chi-square probabilities are Poisson probabilities in disguise
|
|
|
1986
|
26 |
6 |
p. 1190-1191
2 p.
|
artikel
|
| 29 |
Clean rooms for ULSI manufacturing: class 1 practice
|
|
|
1986
|
26 |
6 |
p. 1194-
1 p.
|
artikel
|
| 30 |
Confidence bounds for the percentiles of a wearout failure distribution
|
|
|
1986
|
26 |
6 |
p. 1192-
1 p.
|
artikel
|
| 31 |
Contamination control using HCl gas: effects on silica glass and minority carrier lifetime
|
|
|
1986
|
26 |
6 |
p. 1196-
1 p.
|
artikel
|
| 32 |
Controlling static in wafer fabrication
|
|
|
1986
|
26 |
6 |
p. 1193-
1 p.
|
artikel
|
| 33 |
Cost-benefit analysis of a n-unit two-server system with preventive maintenance
|
Gopalan, M.N.
|
|
1986
|
26 |
6 |
p. 1077-1081
5 p.
|
artikel
|
| 34 |
Cost-benefit analysis of repairable systems subject to slow switch: A state-of-art survey
|
Gopalan, M.N.
|
|
1986
|
26 |
6 |
p. 1083-1087
5 p.
|
artikel
|
| 35 |
Cost study of a complex system under waiting
|
Gupta, P.P.
|
|
1986
|
26 |
6 |
p. 1051-1054
4 p.
|
artikel
|
| 36 |
Custom power hybrids
|
|
|
1986
|
26 |
6 |
p. 1197-
1 p.
|
artikel
|
| 37 |
Deep centers in neutron-transmutation-doped gallium arsenide
|
|
|
1986
|
26 |
6 |
p. 1197-1198
2 p.
|
artikel
|
| 38 |
Developing a working mix-and-match lithography system
|
|
|
1986
|
26 |
6 |
p. 1195-
1 p.
|
artikel
|
| 39 |
Diffusion barriers in advanced semiconductor device technology
|
|
|
1986
|
26 |
6 |
p. 1197-
1 p.
|
artikel
|
| 40 |
E-beam probing systems: filling the submicron gap
|
|
|
1986
|
26 |
6 |
p. 1198-
1 p.
|
artikel
|
| 41 |
Electromigration mechanisms in aluminium lines
|
|
|
1986
|
26 |
6 |
p. 1196-
1 p.
|
artikel
|
| 42 |
Encapsulated chip packaged on tape
|
|
|
1986
|
26 |
6 |
p. 1193-
1 p.
|
artikel
|
| 43 |
Evaluating the signal-reliability of logic circuits
|
|
|
1986
|
26 |
6 |
p. 1191-
1 p.
|
artikel
|
| 44 |
Expert fault-diagnosis under human-reporting bias
|
|
|
1986
|
26 |
6 |
p. 1190-
1 p.
|
artikel
|
| 45 |
Explicit time dependent solutions for a queue with feedback and server intermittently available
|
(Miss)Sharda,
|
|
1986
|
26 |
6 |
p. 1043-1050
8 p.
|
artikel
|
| 46 |
4560953 Fail-safe square-wave oscillator
|
Bozio, RobertP
|
|
1986
|
26 |
6 |
p. 1199-
1 p.
|
artikel
|
| 47 |
Fault diagnosis and prevention by fuzzy sets
|
|
|
1986
|
26 |
6 |
p. 1190-
1 p.
|
artikel
|
| 48 |
Fault tree analysis, methods, and applications—a review
|
|
|
1986
|
26 |
6 |
p. 1190-
1 p.
|
artikel
|
| 49 |
FLORET: a simulation approach to verifying MOS-LSI logic design
|
|
|
1986
|
26 |
6 |
p. 1194-
1 p.
|
artikel
|
| 50 |
Hierarchical system for layout design and checking
|
|
|
1986
|
26 |
6 |
p. 1195-
1 p.
|
artikel
|
| 51 |
High-speed integrated circuits based on InP-MISFETs with plasma SiO2 gate insulator
|
|
|
1986
|
26 |
6 |
p. 1194-
1 p.
|
artikel
|
| 52 |
Human error and common-cause failure modelling of redundant systems
|
Dhillon, Balbir S.
|
|
1986
|
26 |
6 |
p. 1139-1162
24 p.
|
artikel
|
| 53 |
IC handler product trends
|
|
|
1986
|
26 |
6 |
p. 1193-
1 p.
|
artikel
|
| 54 |
Identification of particulate contaminants in IC manufacture
|
|
|
1986
|
26 |
6 |
p. 1193-
1 p.
|
artikel
|
| 55 |
Incentive contracting based upon consumer indifference
|
|
|
1986
|
26 |
6 |
p. 1189-
1 p.
|
artikel
|
| 56 |
Influence of the charge carriers recombination and generation at the surface of the depletion layer on the static characteristic of the silicon p-n junction
|
|
|
1986
|
26 |
6 |
p. 1197-
1 p.
|
artikel
|
| 57 |
Interconnection lengths and VLSI
|
|
|
1986
|
26 |
6 |
p. 1193-
1 p.
|
artikel
|
| 58 |
Internal gettering in Czochralski silicon
|
|
|
1986
|
26 |
6 |
p. 1197-
1 p.
|
artikel
|
| 59 |
Investigating reliability attributes of silicon photodetectors
|
Weis, E.A.
|
|
1986
|
26 |
6 |
p. 1099-1110
12 p.
|
artikel
|
| 60 |
Investigation of solder fatigue acceleration factors
|
|
|
1986
|
26 |
6 |
p. 1189-1190
2 p.
|
artikel
|
| 61 |
Is there a future for TAB?
|
|
|
1986
|
26 |
6 |
p. 1194-1195
2 p.
|
artikel
|
| 62 |
K-out-of-N:G system with multiple correlated failures
|
Nikolov, Angel Vasilev
|
|
1986
|
26 |
6 |
p. 1073-1076
4 p.
|
artikel
|
| 63 |
4561906 Laser activated polysilicon connections for redundancy
|
Calder, IainD
|
|
1986
|
26 |
6 |
p. 1200-
1 p.
|
artikel
|
| 64 |
Laser assisted MOCVD growth
|
|
|
1986
|
26 |
6 |
p. 1198-
1 p.
|
artikel
|
| 65 |
Lithography for ultra-submicron device structures
|
|
|
1986
|
26 |
6 |
p. 1195-
1 p.
|
artikel
|
| 66 |
Low dose ion implant monitoring
|
|
|
1986
|
26 |
6 |
p. 1197-
1 p.
|
artikel
|
| 67 |
Low temperature anomalies of spin susceptibility in heavily phosphorus doped silicon
|
|
|
1986
|
26 |
6 |
p. 1196-
1 p.
|
artikel
|
| 68 |
Materials and processes for nanometer lithography
|
|
|
1986
|
26 |
6 |
p. 1195-
1 p.
|
artikel
|
| 69 |
4560419 Method of making polysilicon resistors with a low thermal activation energy
|
Bourassa, Ronald
|
|
1986
|
26 |
6 |
p. 1199-
1 p.
|
artikel
|
| 70 |
4563672 Microprocessor automatic program fail reset circuit
|
Anderson, StephenF
|
|
1986
|
26 |
6 |
p. 1200-
1 p.
|
artikel
|
| 71 |
Multilayer resist processing update
|
|
|
1986
|
26 |
6 |
p. 1195-
1 p.
|
artikel
|
| 72 |
Multistate block diagrams and fault trees
|
|
|
1986
|
26 |
6 |
p. 1192-
1 p.
|
artikel
|
| 73 |
New inner lead bonder for multistation tape automated bonding
|
|
|
1986
|
26 |
6 |
p. 1194-
1 p.
|
artikel
|
| 74 |
Noncontaminating gas distribution systems
|
|
|
1986
|
26 |
6 |
p. 1194-
1 p.
|
artikel
|
| 75 |
Novel devices by Si-based molecular beam epitaxy
|
|
|
1986
|
26 |
6 |
p. 1198-
1 p.
|
artikel
|
| 76 |
On discrete failure models
|
|
|
1986
|
26 |
6 |
p. 1192-
1 p.
|
artikel
|
| 77 |
On multistate system analysis
|
|
|
1986
|
26 |
6 |
p. 1189-
1 p.
|
artikel
|
| 78 |
On shrinkage estimation of the exponential scale parameter
|
|
|
1986
|
26 |
6 |
p. 1191-
1 p.
|
artikel
|
| 79 |
On some common interests among reliability, inventory, and queuing
|
|
|
1986
|
26 |
6 |
p. 1191-
1 p.
|
artikel
|
| 80 |
On the F-distribution for calculating Bayes credible intervals for fraction noncomforming
|
|
|
1986
|
26 |
6 |
p. 1192-
1 p.
|
artikel
|
| 81 |
On the interaction of hydrogen RF plasma with implantation-induced defects in MOS structures
|
|
|
1986
|
26 |
6 |
p. 1198-
1 p.
|
artikel
|
| 82 |
On the software reliability models of Jelinski—Moranda and Littlewood
|
|
|
1986
|
26 |
6 |
p. 1191-
1 p.
|
artikel
|
| 83 |
Optimal allocation of redundant components for large systems
|
|
|
1986
|
26 |
6 |
p. 1192-
1 p.
|
artikel
|
| 84 |
Optimization problems in k-out-of-n systems
|
|
|
1986
|
26 |
6 |
p. 1191-
1 p.
|
artikel
|
| 85 |
PECVD of silicon epitaxial layers
|
|
|
1986
|
26 |
6 |
p. 1196-
1 p.
|
artikel
|
| 86 |
Photoresist processing systems: the next generation
|
|
|
1986
|
26 |
6 |
p. 1193-
1 p.
|
artikel
|
| 87 |
Piezospectroscopy study of platinum doped silicon
|
|
|
1986
|
26 |
6 |
p. 1197-
1 p.
|
artikel
|
| 88 |
Point defect yield model for wafer scale integration
|
|
|
1986
|
26 |
6 |
p. 1193-
1 p.
|
artikel
|
| 89 |
Publications, notices, calls for paper, etc.
|
|
|
1986
|
26 |
6 |
p. 1005-1009
5 p.
|
artikel
|
| 90 |
Real time measurements of single submicron aerosol particles in clean rooms
|
|
|
1986
|
26 |
6 |
p. 1193-
1 p.
|
artikel
|
| 91 |
Recent advances in silicide technology
|
|
|
1986
|
26 |
6 |
p. 1194-
1 p.
|
artikel
|
| 92 |
Refereeing of papers submitted by authors in India
|
Dummer, G.W.A.
|
|
1986
|
26 |
6 |
p. 1011-
1 p.
|
artikel
|
| 93 |
Reliability analysis of a non-redundant repairable multiplexing unit
|
|
|
1986
|
26 |
6 |
p. 1192-
1 p.
|
artikel
|
| 94 |
Reliability and MTTF analysis of a power plant consisting of four generators by Boolean function technique
|
Gupta, P.P.
|
|
1986
|
26 |
6 |
p. 1061-1065
5 p.
|
artikel
|
| 95 |
Reliability application of the alpha distribution
|
|
|
1986
|
26 |
6 |
p. 1191-
1 p.
|
artikel
|
| 96 |
Reliability apportionment/allocation: A survey
|
Dhillon, Balbir S.
|
|
1986
|
26 |
6 |
p. 1121-1129
9 p.
|
artikel
|
| 97 |
Reliability characteristics of a Markov system with a mission of random duration
|
|
|
1986
|
26 |
6 |
p. 1191-
1 p.
|
artikel
|
| 98 |
Reliability estimation for reconfigurable systems with fast recovery
|
White, Allan L.
|
|
1986
|
26 |
6 |
p. 1111-1120
10 p.
|
artikel
|
| 99 |
Reliability evaluation of a power plant with the aid of BF expansion algorithm technique
|
Gupta, P.P.
|
|
1986
|
26 |
6 |
p. 1055-1059
5 p.
|
artikel
|
| 100 |
Reliability of a complex system under pre-emptive repeat discipline
|
Nikolov, Angel Vasilev
|
|
1986
|
26 |
6 |
p. 1067-1072
6 p.
|
artikel
|
| 101 |
Reliability polynomials of computer communication networks
|
Kiu, Sun-Wah
|
|
1986
|
26 |
6 |
p. 1173-1182
10 p.
|
artikel
|
| 102 |
4560583 Resistor design system
|
Moksvold, TorW
|
|
1986
|
26 |
6 |
p. 1199-
1 p.
|
artikel
|
| 103 |
Reticle sizing for optimized CD control
|
|
|
1986
|
26 |
6 |
p. 1194-
1 p.
|
artikel
|
| 104 |
S. ESCAF: sequential complex systems are analysed with ESCAF through an add-on option
|
|
|
1986
|
26 |
6 |
p. 1191-
1 p.
|
artikel
|
| 105 |
Silicide technology spotlight
|
|
|
1986
|
26 |
6 |
p. 1197-
1 p.
|
artikel
|
| 106 |
Simple method of assessing the reliability of semiconductor devices
|
|
|
1986
|
26 |
6 |
p. 1189-
1 p.
|
artikel
|
| 107 |
Solder joint fatigue in surface mount technology: state of the art
|
|
|
1986
|
26 |
6 |
p. 1189-
1 p.
|
artikel
|
| 108 |
Some stochastic stress-strength processes
|
|
|
1986
|
26 |
6 |
p. 1192-
1 p.
|
artikel
|
| 109 |
Standardized film thickness measurement technique
|
|
|
1986
|
26 |
6 |
p. 1197-
1 p.
|
artikel
|
| 110 |
Statistical device characterization and parametric yield estimation
|
|
|
1986
|
26 |
6 |
p. 1195-
1 p.
|
artikel
|
| 111 |
Stochastic analysis of a two unit priority standby system with two switching devices
|
Goel, L.R.
|
|
1986
|
26 |
6 |
p. 1025-1031
7 p.
|
artikel
|
| 112 |
Stochastic analysis of a two unit standby system with two switching devices and sliding preventive maintenance
|
Goel, L.R.
|
|
1986
|
26 |
6 |
p. 1033-1037
5 p.
|
artikel
|
| 113 |
Tables for exact lower confidence limits for reliability and quantiles, based on least-squares estimators of Weibull parameters
|
|
|
1986
|
26 |
6 |
p. 1191-
1 p.
|
artikel
|
| 114 |
Temperature effects in the MONOS transistor
|
Brown, W.D.
|
|
1986
|
26 |
6 |
p. 1163-1172
10 p.
|
artikel
|
| 115 |
Testing semi-custom logic
|
|
|
1986
|
26 |
6 |
p. 1193-
1 p.
|
artikel
|
| 116 |
Test software development
|
|
|
1986
|
26 |
6 |
p. 1195-
1 p.
|
artikel
|
| 117 |
The analysis of intersections in sets of polygonal lines for integrated circuit layout design
|
|
|
1986
|
26 |
6 |
p. 1195-
1 p.
|
artikel
|
| 118 |
The clean room as a system for contamination control
|
|
|
1986
|
26 |
6 |
p. 1194-
1 p.
|
artikel
|
| 119 |
The local checking of design rules for IC layouts described hierarchically
|
|
|
1986
|
26 |
6 |
p. 1196-
1 p.
|
artikel
|
| 120 |
Thermal management in semiconductor device packaging
|
|
|
1986
|
26 |
6 |
p. 1196-
1 p.
|
artikel
|
| 121 |
The role of universities in electronic packaging engineering
|
|
|
1986
|
26 |
6 |
p. 1192-1193
2 p.
|
artikel
|
| 122 |
Thick film and direct boad copper forming technologies for aluminum nitride substrate
|
|
|
1986
|
26 |
6 |
p. 1197-
1 p.
|
artikel
|
| 123 |
Time dependent solution of a queueing problem with intermittently available server
|
(Miss)Sharda,
|
|
1986
|
26 |
6 |
p. 1039-1041
3 p.
|
artikel
|
| 124 |
Title section, volume contents and author index for volume 26, 1986
|
|
|
1986
|
26 |
6 |
p. i-x
nvt p.
|
artikel
|
| 125 |
Trends in resist design and use
|
|
|
1986
|
26 |
6 |
p. 1195-
1 p.
|
artikel
|
| 126 |
Vacuum pump fluids for semiconductor processing
|
|
|
1986
|
26 |
6 |
p. 1194-
1 p.
|
artikel
|
| 127 |
Vacuum pumps: the critical component
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|
|
1986
|
26 |
6 |
p. 1194-
1 p.
|
artikel
|
| 128 |
VLSI interconnect metalization. Part 3
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|
|
1986
|
26 |
6 |
p. 1193-
1 p.
|
artikel
|
| 129 |
YSPICE—a statistical optimization program for analog integrated circuits
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|
|
1986
|
26 |
6 |
p. 1195-
1 p.
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artikel
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