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Journal description
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Details for article 34 of 129 found articles
| Title: |
Cost-benefit analysis of repairable systems subject to slow switch: A state-of-art survey |
| Author: |
Gopalan, M.N. Radhakrishnan, R. |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 26 (1986) nr. 6 pages 5 p. |
| Year: |
1986 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 34 of 129 found articles
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